Patent classifications
G01R1/30
DYNAMIC OUTPUT CLAMPING FOR A PROBE OR ACCESSORY
A probe or accessory for use with an electrical test and measurement instrument can include an input to receive an input signal from a device under test (DUT), a clamp control unit or oscilloscope to apply a clamping/limiting level to the input signal to generate an output signal, and/or a control unit output port to provide the clamped/limited output signal to an oscilloscope.
DYNAMIC OUTPUT CLAMPING FOR A PROBE OR ACCESSORY
A probe or accessory for use with an electrical test and measurement instrument can include an input to receive an input signal from a device under test (DUT), a clamp control unit or oscilloscope to apply a clamping/limiting level to the input signal to generate an output signal, and/or a control unit output port to provide the clamped/limited output signal to an oscilloscope.
Analytical gateway device for measurement devices
An analytical gateway device receives measurement data comprising one or more measurement values from one or more measurement devices. The gateway device selects a measurement application from a plurality of measurement applications available for execution (e.g., on the gateway device or some other computing device) based at least in part on the measurement data. For example, the measurement application can be selected based on measurement type information. The measurement type information may include one or more measurement units associated with the measurement values. The gateway device may cause a user interface (or some other information) associated with the measurement application to be presented on a display (e.g., a display of the gateway device or some other computing device in communication with the gateway device).
Analytical gateway device for measurement devices
An analytical gateway device receives measurement data comprising one or more measurement values from one or more measurement devices. The gateway device selects a measurement application from a plurality of measurement applications available for execution (e.g., on the gateway device or some other computing device) based at least in part on the measurement data. For example, the measurement application can be selected based on measurement type information. The measurement type information may include one or more measurement units associated with the measurement values. The gateway device may cause a user interface (or some other information) associated with the measurement application to be presented on a display (e.g., a display of the gateway device or some other computing device in communication with the gateway device).
Monitor circuit for monitoring a lightning protection component
A switching circuit comprising a transistor (23) and a drive component both for controlling the transistor and also for limiting the power supply current (Ia) suppled to a load (22), the drive component being arranged both to receive a control voltage (V.sub.H) and also: when the control voltage (VH) is disconnection signal, to generate a drive voltage (V.sub.p) that causes the transistor to occupy a non-conductive state; when the control voltage (VH) is a connection signal and the power supply current (Ia) cannot reach a predefined current threshold, to generate drive voltage (V.sub.p) that causes the transistor to occupy saturated conditions; and when the control voltage (VH) is a connection signal and the power supply current (Ia) can reach a predefined current threshold, to generate a drive voltage (V.sub.p) that causes the transistor to occupy linear conditions, such that the power supply current is regulated so that it does not exceed the predefined current threshold.
Monitor circuit for monitoring a lightning protection component
A switching circuit comprising a transistor (23) and a drive component both for controlling the transistor and also for limiting the power supply current (Ia) suppled to a load (22), the drive component being arranged both to receive a control voltage (V.sub.H) and also: when the control voltage (VH) is disconnection signal, to generate a drive voltage (V.sub.p) that causes the transistor to occupy a non-conductive state; when the control voltage (VH) is a connection signal and the power supply current (Ia) cannot reach a predefined current threshold, to generate drive voltage (V.sub.p) that causes the transistor to occupy saturated conditions; and when the control voltage (VH) is a connection signal and the power supply current (Ia) can reach a predefined current threshold, to generate a drive voltage (V.sub.p) that causes the transistor to occupy linear conditions, such that the power supply current is regulated so that it does not exceed the predefined current threshold.
Current measurement device
A current measurement device comprising: a shunt resistor; a pair of first and second voltage signal lines connected to the shunt resistor; and a current measurement circuit for measuring a current using a signal by the pair of first and second voltage signal lines. The pair of first and second voltage signal lines are connected to an amplifier circuit with which the current measurement circuit is provided to amplify a voltage signal. A third signal line which is a signal line different from the pair of first and second voltage signal lines and drawn from the shunt resistor is connected to a common line of the current measurement circuit.
Current measurement device
A current measurement device comprising: a shunt resistor; a pair of first and second voltage signal lines connected to the shunt resistor; and a current measurement circuit for measuring a current using a signal by the pair of first and second voltage signal lines. The pair of first and second voltage signal lines are connected to an amplifier circuit with which the current measurement circuit is provided to amplify a voltage signal. A third signal line which is a signal line different from the pair of first and second voltage signal lines and drawn from the shunt resistor is connected to a common line of the current measurement circuit.
Sensor device and method for capacitive approximation detection
A capacitive sensor device with an electrode system has a first transmitting electrode and a first reception electrode, wherein the first transmitting electrode can be brought into capacitive coupling with the first reception electrode, and a second transmitting electrode and a second reception electrode, wherein the second transmitting electrode can be brought into capacitive coupling with the second reception electrode, a signal generator for feeding the first transmitting electrode with a first electric alternating signal and the second transmitting electrode with a second electric alternating signal, and a signal processing device, which is coupled with the first reception electrode and with the second reception electrode, and which is adapted to form a first measurement variable from the difference between a first electric value tapped at the first reception electrode and a second electric value tapped at the second reception electrode.
Sensor device and method for capacitive approximation detection
A capacitive sensor device with an electrode system has a first transmitting electrode and a first reception electrode, wherein the first transmitting electrode can be brought into capacitive coupling with the first reception electrode, and a second transmitting electrode and a second reception electrode, wherein the second transmitting electrode can be brought into capacitive coupling with the second reception electrode, a signal generator for feeding the first transmitting electrode with a first electric alternating signal and the second transmitting electrode with a second electric alternating signal, and a signal processing device, which is coupled with the first reception electrode and with the second reception electrode, and which is adapted to form a first measurement variable from the difference between a first electric value tapped at the first reception electrode and a second electric value tapped at the second reception electrode.