A signal processing apparatus includes a unit configured to generate noise cut data by deducting a predetermined noise value from values of respective signals constituting input data and a stochastic resonance processing unit configured to subject the noise cut data to a predetermined stochastic resonance processing. The predetermined stochastic resonance processing is processing to output, in a method of synthesizing a result of parallelly performing steps of adding new noise to the noise cut data to subject the resultant data to a binary processing, a value obtained in a case where the parallel number is infinite.

An apparatus for frequency measurement (1ODMTM) which provides precise and accurate measurement of a single input tone frequency and/or multiple separable input tone frequencies. Tone separability can be achieved by proper selection of the parameter N, the sample length of the DFT/FFT.

An apparatus for frequency measurement (1ODMTM) which provides precise and accurate measurement of a single input tone frequency and/or multiple separable input tone frequencies. Tone separability can be achieved by proper selection of the parameter N, the sample length of the DFT/FFT.

A method of analyzing a signal is described. The method includes: setting a trigger condition to be applied; applying the trigger condition; acquiring at least two acquisitions associated with the input signal, each acquisition including a trigger event that matches the trigger condition set; determining a trigger time for each trigger event; storing a time stamp with each trigger event; and generating a histogram based on the time stamps stored, the histogram providing number of trigger events versus time. Further, a signal analysis device for analyzing a signal is described.

An example device includes a magnetic film, two or more spin wave generators, and one or more detectors. The magnetic film is capable of supporting spin waves. The two or more spin wave generators are operable to create a diffraction pattern of the spin waves in the magnetic film. The two or more spin wave generators generate the spin waves based on a source signal. The one or more detectors are operable to measure an amplitude of the spin waves in the diffraction pattern. The amplitude measured by a particular detector is indicative of a property of the source signal.

An example device includes a magnetic film, two or more spin wave generators, and one or more detectors. The magnetic film is capable of supporting spin waves. The two or more spin wave generators are operable to create a diffraction pattern of the spin waves in the magnetic film. The two or more spin wave generators generate the spin waves based on a source signal. The one or more detectors are operable to measure an amplitude of the spin waves in the diffraction pattern. The amplitude measured by a particular detector is indicative of a property of the source signal.

The present invention describes an amplifier adjusting device for an amplifier element which is adjustable as a function of amplification factor and is coupled to a frequency domain selecting element for adjusting at least to frequency domains. The amplifier adjusting device includes a memory in which at least two amplification factors may be stored, the at least two amplification factors being assigned to the two at least two frequency domains, an amplification factor adjusting element configured to select, depending on a current frequency domain, a corresponding amplification factor from the memory in order to adjust the adjustable amplifier element, and an amplification factor estimator configured to correct, based on an analysis of a signal amplified by means of the adjustable amplifier element in accordance with the selected amplification factor, the selected amplification factor and store the corrected amplification factor in the memory.

The present invention describes an amplifier adjusting device for an amplifier element which is adjustable as a function of amplification factor and is coupled to a frequency domain selecting element for adjusting at least to frequency domains. The amplifier adjusting device includes a memory in which at least two amplification factors may be stored, the at least two amplification factors being assigned to the two at least two frequency domains, an amplification factor adjusting element configured to select, depending on a current frequency domain, a corresponding amplification factor from the memory in order to adjust the adjustable amplifier element, and an amplification factor estimator configured to correct, based on an analysis of a signal amplified by means of the adjustable amplifier element in accordance with the selected amplification factor, the selected amplification factor and store the corrected amplification factor in the memory.

System for digital sweep type spectrum analysis with up/down frequency provides measurements of frequency spectrum of complex analog baseband input signal. The signal is quantized into three levels with fs based on the bandwidth of the input signal. Four multiplexers, a first block of registers and a block of adders perform operations equivalent to complex multiplication of the quadrature components. Two complex signals with up and down shifted spectrum are produced by the adders. The quadrature components are inputted to the accumulators with reset, which act as low-pass filters and accumulate several samples at a constant frequency f.sub.LO of the local oscillator. Levels of two accumulated complex samples are estimates of input signal spectrum in two frequency points +f.sub.LO and −f.sub.LO. A sweep controller changes a frequency of the local oscillator from zero up to fs/2. Estimates of the input signal spectrum are generated sequentially in range −fs/2 to +fs/2.

System for digital sweep type spectrum analysis with up/down frequency provides measurements of frequency spectrum of complex analog baseband input signal. The signal is quantized into three levels with fs based on the bandwidth of the input signal. Four multiplexers, a first block of registers and a block of adders perform operations equivalent to complex multiplication of the quadrature components. Two complex signals with up and down shifted spectrum are produced by the adders. The quadrature components are inputted to the accumulators with reset, which act as low-pass filters and accumulate several samples at a constant frequency f.sub.LO of the local oscillator. Levels of two accumulated complex samples are estimates of input signal spectrum in two frequency points +f.sub.LO and −f.sub.LO. A sweep controller changes a frequency of the local oscillator from zero up to fs/2. Estimates of the input signal spectrum are generated sequentially in range −fs/2 to +fs/2.