A measurement is made of jitter present in a jittery clock signal. A digital sinusoid generator circuit clocked by the jittery clock signal generates a pulse density modulation (PDM) signal corresponding to a sinusoid waveform. The PDM signal is converted by a sigma-delta modulator circuit to an oscillating frequency signal with an output of digital values digital values indicative of oscillating frequency signal phase. Responsive to the jittery clock signal, the digital values indicative of oscillating frequency signal phase are sampled. A digital differentiator circuit determines a digital difference between consecutive samples of the digital values indicative of oscillating frequency signal phase. The digital difference is processed by a digital signal processing circuit to generate a frequency spectrum and determine from signal-to-noise ratio a measurement of jitter in the jittery clock signal.

A measurement is made of jitter present in a jittery clock signal. A digital sinusoid generator circuit clocked by the jittery clock signal generates a pulse density modulation (PDM) signal corresponding to a sinusoid waveform. The PDM signal is converted by a sigma-delta modulator circuit to an oscillating frequency signal with an output of digital values digital values indicative of oscillating frequency signal phase. Responsive to the jittery clock signal, the digital values indicative of oscillating frequency signal phase are sampled. A digital differentiator circuit determines a digital difference between consecutive samples of the digital values indicative of oscillating frequency signal phase. The digital difference is processed by a digital signal processing circuit to generate a frequency spectrum and determine from signal-to-noise ratio a measurement of jitter in the jittery clock signal.

A noise detecting circuit including an amplifier circuit, a filtering circuit and a comparing circuit. The amplifier circuit is arranged to amplify an input signal and output an amplified signal, wherein the input signal is received from a circuit to be detected and indicates a noise level of the circuit to be detected. The filtering circuit is coupled to the amplifier circuit and arranged to filter the amplified signal and output a filtered signal. The comparing circuit is coupled to the filtering circuit and arranged to compare the filtered signal to a reference voltage and output an output signal indicating the noise level of the circuit to be detected.

Functionality for estimating characteristics of an on-chip noise signal can be implemented on a processing module. An on-chip noise signal is determined at an on-chip determination point of a computer chip. The on-chip noise signal is converted to a frequency-varying signal using a voltage-controlled oscillator implemented on the computer chip. The frequency-varying signal is measured at an off-chip measurement point and frequency information is extracted from the frequency-varying signal. The frequency information is converted to a voltage level associated with the on-chip noise signal based on the relationship between an input voltage provided to the voltage-controlled oscillator and an output frequency generated by the voltage-controlled oscillator.

Functionality for estimating characteristics of an on-chip noise signal can be implemented on a processing module. An on-chip noise signal is determined at an on-chip determination point of a computer chip. The on-chip noise signal is converted to a frequency-varying signal using a voltage-controlled oscillator implemented on the computer chip. The frequency-varying signal is measured at an off-chip measurement point and frequency information is extracted from the frequency-varying signal. The frequency information is converted to a voltage level associated with the on-chip noise signal based on the relationship between an input voltage provided to the voltage-controlled oscillator and an output frequency generated by the voltage-controlled oscillator.

A jitter measuring setup (10) comprises a signal generator (14), a sample-and-hold circuit (15), and the inventive all stochastic jitter measuring device (1) comprising signal acquisition means (2) and calculation means (3). The input signal of the sample-and-hold circuit (15) is generated by the signal generator (14). Furthermore, the output signal of the sample-and-hold circuit (15), respectively the input signal of the measuring device (1), is comprised of a superposition of the sampled input signal of the sample-and-hold circuit (15) and a cyclostationary random process.

A crossover protection system including a product transport vehicle having a tank compartment for containing a liquid product, a fluid property sensor positioned to contact liquid product stored in the tank compartment, a system controller, and a valve coupled to the tank compartment. The valve regulates a flow of liquid product from the tank compartment and has a normally locked state. The system controller may compare a received transported liquid type signal from the fuel property sensor indicative of the type of liquid product in the tank compartment and compare the type of liquid product to a stored liquid product type. If the two types match, the crossover protection controller transitions the valve to an unlocked state to allow the liquid product to unload from the tank compartment. If the two types do not match, the crossover protection controller will disable the valve from transitioning to the unlocked state.

A method measures a characteristic of a SUT using a signal measurement device having multiple input channels. The method includes digitizing first and second copies of the SUT in first and second input channels to obtain first and second digitized waveforms; repeatedly determining measurement values of the SUT characteristic in the first and second digitized waveforms to obtain first and second measurement values, respectively, each second measurement value being paired with a first measurement value to obtain measurement value pairs; multiplying the first and second measurement values in each of the measurement value pairs to obtain measurement products; determining a mean-squared value (MSV) of the SUT characteristic measurement; and determining a square root of the MSV to obtain a root-mean-squared (RMS) value of the measured SUT characteristic, which substantially omits variations not in the SUT, which are introduced by only one of the first or second input channel.

A method measures a characteristic of a SUT using a signal measurement device having multiple input channels. The method includes digitizing first and second copies of the SUT in first and second input channels to obtain first and second digitized waveforms; repeatedly determining measurement values of the SUT characteristic in the first and second digitized waveforms to obtain first and second measurement values, respectively, each second measurement value being paired with a first measurement value to obtain measurement value pairs; multiplying the first and second measurement values in each of the measurement value pairs to obtain measurement products; determining a mean-squared value (MSV) of the SUT characteristic measurement; and determining a square root of the MSV to obtain a root-mean-squared (RMS) value of the measured SUT characteristic, which substantially omits variations not in the SUT, which are introduced by only one of the first or second input channel.

A signal processing apparatus includes a unit configured to generate noise cut data by deducting a predetermined noise value from values of respective signals constituting input data and a stochastic resonance processing unit configured to subject the noise cut data to a predetermined stochastic resonance processing. The predetermined stochastic resonance processing is processing to output, in a method of synthesizing a result of parallelly performing steps of adding new noise to the noise cut data to subject the resultant data to a binary processing, a value obtained in a case where the parallel number is infinite.