Patent classifications
G01R31/003
Solar photovoltaic waterless soiling monitoring systems and methods
A system for evaluation of soiling of solar photovoltaic (PV) modules may comprise a first pair of solar PV modules exposed to the elements, a second pair of solar PV modules enclosed within a protective housing having a glass cover; a component coupling the glass cover to the protective housing. The component may be configured to displace the glass cover for a limited period of time to temporarily expose the second pair of solar PV modules to the atmospheric elements.
RELIABILITY TEST FIXTURE FOR FLEXIBLE DISPLAY COMPONENT AND ONLINE RELIABILITY TEST DEVICE FOR FLEXIBLE DISPLAY COMPONENT
Disclosed are a reliability test fixture and an online test device (100) for a flexible display component. The fixture comprises a support (110) and a rotating shaft (120) rotatably mounted on the support. A engagement recess (122) for fixing a flexible display component is provided in an axial direction on the surface of the rotating shaft (120). A test module (130) used to detect an electrical parameter of an internal circuit of the flexible display component is disposed inside the rotating shaft (120). The test module (130) has a test contact (132) for electrically connecting to the flexible display component. During a test, the flexible display component is fixed in the engagement recess (122) and is electrically connected to the test module (130). In this way, each time the rotating shaft (120) bents the flexible display component, the test module (130) can timely detect the electrical parameter of the internal circuit of the bent flexible display component. The reliability test fixture and online device can form an online reliability test device of a flexible display component, so as to test in real time the change of the internal circuit of the flexible display component.
Optoelectronic device with semiconductor heterostructure and stress controlling structure to exert stress onto layers of the heterostructure
An optoelectronic device with at least one stress controlling structure and method of testing the device is disclosed. The optoelectronic device includes a stress controlling structure formed adjacent to a semiconductor heterostructure. The optoelectronic device can further include a stress inducing component that is configured to induce a change in stress within the stress controlling structure. The stress inducing component can induce a number of different stresses during a test of the optoelectronic device. A strain evaluator can evaluate the stresses within the semiconductor heterostructure as a function of a strain generated in the stress controlling structure.
ALLOCATION OF TEST RESOURCES TO PERFORM A TEST OF MEMORY COMPONENTS
A request to perform a test with one or more memory components can be received. Available test resources of a test platform that is associated with memory components can be determined. The desired characteristics of the one or more memory components that are specified by the test can be determined. One or more of the available test resources of the test platform to the test can be assigned based on characteristics of respective memory components associated with the one or more of the available test resources and the desired characteristics of the one or more memory components of the test. Furthermore, the test can be performed with the assigned one or more of the available test resources of the test platform.
BURN-IN RESILIENT INTEGRATED CIRCUIT FOR PROCESSORS
A burn-in resilient integrated circuit is provided. The burn-in resilient integrated circuit includes an inverter chain and a plurality of inverter circuits on the inverter chain. The burn-in resilient integrated circuit also includes a loop providing an electrical connection from an output of the inverter chain to an input of the inverter chain. The loop is selectable in accordance with a burn-in operation.
Heat-resistant device for current detection
A heat-resistant device for current detection may include a heat-resistant substrate including a ceramic material; a group of power wirings embedded in the heat-resistant substrate; and a coil structure. The coil structure may include a coil wiring in which coil units each including or corresponding to one turn of the coil wiring are arranged in a circumferential direction around the group of power wirings. The coil unit may include: a first conductor; a second conductor; a first connection wiring; and a second connection wiring which may be embedded in the heat-resistant substrate. At least the first conductor and the second conductor may not be exposed outside of the heat-resistant substrate. The respective first conductors may be spaced by the substantially same minimum distance from an outer circumferential line surrounding the group of power wirings in a plane orthogonal to the extending direction of the group of power wirings.
Capacitor life diagnosis apparatus and capacitor life diagnosis method
A capacitor life diagnosis apparatus includes ringing detection circuitry that detects ringing of an output voltage of a power source including a capacitor at an output end, and signal generation circuitry that generates a signal indicating a life of the capacitor based on the ringing detected by the ringing detection circuitry.
Dustproof Test Device and Dustproof Test Method
A dustproof test device includes a test box and a dust supply apparatus, where the test box includes a sample cabin, where the dust supply apparatus is connected to the test box through a dust tube, and where the dust supply apparatus is configured to transport dust into the sample cabin under the action of compressed air.
Portable device for soft errors testing
An apparatus including a chamber is provided herein. The chamber includes: a radiation source; a load board slot configured for: (i) holding a load board; and (ii) connecting the load board to an automatic testing equipment. The chamber further includes at least one movable device for positioning the load board slot relative to the radiation source or positioning the radiation source relative to the load board slot; and a controller for receiving instructions and controlling the at least one movable device according to the received instructions. The chamber, including the automatic testing equipment, is configured for constructing and operating soft errors testing by positioning the load board slot, which holds a DUT (Device Under Test), relative to the radiation source or by positioning the radiation source relative to the load board slot, and counting the number of DUT datum errors, which are the soft errors.
Diagnostic system for electric power equipment
An electric power equipment comprises: a display module; a sensor module for outputting measurement data including a first noise signal measured from inside of the electric power equipment, a second noise signal measured from outside of the electric power equipment, a temperature signal of the electric power equipment, and a humidity signal of the electric power equipment; and a control module for diagnosing whether a partial discharge has occurred based on the measurement data, wherein the control module includes: a determination unit for determining whether a signal magnitude of the first noise signal is within a preset first reference range; an analysis unit for diagnosing an occurrence of the partial discharge, and for analyzing the signals according to the analysis algorithm; and a control unit for controlling a result information of the analyzing, and a maintenance and repair information, to be displayed.