A method is provided for positioning a micro- or nano-object on a planar support by displacement performed under visual control, wherein the micro- or nano-object is immersed in a transparent medium, called ambient medium, having a refractive index n.sub.3; the planar support comprises a transparent substrate of refractive index n.sub.0>n.sub.3 on which is deposited at least one optically absorbent layer, adapted to behave as antireflection coating when it is lit at normal incidence with a lighting wavelength through the substrate; and the visual control comprises the lighting of the micro- or nano-object at least with the wavelength through the substrate, and the observation thereof also through the substrate. A method to scanning probe microscopy and to the assembly of nanostructures is provided.

The use of the scanning electrochemical microscopy to predict the corrosion resistance results which would be obtained for a surface S1 having undergone an anticorrosion treatment if the surface S1 was subjected to a salt fog corrosion test, which use comprises an analysis of the surface S1 by scanning electrochemical microscopy.

The use of the scanning electrochemical microscopy to predict the corrosion resistance results which would be obtained for a surface S1 having undergone an anticorrosion treatment if the surface S1 was subjected to a salt fog corrosion test, which use comprises an analysis of the surface S1 by scanning electrochemical microscopy.

A gas sensor for measuring a gas content in an electrolyte, including: a first channel and a second channel separated by a septum; and a tip, the first channel and the second channel are closed by the tip; a first electrode is located in the first channel, extends to an outer surface of the tip, and exposed on the outer surface of the tip; a second electrode is located in the second channel, extends to the outer surface of the tip, exposed on the outer surface of the tip, and spaced apart from the first electrode; an electrolyte in contact with the outer surface of the tip, in contact with the first electrode and the second electrode, and exposed to an outer surface of the gas sensor; a voltage source; and a current meter, wherein the electrolyte is not present in the first channel and the second channel.

A gas sensor for measuring a gas content in an electrolyte, including: a first channel and a second channel separated by a septum; and a tip, the first channel and the second channel are closed by the tip; a first electrode is located in the first channel, extends to an outer surface of the tip, and exposed on the outer surface of the tip; a second electrode is located in the second channel, extends to the outer surface of the tip, exposed on the outer surface of the tip, and spaced apart from the first electrode; an electrolyte in contact with the outer surface of the tip, in contact with the first electrode and the second electrode, and exposed to an outer surface of the gas sensor; a voltage source; and a current meter, wherein the electrolyte is not present in the first channel and the second channel.

Disclosed is an assay for determining resistance in a target cell or tissue to a therapy associated with cellular stress using chemical microscopy and high-throughput single cell analysis to determine functional metabolic alteration, including determining metabolic reprogramming in a target cell or tissue to a therapy associated with cellular stress, and methods of using the assays.

Disclosed is an assay for determining resistance in a target cell or tissue to a therapy associated with cellular stress using chemical microscopy and high-throughput single cell analysis to determine functional metabolic alteration, including determining metabolic reprogramming in a target cell or tissue to a therapy associated with cellular stress, and methods of using the assays.

A method of controlling a scanning electrochemical microscopy probe tip comprising the following steps: oscillating the scanning electrochemical microscopy probe tip relative to the surface of interest; moving the oscillating scanning electrochemical microscopy probe tip towards the surface of interest; detecting damping of an amplitude of the oscillation of the scanning electrochemical microscopy probe tip resulting from the scanning electrochemical microscopy probe tip coming into contact with the surface of interest at the first location; using the detected damping to detect the surface of interest; retracting the scanning electrochemical microscopy probe tip away from the surface of interest without first translating the scanning electrochemical microscopy probe tip along the surface of interest while the scanning electrochemical microscopy probe tip is in intermittent contact with the surface of interest. The method further comprises measuring electrochemical signals produced at the oscillating scanning electrochemical microscopy probe tip while moving the oscillating scanning electrochemical microscopy probe tip towards and/or away from the surface of interest.

A method of controlling a scanning electrochemical microscopy probe tip comprising the following steps: oscillating the scanning electrochemical microscopy probe tip relative to the surface of interest; moving the oscillating scanning electrochemical microscopy probe tip towards the surface of interest; detecting damping of an amplitude of the oscillation of the scanning electrochemical microscopy probe tip resulting from the scanning electrochemical microscopy probe tip coming into contact with the surface of interest at the first location; using the detected damping to detect the surface of interest; retracting the scanning electrochemical microscopy probe tip away from the surface of interest without first translating the scanning electrochemical microscopy probe tip along the surface of interest while the scanning electrochemical microscopy probe tip is in intermittent contact with the surface of interest. The method further comprises measuring electrochemical signals produced at the oscillating scanning electrochemical microscopy probe tip while moving the oscillating scanning electrochemical microscopy probe tip towards and/or away from the surface of interest.

A new scanning electrochemical microscopy tip positioning method that allows topography and surface activity to be resolved independently is presented. A SECM tip is oscillated relative to the surface of interest. Changes in the oscillation amplitude, caused by the intermittent contact of the SECM tip with the surface of interest, are used to detect the surface of interest, and as a feedback signal for various types of imaging.