A pulsed high frequency monitor of the present invention monitors the power level of a pulsed high frequency on the basis of a transition pattern in which the power level changes in time series instead of monitoring the power level by comparing the power level of the pulsed high frequency with a threshold value. The pulsed high frequency monitor comprises: a DC circuit that converts the pulsed high frequency into DC and outputs the power level; a power level change detection circuit that detects a level change of the power level; and a transition pattern determination circuit that determines a time-series transition pattern of the power level on the basis of the level change detected by the power level change detection circuit.

A sensing circuit in a device having a moving body in which a unit to be detected including first and second pattern units spaced apart from each other is formed includes an oscillation circuit unit including first and second oscillation circuits fixedly mounted on a substrate spaced apart from the unit to be detected, including, respectively, first and second sensing coils having first and second inductance values depending on areas of overlap between the first and second sensing coils and the first and second pattern units and outputting, respectively, first and second sensed oscillation signals based on the first and second inductance values; and a sensing circuit outputting an output signal having movement information of the moving body based on each period count value for each of the first and second sensed oscillation signals using a reference oscillation signal.

A sensing circuit in a device having a moving body in which a unit to be detected including first and second pattern units spaced apart from each other is formed includes an oscillation circuit unit including first and second oscillation circuits fixedly mounted on a substrate spaced apart from the unit to be detected, including, respectively, first and second sensing coils having first and second inductance values depending on areas of overlap between the first and second sensing coils and the first and second pattern units and outputting, respectively, first and second sensed oscillation signals based on the first and second inductance values; and a sensing circuit outputting an output signal having movement information of the moving body based on each period count value for each of the first and second sensed oscillation signals using a reference oscillation signal.

A frequency measurement method is provided, which comprising: sampling a voltage to be measured with a fixed sampling frequency; obtaining a positive-sequence voltage angle change amount for a predetermined operation interval time by using a sampling sample obtained by the sampling and based on a discrete Fourier transform (DFT) calculation; obtaining a frequency offset amount by using the positive-sequence voltage angle change amount; and obtaining a frequency-related measurement value by using the frequency offset amount. A frequency measurement apparatus is also provided. measurement value. This frequency measurement method does not require iterative calculations, and directly obtains frequency-dependent measurement values, thereby responding quickly to frequency changes. In addition, a frequency measurement apparatus is also provided.

A frequency measurement method is provided, which comprising: sampling a voltage to be measured with a fixed sampling frequency; obtaining a positive-sequence voltage angle change amount for a predetermined operation interval time by using a sampling sample obtained by the sampling and based on a discrete Fourier transform (DFT) calculation; obtaining a frequency offset amount by using the positive-sequence voltage angle change amount; and obtaining a frequency-related measurement value by using the frequency offset amount. A frequency measurement apparatus is also provided. measurement value. This frequency measurement method does not require iterative calculations, and directly obtains frequency-dependent measurement values, thereby responding quickly to frequency changes. In addition, a frequency measurement apparatus is also provided.

The disclosed embodiments relate to components of a memory system that support timing-drift calibration. In specific embodiments, this memory system contains a memory device (or multiple devices) which includes a clock distribution circuit and an oscillator circuit which can generate a frequency, wherein a change in the frequency is indicative of a timing drift of the clock distribution circuit. The memory device also includes a measurement circuit which is configured to measure the frequency of the oscillator circuit.

The disclosed embodiments relate to components of a memory system that support timing-drift calibration. In specific embodiments, this memory system contains a memory device (or multiple devices) which includes a clock distribution circuit and an oscillator circuit which can generate a frequency, wherein a change in the frequency is indicative of a timing drift of the clock distribution circuit. The memory device also includes a measurement circuit which is configured to measure the frequency of the oscillator circuit.

An optical device includes a low-noise illumination source, a support device, an ultra low-noise detector, an analog-to-digital converter, and a controller. The low-noise illumination source is configured to generate a single beam of radiation. The support device is configured to support an object and to pass the single beam of radiation through the object. The object directly blocks, absorbs, or deflects portions of the single beam of radiation, thereby directly modulating the single beam of radiation. The low-noise detector is configured to detect the modulated single beam of radiation and to output an analog signal representative of vibrational spectra of the object. The modulated single beam of radiation is non-interferometric. The analog-to-digital converter is configured to convert the detected analog signal into a digital signal. The controller is configured to analyze and generate vibrational spectra of the object from the digital signal represented as a range of events over time.

An optical device includes a low-noise illumination source, a support device, an ultra low-noise detector, an analog-to-digital converter, and a controller. The low-noise illumination source is configured to generate a single beam of radiation. The support device is configured to support an object and to pass the single beam of radiation through the object. The object directly blocks, absorbs, or deflects portions of the single beam of radiation, thereby directly modulating the single beam of radiation. The low-noise detector is configured to detect the modulated single beam of radiation and to output an analog signal representative of vibrational spectra of the object. The modulated single beam of radiation is non-interferometric. The analog-to-digital converter is configured to convert the detected analog signal into a digital signal. The controller is configured to analyze and generate vibrational spectra of the object from the digital signal represented as a range of events over time.

A photoelectric conversion apparatus includes an interferometer configured to cause interference in wavelength swept light Lx output from a wavelength swept light source X and is configured to convert the interfered wavelength swept light by photoelectric conversion. A signal processing apparatus calculates, in chronological order, relative frequencies fr(t) indicating frequencies relative to interference signals i(t) obtained by the photoelectric conversion of the interference light iL, and measures a difference between a maximum value and a minimum value of the relative frequencies fr(t), as a sweep frequency width Δf of the wavelength swept light Lx.