An integrated circuit and/or sensing circuitry assists in determining the thermal capacity available at a given and future time. In one aspect, the integrated circuit includes a number of channels connected to any number of components having differing thermal capacities. The integrated circuit may provide information relating to available thermal capacity on a per-channel basis as well as on a system-wide basis.

An apparatus and a system are disclosed for measuring electrical power with improved accuracy as a result of compensating for sources of thermal energy that are not caused by the electrical power of the electrical circuit under test. The apparatuses and systems described herein provide a separate electrical signal source (e.g. RF electrical circuits under test) and DC sides. The apparatuses and systems include devices adapted to convert thermal energy into voltages having reversed polarities. The apparatuses and systems described herein are adapted to compensate for temperature changes not caused by the electrical power of the electrical circuit under test (e.g., ambient temperature change and thermal energy transmitted through the signal transmission lines from sources in the electrical circuit).

An apparatus and a system are disclosed for measuring electrical power with improved accuracy as a result of compensating for sources of thermal energy that are not caused by the electrical power of the electrical circuit under test. The apparatuses and systems described herein provide a separate electrical signal source (e.g. RF electrical circuits under test) and DC sides. The apparatuses and systems include devices adapted to convert thermal energy into voltages having reversed polarities. The apparatuses and systems described herein are adapted to compensate for temperature changes not caused by the electrical power of the electrical circuit under test (e.g., ambient temperature change and thermal energy transmitted through the signal transmission lines from sources in the electrical circuit).

An apparatus and a system measure electrical power with improved accuracy as a result of compensating for sources of thermal energy that are not caused by the electrical power of the electrical circuit under test. The apparatuses and systems provide a separate electrical signal source (e.g. RF electrical circuits under test) and DC sides. The apparatuses and systems include devices adapted to convert thermal energy into voltages having reversed polarities. The apparatuses and systems are adapted to compensate for temperature changes not caused by the electrical power of the electrical circuit under test (e.g., ambient temperature change and thermal energy transmitted through the signal transmission lines from sources in the electrical circuit).

An apparatus and a system measure electrical power with improved accuracy as a result of compensating for sources of thermal energy that are not caused by the electrical power of the electrical circuit under test. The apparatuses and systems provide a separate electrical signal source (e.g. RF electrical circuits under test) and DC sides. The apparatuses and systems include devices adapted to convert thermal energy into voltages having reversed polarities. The apparatuses and systems are adapted to compensate for temperature changes not caused by the electrical power of the electrical circuit under test (e.g., ambient temperature change and thermal energy transmitted through the signal transmission lines from sources in the electrical circuit).