The measuring apparatus according to the present invention searches each of subbands divided from a target band set with respect to the Frequency Distribution Information (FDI) obtained periodically to find a unit band corresponding to a maximum frequency component among unit bands pertaining to said each subband; marks the found unit band as a Dominant Unit Band (DUB); organizes a DUB distribution table by collecting a plural pieces of the FDI as much as a predetermined time; checks a distribution locus of DUBs on the organized DUB distribution table. And, if it is confirmed that the DUB distribution table shows a specific distribution pattern corresponding to an acceleration sound, etc., the measuring apparatus makes a measured intensity to be identified as an intensity measured at a start position of a platform or a tunnel section, based on the time when the specific distribution pattern appears.

An apparatus detects complex time-variant electromagnetic disturbances resulting from a high-altitude nuclear electromagnetic pulse (EMP) or solar storm. The device relies on a circuit (104, 1301) to monitor the input power lines (301, 401, 501) for sustained conducted electrical disturbances associated with the E3 phase of an EMP or solar storm. A separate circuit (105, 1302) monitors the power lines and the ambient environment (503) for transient electromagnetic pulse disturbances associated with the E1 and E2 phases of an EMP. When sustained electrical disturbances or transient electromagnetic pulse disturbances are detected, the apparatus provides a visual alarm (603. 609), audible alarm (608), and discrete indication signal (607) that can be used to disconnect (702) or redirect the flow of electrical power.

A circuit and a method for reducing interference of power on/off to hardware test. The circuit includes: a power unit, a voltage processing unit, a PSU and a to-be-tested hardware. An input terminal of the voltage processing unit is connected to the power unit, an output terminal of the voltage processing unit is connected to an input terminal of the PSU, and an output terminal of the PSU is connected to the to-be-tested hardware; the power unit is configured to provide an operating voltage; the voltage processing unit is configured to eliminate electric sparks caused by instability of the operating voltage at an instant of power on/off; the PSU is configured to convert a stable operating voltage outputted from the voltage processing unit into a direct current voltage required for the to-be-tested hardware; and the to-be-tested hardware is configured to receive the direct current voltage outputted from the PSU.

According to some embodiments, a method of performing EMC testing of an ADV can be used According to some embodiments, a method of performing EMC testing of an ADV can be used to test how software and hardware components in the ADV are impacted in an indoor EMC testing environment. According to the method, the ADV can be positioned at a fixed spot in the indoor EMC testing environment, and can be driven in an autonomous driving mode for a predetermined period of time. One or more of the autonomous driving modules of the ADV are modified to accommodate the positioning of the ADV at the fixed spot and the indoor EMC testing environment. The ADV can determine if each of a plurality of performance parameters meets its performance metric during the predetermined period of time. If each performance parameters meets its performance metric, the ADV is considered to have passed the EMC testing.

A method for analyzing noise spectrum of an electronic device includes storing a waveform data including a plurality of data points, the waveform data is obtained by measuring a target signal from the electronic device, removing data points corresponding to a background noise fluctuation based on a smooth curve of the waveform data, data points considered candidates for peaks are extracted from the waveform data, classifying the extracted data points based on a distance between adjacent data points in order to discriminate a cluster of distant data points from data points closely positioned to dominant peaks, determining the dominant peaks based on the cluster of distant data points such that the data points closely positioned to the dominant peaks are ignored, each dominant peak corresponds to the characteristic of the electronic device, and outputting the dominant peaks as an analysis result for the electronic device.

A mapping probe provides real-time signal sampling and recovery from engineered electromagnetic interference and includes: a trigger voltage source that synchronizes transmission of primary electromagnetic waves; primary electromagnetic wave synthesizers that receive a trigger voltage signal and produce time-varying voltage signals; transmitters that receive time-varying voltage signals and synchronously transmit primary electromagnetic waves, such that the primary electromagnetic waves are subjected to scattering by a structural entity to produce scattered electromagnetic waves; receivers that receive scattered electromagnetic waves and produce receiver signals based on the scattered electromagnetic waves; a conversion stage that receives the receiver signals and the trigger voltage signal and produces converted data; and a render that receives the converted data and produces a map of the structural entity.

The present disclosure includes apparatuses and methods related to test devices, for example testing devices by measuring signals emitted by a device. One example apparatus can include a first portion including a number of sidewalls positioned to at least partially surround a device under test; and a second portion electrically coupled to the first portion, wherein the second portion is configured to move in the x-direction, the y-direction, and z-direction.

A method of monitoring static charge is provided. The method includes the operations as follows. A metallic plate is connected to a conductive tape wrapped around an outer surface of a non-conductive tube. A plurality of static charges are detected from the metallic plate by an electrostatic field meter, wherein the conductive tape and the metallic plate are entirely disposed within a metallic box. A flow rate of a fluid flowing through the non-conductive tube is adjusted according to the plurality of static charges detected by the electrostatic field meter.

A circuit and method for electrostatic discharge testing using transmission line pulsing. A plurality of transmission line networks may be connected to a device under test, and each transmission line network may have different connected terminations. Switches may be used to select which transmission line networks are connected to the device under test, and which terminations, if any, are connected to transmission line networks.

An ion generating device includes a controller, positive and negative ion generating circuits, an airflow generator, and a detecting element. The controller is preinstalled with a constant of proportionality, controls the positive and the negative ion generating circuits, and the airflow generator directs the ions to a destination. The detecting element detects the balanced voltage of the positive and negative ions at the destination, and responds with the detecting result to the controller. The controller increases or decreases the ion numbers. The variation of the ion numbers is x, and the balanced voltage at the destination is y. The controller compares the function of x and y with the constant of proportionality to determine whether they are similar. If the comparison result is similar, then the electrostatic dissipation capability of the ion generating device is normal.