A high current source (200) for a test system for testing an electric power device (30) comprises a first plurality of first switchable half-bridges (212) and a second plurality of second switchable half-bridges (222), which are connected in parallel and by means of which a test current is redundantly distributed. A control device (280) is designed to control the first and second half-bridges (212, 222) on the basis of an input signal in such a way that an output signal for the test current, which corresponds to the input signal, is applied across a bridge branch (230) between the first switchable half-bridges (212) and the second switchable half-bridges (222).

The present invention discloses an AC impedance measurement circuit with a calibration function, which is characterized in that only one calibration impedance is needed, associated with a switch circuit. Based on the measurement results of the two calibration modes, an equivalent impedance of the switch circuit, circuit gain and phase offset can be calculated. Based on the above results, the equivalent impedance of the internal circuit is deducted from the measurement result of the measurement mode to accurately calculate an AC conductance and a phase of the AC conductance for impedance to be measured. In addition, by adjusting a phase difference between an input sine wave signal and a sampling clock signal, impedance of the same phase and impedance of the quadrature phase can be obtained, respectively, and the AC impedance and phase angle of the impedance to be measured can be calculated.

A measuring shunt includes a resistance element and a magnetic core. The resistance element includes two main contacts and a middle section extending between the main contacts for conducting an electrical current between the two main contacts through the middle section. The magnetic core extends in an annular manner around the middle section of the resistance element.

A measuring shunt includes a resistance element and a magnetic core. The resistance element includes two main contacts and a middle section extending between the main contacts for conducting an electrical current between the two main contacts through the middle section. The magnetic core extends in an annular manner around the middle section of the resistance element.

The present disclosure generally relates to a Wheatstone bridge array comprising TMR sensors and a method of fabrication thereof. In the Wheatstone bridge array, there are four distinct TMR sensors. The TMR sensors are all fabricated simultaneously to create four identical TMR sensors that have synthetic antiferromagnetic free layers as the top layer. The synthetic antiferromagnetic free layers comprise a first magnetic layer, a spacer layer, and a second magnetic layer. After forming the four identical TMR sensors, the spacer layer and the second magnetic layer are removed from two TMR sensors. Following the removal of the spacer layer and the second magnetic layer, a new magnetic layer is formed on the now exposed first magnetic layer such that the new magnetic layer has substantially the same thickness as the spacer layer and second magnetic layer combined.

Methods, apparatuses and systems for providing offset calibration and fault monitoring are disclosed herein. An example controller component may comprise: a resistance-based bridge circuit; a signal conditioning circuit configured to condition an output of the resistance-based bridge circuit; a first diagnostic circuit coupled to the signal conditioning circuit configured to monitor an output of a first branch of the resistance-based bridge circuit; and a second diagnostic circuit coupled to the signal conditioning circuit configured to monitor an output of a second branch of the resistance-based bridge circuit.

The present invention discloses an AC impedance measurement circuit with a calibration function, which is characterized in that only one calibration impedance is needed, associated with a switch circuit. Based on the measurement results of the two calibration modes, an equivalent impedance of the switch circuit, circuit gain and phase offset can be calculated. Based on the above results, the equivalent impedance of the internal circuit is deducted from the measurement result of the measurement mode to accurately calculate an AC conductance and a phase of the AC conductance for impedance to be measured. In addition, by adjusting a phase difference between an input sine wave signal and a sampling clock signal, impedance of the same phase and impedance of the quadrature phase can be obtained, respectively, and the AC impedance and phase angle of the impedance to be measured can be calculated.

There is provided a flexure body configured to be used in detection of load applied in first direction and a load applied in second direction orthogonal to the first direction. The flexure body including: a flexure member; and a circuit pattern. The flexure member has a flexure area configured to be strained under load from detection object and an area different from the flexure area. The circuit pattern includes two pieces of first-direction strain sensitive elements, two pieces of second-direction strain sensitive elements, and at least one of a first-direction fixed resistance element and a second-direction fixed resistance element. Two pieces of first-direction strain sensitive elements and two pieces of second-direction strain sensitive elements are provided in the flexure area, and the at least one of the first-direction fixed resistance element and the second-direction fixed resistance element is provided in the area different from the flexure area.

The present invention discloses an AC impedance measurement circuit with a calibration function, which is characterized in that only one calibration impedance is needed, associated with a switch circuit. Based on the measurement results of the two calibration modes, an equivalent impedance of the switch circuit, circuit gain and phase offset can be calculated. Based on the above results, the equivalent impedance of the internal circuit is deducted from the measurement result of the measurement mode to accurately calculate an AC conductance and a phase of the AC conductance for impedance to be measured. In addition, by adjusting a phase difference between an input sine wave signal and a sampling clock signal, impedance of the same phase and impedance of the quadrature phase can be obtained, respectively, and the AC impedance and phase angle of the impedance to be measured can be calculated.

An apparatus is provided, comprising: a plurality of terminals for coupling the apparatus to a sensing bridge; a switching circuitry that is coupled to at least one of the plurality of terminals; and a processing circuitry that is configured to: cause the switching circuitry to couple the plurality of terminals to a voltage source, a ground source, and the processing circuitry in accordance with a first connection profile; detect a failure of the sensing bridge or a connection between the sensing bridge and any of the plurality of terminals; select a second connection profile based on a type of the failure; and cause the switching circuitry to couple the plurality of terminals to the voltage source, the ground source, and the processing circuitry in accordance with the second connection profile.