An optically-monitored and/or optically-controlled electronic device is described. The device includes at least one of a semiconductor transistor or a semiconductor diode. An optical detector is configured to detect light emitted by the at least one of the semiconductor transistor or the semiconductor diode during operation. A signal processor is configured to communicate with the optical detector to receive information regarding the light detected. The signal processor is further configured to provide information concerning at least one of an electrical current flowing in, a temperature of, or a condition of the at least one of the semiconductor transistor or the semiconductor diode during operation.

An electric signal transmission device including an electrode 11, disposed to be opposed to an electrogenic cell, and for sending and receiving electric signals to and from the electrogenic cell via the electrode 11.

For estimating motor torque and velocity, a method estimates a velocity profile for a motor based on line-to-line voltages and phase currents for the motor. The velocity profile is estimated without a position input and a velocity input. The method further estimates a torque profile for the motor based on the line-to-line voltages, the phase currents, and a time interval of the velocity profile of motor velocities greater than a velocity threshold, and wherein the motor is operating over the time interval.

A direct current (DC) power rail probe includes a single-ended probe tip, and a two-path circuit having an input coupled to the single-ended probe tip and an output configured for connection to measurement equipment such as an oscilloscope. The two-path circuit includes an alternating current (AC) path in parallel with a feed-forward (FF) path, the AC path including a capacitive element, and the FF path including a series connection of at least one resistive element and an amplifier. The probe tip and two-path circuit are selectively operable in a non-attenuating mode and an attenuating mode.

An optically-monitored and/or optically-controlled electronic device is described. The device includes at least one of a semiconductor transistor or a semiconductor diode. An optical detector is configured to detect light emitted by the at least one of the semiconductor transistor or the semiconductor diode during operation. A signal processor is configured to communicate with the optical detector to receive information regarding the light detected. The signal processor is further configured to provide information concerning at least one of an electrical current flowing in, a temperature of, or a condition of the at least one of the semiconductor transistor or the semiconductor diode during operation.

A voltage state detector includes a voltage drop circuit, a pull-down circuit, a load circuit, a transistor, a pull-up circuit, first and second output terminals, and a logic circuit. The pull-down circuit is coupled to the voltage drop circuit. The transistor has a first terminal coupled to the load circuit, a second terminal coupled to the pull-down circuit, and a control terminal coupled to the voltage drop circuit. The pull-up circuit is coupled to the load circuit and the voltage drop circuit. The first output terminal is coupled to the first terminal of the transistor for outputting a first state determination signal. The second output terminal is coupled to the voltage drop circuit for outputting a second state determination signal. The logic circuit includes a NOR gate for performing an NOR operation on the first state determination signal and the second state determination signal to output a control signal.

Sampled measurement data stream is controlled in an electrical network by measuring at least one measurement value in a remote device; detecting in the remote device at least one phenomenon of interest or request for connection from the central device; activating by the remote device a communication channel for sampled measured values between the remote device and a central device in response to the detection of the phenomenon of interest or the request for a connection from the central device; and sending the measurement value from the remote device to the central device through the communication channel for sampled measured values.

An intraosseous access system to access a medullary cavity includes a driver including an access assembly, a motor, and an energy source. The intraosseous access system further includes a sensor configured to detect a first input from one of the motor or the energy source. The intraosseous access system further including a processing unit, communicatively coupled with the sensor, configured to receive the first input from the sensor, and determine access to a medullary cavity. The processing unit can then modify operation of one of the motor and the energy source to automatically stop operation of the system and prevent backwalling.

A sample and hold circuit takes a sample of the current flowing through an inductor of a buck switched-mode power supply (SMPS) at substantially the middle of the low side portion (50 percent point during low side switch ON) of the pulse width modulation (PWM) period. This sample of the current through the SMPS inductor during the low side ON 50% point may be considered as the “average” or “DC output” current of the SMPS, and taken every time at precisely the same low side ON 50%. A constant current source and sink are used to charge and discharge a timing capacitor whose voltage charge is monitored by a high speed voltage comparator to provide precise sample timing.

A method for diagnosing an operating state, i.e., wear, of a contactor which includes a processing unit directing voltage control means; an, actuating coil; means for measuring an electric characteristic of the actuating coil; and a diode in parallel with the coil and the measuring means; the method including creating, for a specific contactor design, a plurality of variation curves of an electric characteristic of the coils of such contactors, over a drop-out period, by testing said contactors by sending a drop-out order fixing a drop-out voltage across the coil; after the drop-out order, repeatedly measuring the electric characteristic of the coil during a drop-out period; later sending a diagnostic drop-out order fixing the same drop-out voltage across the terminals of an actuating coil of a subject contactor being diagnosed; then measuring the same electric characteristic of the subject coil during a drop-out period; identifying a measured value of that characteristic of the subject coil, then comparing that measured value with the variation curves of the plurality of contactors of the same design, thereby diagnosing a state of wear of the subject contactor.