A Multi-Domain Measurement System has an oscilloscope unit and a power probe unit. The oscilloscope unit comprises an analog input channel for receiving a measured analog signal and a first digital interface for receiving digitized measurement values from said power probe unit. The power probe unit is connected to the first digital interface for providing digitized measurements of a power supply signal. The power probe unit and the analog input channel are assigned to a device under test for simultaneously measuring signals in different domains. The power probe unit has a power probe measurement channel providing a vertical digitizing resolution that is at least two times higher than a vertical digitizing resolution of the analog input channel.

Further, uses of a Multi-Domain Measurement System are provided.

An oscilloscope includes at least one demonstration signal generator integrated as part of the oscilloscope. The demonstration signal generator generates stimulus signals that consist of digital samples of various different stored waveforms without the need of a separate demonstration board or signal source. The demonstration signal generator may loop through different sections of the stored waveforms to generate respective stimulus signals that include sequences of digital samples from the different waveforms in combination, to provide a broad range of stimulus signals. The stimulus signals may be displayed on the oscilloscope or output from the oscilloscope as demonstration mode stimulus signals to demonstrate the capabilities of the oscilloscope to customers or for training.

An oscilloscope includes at least one demonstration signal generator integrated as part of the oscilloscope. The demonstration signal generator generates stimulus signals that consist of digital samples of various different stored waveforms without the need of a separate demonstration board or signal source. The demonstration signal generator may loop through different sections of the stored waveforms to generate respective stimulus signals that include sequences of digital samples from the different waveforms in combination, to provide a broad range of stimulus signals. The stimulus signals may be displayed on the oscilloscope or output from the oscilloscope as demonstration mode stimulus signals to demonstrate the capabilities of the oscilloscope to customers or for training.

Methodologies and systems are described herein whereby the electrical performance of a device may be tested. In one or more embodiments, a system for testing the electrical performance comprises a monitoring device configured to perform a set of operations including concurrently monitoring at least three different test points of a device under test (DUT) and aggregating test data comprising signal information collected concurrently from at least three different test points of the DUT. In one or more embodiments, the system is configured to monitor at least three channels wherein at least one channel corresponds to a frequency range of less than 300 kHz and the phases of signals on at least three channels are different.

Methodologies and systems are described herein whereby the electrical performance of a device may be tested. In one or more embodiments, a system for testing the electrical performance comprises a monitoring device configured to perform a set of operations including concurrently monitoring at least three different test points of a device under test (DUT) and aggregating test data comprising signal information collected concurrently from at least three different test points of the DUT. In one or more embodiments, the system is configured to monitor at least three channels wherein at least one channel corresponds to a frequency range of less than 300 kHz and the phases of signals on at least three channels are different.

A test and measurement instrument can include an input to receive an analog signal, a sampler to produce digital sample data corresponding to the analog signal, a buffer to store a portion of the sample data, a memory to store sample data from the buffer, a plurality of comparators to establish a vertical range, and a controller configured to configure the plurality of comparators to establish a first vertical range based on sample data in the buffer, and determine whether any of the sample data in the buffer transitions outside the first vertical range during a period of time.

A radio frequency (RF) test probe adapter comprises a cable adapter operable for use with a RF test probe and a housing. The cable adapter comprises a cable connector configured to physically couple to a connector of a coaxial cable, a first pin operable to electrically couple a center conductor of the coaxial cable to a first lead of the RF test probe, and a second pin operable to electrically couple an outer conductor of the coaxial cable to a second lead of the test probe. The housing is sized and shaped to secure the RF test probe and the cable adapter in a physically coupled configuration.

A radio frequency (RF) test probe adapter comprises a cable adapter operable for use with a RF test probe and a housing. The cable adapter comprises a cable connector configured to physically couple to a connector of a coaxial cable, a first pin operable to electrically couple a center conductor of the coaxial cable to a first lead of the RF test probe, and a second pin operable to electrically couple an outer conductor of the coaxial cable to a second lead of the test probe. The housing is sized and shaped to secure the RF test probe and the cable adapter in a physically coupled configuration.

A test lead assembly includes a first test lead having a first cable extending between a distal end and a proximal end, a first test probe attached to the distal end and a first plug attached to the proximal end; a second test lead having a second cable extending between a distal end and a proximal end, a second test probe attached to the distal end, and a second plug attached to the proximal end; and a fastener member for repeatedly releasably engaging at least a portion of the first cable with at least a portion of the second cable along a length of the first and second cables. The test lead assembly and a measurement device incorporating the test lead assembly can avoid or at least reduce knotting of the test leads.

A test lead assembly includes a first test lead having a first cable extending between a distal end and a proximal end, a first test probe attached to the distal end and a first plug attached to the proximal end; a second test lead having a second cable extending between a distal end and a proximal end, a second test probe attached to the distal end, and a second plug attached to the proximal end; and a fastener member for repeatedly releasably engaging at least a portion of the first cable with at least a portion of the second cable along a length of the first and second cables. The test lead assembly and a measurement device incorporating the test lead assembly can avoid or at least reduce knotting of the test leads.