Provided is a method of determining a gate capacitance of a semiconductor device having a source, a drain, a gate, and a channel, the semiconductor device being arranged in a circuit further comprising an electrical resonator, wherein one of the source, the drain, and the gate is connected to the electrical resonator. The method comprises: measuring a resonance frequency of the circuit; and calculating, based on the resonance frequency, the gate capacitance. Since it is not necessary to pass a current through the semiconductor device, an accurate measurement of gate capacitance may be achieved. Also provided are an apparatus for determining a gate capacitance, a probe for measuring gate capacitance, and a related computer program product.

Provided is a method of determining a gate capacitance of a semiconductor device having a source, a drain, a gate, and a channel, the semiconductor device being arranged in a circuit further comprising an electrical resonator, wherein one of the source, the drain, and the gate is connected to the electrical resonator. The method comprises: measuring a resonance frequency of the circuit; and calculating, based on the resonance frequency, the gate capacitance. Since it is not necessary to pass a current through the semiconductor device, an accurate measurement of gate capacitance may be achieved. Also provided are an apparatus for determining a gate capacitance, a probe for measuring gate capacitance, and a related computer program product.

A circuit chip is connected to a sensor chip in a sub-unit via a communication terminal, and includes an output wave formation circuit that performs communication by controlling a voltage of a power supply supplied from an electronic control unit (ECU) to raise a voltage level of an output signal. When the voltage of the power supply monitored by a voltage monitor rises above a threshold value, a control circuit lowers a voltage of a signal from the output wave formation circuit, thereby preventing an excessive rise of the power supply voltage used in a signal communication.

A circuit chip is connected to a sensor chip in a sub-unit via a communication terminal, and includes an output wave formation circuit that performs communication by controlling a voltage of a power supply supplied from an electronic control unit (ECU) to raise a voltage level of an output signal. When the voltage of the power supply monitored by a voltage monitor rises above a threshold value, a control circuit lowers a voltage of a signal from the output wave formation circuit, thereby preventing an excessive rise of the power supply voltage used in a signal communication.

A method is provided for performing vector spectral measurements of a radio frequency (RF) signal having a repetitive waveform, using a receiver having a frequency span less than a total bandwidth of the RF signal. The method includes capturing multiple frequency segments of the RF signal corresponding to waveforms of the repetitive waveform synchronized to corresponding external triggering, each frequency segment having a corresponding segment bandwidth less than the total bandwidth of the RF signal; performing at least one instance of phase stitching and at least one instance of amplitude stitching between adjacent captured frequency segments; and using an Inverse Fast Fourier Transform (IFFT) to obtain a time-domain record of the repetitive waveform.

A method is provided for performing vector spectral measurements of a radio frequency (RF) signal having a repetitive waveform, using a receiver having a frequency span less than a total bandwidth of the RF signal. The method includes capturing multiple frequency segments of the RF signal corresponding to waveforms of the repetitive waveform synchronized to corresponding external triggering, each frequency segment having a corresponding segment bandwidth less than the total bandwidth of the RF signal; performing at least one instance of phase stitching and at least one instance of amplitude stitching between adjacent captured frequency segments; and using an Inverse Fast Fourier Transform (IFFT) to obtain a time-domain record of the repetitive waveform.

An oscilloscope includes a time domain input, a logic domain input, and a frequency domain input. The time domain input provides a time domain input signal in a time domain as a first input signal. The logic domain input provides logic level input as a second input signal. The logic level input includes logic levels over time. The frequency domain input provides a third input signal through frequency downconversion.

An oscilloscope includes a time domain input, a logic domain input, and a frequency domain input. The time domain input provides a time domain input signal in a time domain as a first input signal. The logic domain input provides logic level input as a second input signal. The logic level input includes logic levels over time. The frequency domain input provides a third input signal through frequency downconversion.

A method for determining the state of at least one sensor, the method using a first electromechanical transducer and a second electromechanical transducer that are coupled to a substrate, and a non-linear electrical circuit connected between the second electromechanical transducer and the sensor, the method comprising the steps of: applying an electrical signal at a first amplitude to the terminals of the first electromechanical transducer, and determining a first set of values of a parameter characteristic of the electrical impedance of the first electromechanical transducer in response to the application of the electrical signal; applying the electrical signal at a second amplitude to the terminals of the first electromechanical transducer, and determining a second set of values of the parameter characteristic of the impedance; measuring a difference between the first set of values and the second set of values; determining a state of the sensor on the basis of the difference between the first set of values and the second set of values.

A method for determining the state of at least one sensor, the method using a first electromechanical transducer and a second electromechanical transducer that are coupled to a substrate, and a non-linear electrical circuit connected between the second electromechanical transducer and the sensor, the method comprising the steps of: applying an electrical signal at a first amplitude to the terminals of the first electromechanical transducer, and determining a first set of values of a parameter characteristic of the electrical impedance of the first electromechanical transducer in response to the application of the electrical signal; applying the electrical signal at a second amplitude to the terminals of the first electromechanical transducer, and determining a second set of values of the parameter characteristic of the impedance; measuring a difference between the first set of values and the second set of values; determining a state of the sensor on the basis of the difference between the first set of values and the second set of values.