A temperature compensation method for a SAR sensor (3) of a terminal, and a terminal are disclosed. The terminal comprises: a temperature sensing unit (1), a processor (2), and an SAR sensor (3); the temperature sensing unit (1) is configured to send a first trigger signal to the processor (2) in response to detecting that a temperature change amount of the SAR sensor (3) exceeds a preset value; the processor (2) is configured to send a first temperature control signal to the SAR sensor (3) upon receiving the first trigger signal; and the SAR sensor (3) is configured to activate a second-order temperature compensation of the SAR sensor (3) according to the first temperature control signal, and the second-order temperature compensation compensates for baseline data of the SAR sensor (3) together with a first-order temperature compensation of the SAR sensor (3). Therefore, real-time tracking of the temperature change amount by the baseline data of the SAR sensor (3) can be ensured, and the problem in the terminal of false trigger of the SAR sensor (3) caused by drastic temperature change can be avoided.

A leakage current detection circuit and a fluxgate driver are provided. The leakage current detection circuit is suitable for a fluxgate device. The leakage current detection includes a duty cycle detection circuit, a compensation circuit, and a control signal generation circuit. The duty cycle detection circuit receives a pulse width modulation (PWM) signal from an inverter circuit. The duty cycle detection circuit detects a duty cycle of the PWM signal by sampling the PWM signal with a clock signal to output a count signal. The compensation circuit adjusts a pulse number of the count signal according to an offset signal in a self-test period. The control signal generation circuit calculates an average value of the count signal, and compares the average value with multiple threshold values to respectively generate multiple control signals. The control signals indicate a leakage current state of the fluxgate device.

A leakage current detection circuit and a fluxgate driver are provided. The leakage current detection circuit is suitable for a fluxgate device. The leakage current detection includes a duty cycle detection circuit, a compensation circuit, and a control signal generation circuit. The duty cycle detection circuit receives a pulse width modulation (PWM) signal from an inverter circuit. The duty cycle detection circuit detects a duty cycle of the PWM signal by sampling the PWM signal with a clock signal to output a count signal. The compensation circuit adjusts a pulse number of the count signal according to an offset signal in a self-test period. The control signal generation circuit calculates an average value of the count signal, and compares the average value with multiple threshold values to respectively generate multiple control signals. The control signals indicate a leakage current state of the fluxgate device.

A semiconductor laser device (2) is placed on a first heating-cooling device (1). A probe holder (4) is attached on a second heating-cooling device (3), A measurement probe (8) is fixed to a distal end of the probe holder (4). A fine movement table (9) moves the second heating-cooling device (3) and the probe holder (4) so that a distal end of the measurement probe (8) contacts the semiconductor laser device (2). An inspection apparatus (10) inputs an inspection signal to the semiconductor laser device (2) through the measurement probe (8).

A semiconductor laser device (2) is placed on a first heating-cooling device (1). A probe holder (4) is attached on a second heating-cooling device (3), A measurement probe (8) is fixed to a distal end of the probe holder (4). A fine movement table (9) moves the second heating-cooling device (3) and the probe holder (4) so that a distal end of the measurement probe (8) contacts the semiconductor laser device (2). An inspection apparatus (10) inputs an inspection signal to the semiconductor laser device (2) through the measurement probe (8).

A testing apparatus for Devices Under Test (DUTs) includes at least one intake damper and at least one exhaust damper. At least one fan moves recirculated fluid and exterior fluid across one or more DUTs inside the testing apparatus. In one aspect, the testing apparatus includes a door to provide access to a chamber and the door includes at least one channel. At least a portion of the fluid flows through the at least one channel of the door. In another aspect, the door is configured to provide access to a chamber from the front of the chamber and the fluid is moved in a direction across the one or more DUTs substantially from the front of the chamber towards a rear of the chamber.

A testing apparatus for Devices Under Test (DUTs) includes at least one intake damper and at least one exhaust damper. At least one fan moves recirculated fluid and exterior fluid across one or more DUTs inside the testing apparatus. In one aspect, the testing apparatus includes a door to provide access to a chamber and the door includes at least one channel. At least a portion of the fluid flows through the at least one channel of the door. In another aspect, the door is configured to provide access to a chamber from the front of the chamber and the fluid is moved in a direction across the one or more DUTs substantially from the front of the chamber towards a rear of the chamber.

A probe station includes a base, a adaptor, a probe holder and a probe. The adaptor has a first portion and a second portion away from the first portion towards a first direction by a first length. The first portion connects to the base. A probe holder connects to the second portion and extends towards a second direction opposite to the first direction by a second length. The probe connects to an end of the probe holder away from the second portion and extends towards the second direction by a third length. A product of a thermal coefficient of the adaptor and the first length is equal to a sum of a product of a thermal coefficient of the probe holder and the second length and a product of a thermal coefficient of the probe and the third length.

A probe station includes a base, a adaptor, a probe holder and a probe. The adaptor has a first portion and a second portion away from the first portion towards a first direction by a first length. The first portion connects to the base. A probe holder connects to the second portion and extends towards a second direction opposite to the first direction by a second length. The probe connects to an end of the probe holder away from the second portion and extends towards the second direction by a third length. A product of a thermal coefficient of the adaptor and the first length is equal to a sum of a product of a thermal coefficient of the probe holder and the second length and a product of a thermal coefficient of the probe and the third length.

An inspection apparatus includes a stage on which a substrate is placed, a cooler, a probe card, a light irradiator and a controller. The cooler cools the substrate placed on the stage. The probe card has probes to be in contact with the substrate to supply electric power. The light irradiator irradiates light to an upper surface of the substrate, opposite to a bottom surface of the substrate placed on the stage. Further, the controller controls the light irradiator.