The invention relates to a detection apparatus (12) for detecting photons. The detection apparatus comprises a pile-up determining unit (15) for determining whether detection signal pulses being indicative of detected photons are caused by a pile-up event or by a non-pile-up event, wherein a detection values generating unit (16) generates detection values depending on the detection signal pulses and depending on the determination whether the respective detection signal pulse is caused by a pile-up event or by a non-pile-up event. In particular, the detection values generating unit can be adapted to reject the detection signal pulses caused by pile-up events while generating the detection values. This allows for an improved quality of the generated detection values.

The invention relates to a detection apparatus (12) for detecting photons. The detection apparatus comprises a pile-up determining unit (15) for determining whether detection signal pulses being indicative of detected photons are caused by a pile-up event or by a non-pile-up event, wherein a detection values generating unit (16) generates detection values depending on the detection signal pulses and depending on the determination whether the respective detection signal pulse is caused by a pile-up event or by a non-pile-up event. In particular, the detection values generating unit can be adapted to reject the detection signal pulses caused by pile-up events while generating the detection values. This allows for an improved quality of the generated detection values.

The disclosure relates to a method for calculating surface electric field distribution of nanostructures. The method includes the following steps of: providing a nanostructure sample located on an insulated layer of a substrate; spraying first charged nanoparticles to the insulated surface; blowing vapor to the insulated surface and imaging the first charged nanoparticles via an optical microscope, recording the width w between the first charged nanoparticles and the nanostructure sample, and obtaining the voltage U of the nanostructure sample by an equation.

A method for in-situ measuring electrical properties of carbon nanotubes includes placing a first electrode in a chamber, wherein the first electrode defines a cavity. A growth substrate is suspend inside of the cavity, and a catalyst layer is located on the growth substrate. A measuring meter having a first terminal and a second terminal opposite to the first terminal is provided. The first terminal is electrically connected to the first electrode, and the second terminal is electrically connected to the growth substrate. A carbon source gas, a protective gas, and hydrogen are supplied to the cavity, to grow the carbon nanotubes on the catalyst layer. The electrical properties of the carbon nanotubes are obtained by the measuring meter.

A method for in-situ measuring electrical properties of carbon nanotubes includes placing a first electrode in a chamber, wherein the first electrode defines a cavity. A growth substrate is suspend inside of the cavity, and a catalyst layer is located on the growth substrate. A measuring meter having a first terminal and a second terminal opposite to the first terminal is provided. The first terminal is electrically connected to the first electrode, and the second terminal is electrically connected to the growth substrate. A carbon source gas, a protective gas, and hydrogen are supplied to the cavity, to grow the carbon nanotubes on the catalyst layer. The electrical properties of the carbon nanotubes are obtained by the measuring meter.

A system for detection of a touch gesture of a user on a detection surface includes a processing unit, an electrostatic-charge-variation sensor, which generates a charge-variation signal; and an accelerometer, which generates an acceleration signal. The processing unit is configured to: detect, in the charge-variation signal, a first feature identifying the touch; detect, in the acceleration signal, a second feature identifying the touch; detect a temporal correspondence between the first and second features identifying the touch gesture; and validate the touch gesture only in the case where both the first and second features have been detected and the temporal correspondence satisfies a pre-set relation.

A system for detection of a touch gesture of a user on a detection surface includes a processing unit, an electrostatic-charge-variation sensor, which generates a charge-variation signal; and an accelerometer, which generates an acceleration signal. The processing unit is configured to: detect, in the charge-variation signal, a first feature identifying the touch; detect, in the acceleration signal, a second feature identifying the touch; detect a temporal correspondence between the first and second features identifying the touch gesture; and validate the touch gesture only in the case where both the first and second features have been detected and the temporal correspondence satisfies a pre-set relation.

A system for measuring electrical charge, comprising a capacitance detector (110) connected to a charge integrator (120) being an operational amplifier with capacitance (Cf) feedback (130), wherein the input stage (121) of the charge integrator (120) comprises a pair of symmetrically connected complementary JFET transistors (T.sub.1, T.sub.2), the gates of which are connected to the input of the charge integrator (120), characterized in that an n-type transistor (T.sub.1) of the complementary pair of transistors (T.sub.1, T.sub.2) has its drain connected to a voltage regulating system (122).

A system for measuring electrical charge, comprising a capacitance detector (110) connected to a charge integrator (120) being an operational amplifier with capacitance (Cf) feedback (130), wherein the input stage (121) of the charge integrator (120) comprises a pair of symmetrically connected complementary JFET transistors (T.sub.1, T.sub.2), the gates of which are connected to the input of the charge integrator (120), characterized in that an n-type transistor (T.sub.1) of the complementary pair of transistors (T.sub.1, T.sub.2) has its drain connected to a voltage regulating system (122).

An automatic analyzing apparatus capable of eliminating static electricity charged in a specimen container at a specimen dispensing position provided. The automatic analyzing apparatus includes a dispensing mechanism having a probe that aspirates a liquid and an arm that holds the probe, and a static eliminator having a generation source of neutralizing ions and a neutralizing ion blowing mechanism for blowing the neutralizing ions generated in the generation source to a target, which are provided in the dispensing mechanism.