A burn-in chamber is provided, configured to provide the required temperature for a device under test (DUT), including a side wall, a guiding plate, an air flow plate, a partition assembly, and a fan. The air flow plate has a ventilation structure, and the guiding plate is located between the side wall and the air flow plate. The partition assembly is disposed on both sides of the air flow plate. The partition assembly and the air flow plate together form an accommodating space for accommodating the DUT. The partition assembly forms a return channel with respect to the other side of the accommodating space with the side wall. When the fan is active, air from the accommodating space passes through the air flow plate and is guided to the return channel via the guiding plate, and air is returned to the accommodating space through the return channel.

A test and measurement device measures an insertion loss of a material under test. The test and measurement device includes a reference device in contact with a first surface of a material under test, the reference device including a reflective component and an absorbing component. A testing device is in contact with a second surface of the material under test, opposite the first surface. The testing device includes a first transmitter to output a first signal at a predetermined frequency to the reflective component of the reference device through the material under test, a first receiver to receive a first reflected signal from the reflective component, a second transmitter output a second signal at the predetermined frequency to the absorbing component of the reference device through the material under test, and a second receiver to receive a second reflected signal from the material under test.

A method for determining a value representative of the remaining useful life, RUL, of a capacitor, the method comprising the following operations:

repeating for several iterations 1 to k, k being an integer greater than 1:

acquiring (304) environment measurements that are representative of the environment of the capacitor at a current iteration;

based on previous environment measurements acquired at previous iterations 1 to k-1 before the current iteration, and on the received environment measurements at iteration k, calculating at least one aging model; based on the at least one calculated aging model, determining the value representative of the RUL of the capacitor

An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.

A contact-type testing device that has a heating plate capable of being heated and in which a desired test is conducted while a test object is in contact with the heating plate, the contact-type testing device including: a heating member that heats the heating plate, wherein the heating member includes: a plurality of strips of heat generation bodies; and a power feeding section that feeds electricity to the heat generation bodies, wherein the heat generation bodies are distributed in a planar manner, and a group or all of the heat generation bodies are parallel-connected, wherein a part or all of the heat generation bodies have a steep temperature/resistance characteristic, and resistance values of the heat generation bodies increase with temperature, and wherein the heating member is disposed to face the heating plate, and a gap is provided between the heating plate and the heating member.

A method of monitoring the condition of a circuit comprises establishing a known baseline signal for a type of circuit (each is somewhat different) and defining these characteristics in terms of the lead and trailing edge angular components (@ zero crossing point), the voltage (amplitude), and the period (time length) of the waveform. Ideally, the angular component of the square wave should be vertical, or at 90 degrees to x-axis. The baseline non-regular square wave that is composed of current, voltage, any harmonic thereof, or the combination of these signals which best indicate predictive measurement attributed to the type of circuit being monitored. Future wave forms indicate the rate of decay based upon the aggregated angular, amplitude, and period components of the zero-crossing points when compared to the baseline signal and/or prior waveform of the observed specific splice. The rate of decay can help determine the life expectancy of the circuit.

A method for determining the remaining service life of a capacitor is disclosed, wherein the capacitor may be formed by an electrolytic capacitor. The method includes the stages of: measuring a voltage change across the capacitor during a discharging time, determining a discharging current during the discharging time, determining an actual capacitance of the capacitor on the basis of the voltage change, the discharging current and the discharging time, determining a corrected capacitance of the capacitor from the actual capacitance based on an error correction, wherein influences of the temperature on the capacitance of the capacitor are corrected during the error correction, and determining the remaining service life on the basis of a difference between the corrected capacitance and an initial capacitance of the capacitor. A system including an assessment device, configured to perform this method, and a circuit having at least one capacitor to be assessed are also disclosed.

A method for selecting components in a radiation tolerant electronic system, comprising, determining ionizing radiation responses of COTS devices under various radiation conditions, selecting a subset of the COTS devices whose radiation responses satisfy threshold radiation levels, applying mathematical models of the COTS devices for post-irradiation conditions to determine radiation responses to ionizing radiation; implementing a radiation-tolerant architecture using COTS devices from the selected subset, the implemented circuit may be tested for robustness to ionizing radiation effects without repeated destructive tests of the hardware circuit by using the mathematical models for simulating response to the ionizing radiation, and implementing a multi-layer shielding to protect the implemented circuit under various radiation conditions.

A water drip testing device includes a frame member, a water tank, a drip member, a first carrying member and a second carrying member. The frame member includes an upper portion, a lower portion, and a frame body between the upper and lower portions. The water tank includes a lower plate provided at the top portion. The drip member is connected to the lower plate and communicates with the water tank. The first carrying member is detachably connected to the frame body, and includes a first carrying surface facing the drip member. The second carrying member is detachably connected to the frame body, and includes a second carrying surface facing the drip member. When the water drip testing device is in a first or second test mode, the first or second carrying member is installed on the frame body.

An indicating circuit for a switching power supply is provided. An LED and a resistor are connected in series, and then are connected in parallel with a capacitor, and the parallel-connected circuit and a diode are connected in series in the same direction, and then are connected in parallel with an inductor to form the indicating circuit. The cathode of the indicating circuit is a terminal 1, and the anode of the indicating circuit is a terminal 2. A charging loop between a rectifying bridge and an electrolytic capacitor for filtering in a fly-back switching power supply is broken to insert the indicating circuit; when the electrolytic capacitor for filtering is normal, an excitation current of a main power stage basically does not appear in the inductor, and the LED does not emit light; when the ESR of the electrolytic capacitor rises greatly, the excitation current of the main power stage appears in the inductor; furthermore, when a switching transistor in the switching power supply is switched off, the excitation current flowing through the inductor may not be changed abruptly, and is freewheeled by the diode; after being filtered by the capacitor, the excitation current drives the LED to emit light; the LED may be a light emitter of a photocoupler to notify a user that: the ESR of the filter capacitor has risen and the switching power supply has a risk of failure, thereby avoiding aggravation of loss; and the indicating circuit has the characteristics of low cost and easiness in implementation.