An electric power equipment comprises: a display module; a sensor module for outputting measurement data including a first noise signal measured from inside of the electric power equipment, a second noise signal measured from outside of the electric power equipment, a temperature signal of the electric power equipment, and a humidity signal of the electric power equipment; and a control module for diagnosing whether a partial discharge has occurred based on the measurement data, wherein the control module includes: a determination unit for determining whether a signal magnitude of the first noise signal is within a preset first reference range; an analysis unit for diagnosing an occurrence of the partial discharge, and for analyzing the signals according to the analysis algorithm; and a control unit for controlling a result information of the analyzing, and a maintenance and repair information, to be displayed.

A disk drive thermal performance testing device includes a drive housing, an electrical connector and an adjustable power loading device. The drive housing is at least partially made of a thermally conductive material. The electrical connector is in the drive housing and provides an external connection. The adjustable power loading device is located in the drive housing, is coupled to the electrical connector, and is thermally coupled to the drive housing.

An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.

A capacitor life diagnosis apparatus includes ringing detection circuitry that detects ringing of an output voltage of a power source including a capacitor at an output end, and signal generation circuitry that generates a signal indicating a life of the capacitor based on the ringing detected by the ringing detection circuitry.

A method for providing an environmental impact rating for a solar cell includes acquiring power generation data and thermal exchange data regarding the solar cell using a data acquisition device, transmitting the power generation data and the thermal exchange data to a controller, and generating the environmental impact rating based on the power generation data and the thermal exchange data using the controller, wherein the environmental impact rating provides an indication of an environmental impact of using the solar cell.

An electronic device includes a housing and an electrical connector disposed along the housing. The electrical connector includes one or a plurality of electrical contacts having at least a portion thereof exposed to an exterior of the housing. An interface circuit is operable with the electrical connector and coupled to one or more electrical contacts of the electrical connector to interact with a complementary connector when connected to the electrical connector. A moisture detection circuit is to detect moisture contacting the electrical connector.

An oil resistance test method for an electronic device is provided. At least one type of resin material is provided on at least a portion of an outer surface of the electronic device. The oil resistance test method includes: setting a test temperature; and immersing the electronic device in a water-soluble cutting oil in an atmosphere of the set test temperature. This cutting oil contains a mineral oil and a surfactant, and exhibits a milky-white appearance when diluted with water. The oil resistance test method further includes: determining, based on an electrical characteristic of the electronic device, whether or not the electronic device has been degraded by the cutting oil; and estimating, based on a total immersion time of the electronic device in the cutting oil until degradation of the electronic device is detected, a life of oil resistance of the electronic device.

Probe systems, storage media, and methods for wafer-level testing over extended temperature ranges are disclosed herein. The methods are configured to test a plurality of devices under test (DUTs) present on a substrate. The probe systems are programmed to perform the methods. The storage media include computer-readable instructions that direct a probe system to perform the methods.

Embodiments of the invention provide systems and methods for tracking the thermal age of a self-regulating heating cable. Over a time period, current and voltage data for a cable signal are collected, from which spectral information is extracted. The spectral information has a frequency component and an amplitude component. The cable signal is processed to extract a line frequency signature that includes the electrical system's line current frequency and at least some of its harmonics. A ratio of the amplitudes of at least two of the odd harmonics of the line current frequency is calculated. The ratio is compared to an aging curve indicating the thermal age of the cable as a function of the odd-harmonic ratios. The curve may be obtained in a laboratory setting or in the field by characterizing a cable with zero hours of use. The characterizing may include aging the cable to determine the curve.

The present invention provides a printed circuit board assembly including a substrate having a plurality of conductive layers vertically sandwiched between a first cap-insulation layer and a second cap-insulation layer. The substrate has a first part, a second part and a third part. For protecting the conductive layers from moisture, each of the areas of the conductive layers corresponding to the second part is smaller than the area of the first cap-insulation layer corresponding to the second part for at least a first predetermined percentage, and each of the areas of the conductive layers corresponding to the second part is smaller than the area of the second cap-insulation layer corresponding to the second part for at least the first predetermined percentage.