The present disclosure provides apparatuses and methods for bulb detection for a lighting control system. The apparatus includes a lighting control module configured to cause a transmission of a quantity of electrical energy to a lighting circuit of a light fixture electrically connected to the lighting control module. The apparatus includes a detector circuit positioned in the lighting control module. The detector circuit is configured to measure a response of the lighting circuit to the transmission of the quantity of electrical energy. The apparatus also includes a controller in electrical communication with the detector circuit. The controller is specially programmed to correlate the quantity of electrical energy transmitted to the lighting circuit to the response of the lighting circuit. The controller is further programmed to determine the bulb type of a bulb electrically coupled to the lighting circuit of the light fixture.

The present disclosure provides apparatuses and methods for bulb detection for a lighting control system. The apparatus includes a lighting control module configured to cause a transmission of a quantity of electrical energy to a lighting circuit of a light fixture electrically connected to the lighting control module. The apparatus includes a detector circuit positioned in the lighting control module. The detector circuit is configured to measure a response of the lighting circuit to the transmission of the quantity of electrical energy. The apparatus also includes a controller in electrical communication with the detector circuit. The controller is specially programmed to correlate the quantity of electrical energy transmitted to the lighting circuit to the response of the lighting circuit. The controller is further programmed to determine the bulb type of a bulb electrically coupled to the lighting circuit of the light fixture.

Disclosed are an apparatus and method for testing a luminaire based on USB. The apparatus for testing a luminaire based on USB includes a power measurement unit for measuring power consumption by measuring power input from a host system to a luminaire based on USB; a message interpretation unit for generating a result of interpretation of a message based on a USB-based control message sent and received between the host system and the luminaire; an illuminance reception unit for receiving a result of measurement of illuminance of the luminaire, measured by a light reception device; and an information generation unit for generating test result information based on a result of the measurement of the power consumption, the result of the interpretation of the message, and the result of the measurement of the illuminance.

Disclosed are an apparatus and method for testing a luminaire based on USB. The apparatus for testing a luminaire based on USB includes a power measurement unit for measuring power consumption by measuring power input from a host system to a luminaire based on USB; a message interpretation unit for generating a result of interpretation of a message based on a USB-based control message sent and received between the host system and the luminaire; an illuminance reception unit for receiving a result of measurement of illuminance of the luminaire, measured by a light reception device; and an information generation unit for generating test result information based on a result of the measurement of the power consumption, the result of the interpretation of the message, and the result of the measurement of the illuminance.

Methods and systems to provide baseline measurements for aging compensation for a display device are disclosed. An example display system has a plurality of active pixels and a reference pixel. Common input signals are provided to the reference pixel and the plurality of active pixels. The outputs of the reference pixel is measured and compared to the output of the active pixels to determine aging effects. The display system may also be tested applying a first known reference current to a current comparator with a second variable reference current and the output of a device under test such as one of the pixels. The variable reference current is adjusted until the second current and the output of the device under test is equivalent of the first current. The resulting current of the device under test is stored in a look up table for a baseline for aging measurements during the display system operation. The display system may also be tested to determine production flaws by determining anomalies such as short circuits in pixel components such as OLEDs and drive transistors.

Methods and systems to provide baseline measurements for aging compensation for a display device are disclosed. An example display system has a plurality of active pixels and a reference pixel. Common input signals are provided to the reference pixel and the plurality of active pixels. The outputs of the reference pixel is measured and compared to the output of the active pixels to determine aging effects. The display system may also be tested applying a first known reference current to a current comparator with a second variable reference current and the output of a device under test such as one of the pixels. The variable reference current is adjusted until the second current and the output of the device under test is equivalent of the first current. The resulting current of the device under test is stored in a look up table for a baseline for aging measurements during the display system operation. The display system may also be tested to determine production flaws by determining anomalies such as short circuits in pixel components such as OLEDs and drive transistors.

The present invention discloses a lighting jig for testing a backlight module, comprising a switch unit and a delay unit; wherein the switch unit is connected to a power supply, and when the switch unit is in closed position, a power output terminal of the lighting jig is electrically connected to a power input terminal of the backlight module, a closing signal is generated at the same time, and the closing signal is output to the delay unit; and the delay unit is connected to the power supply, and outputs a delayed power signal to the power input terminal of the backlight module upon receipt of the closing signal output from the switch unit so as to delay the lighting up of the backlight module.

The present invention discloses a lighting jig for testing a backlight module, comprising a switch unit and a delay unit; wherein the switch unit is connected to a power supply, and when the switch unit is in closed position, a power output terminal of the lighting jig is electrically connected to a power input terminal of the backlight module, a closing signal is generated at the same time, and the closing signal is output to the delay unit; and the delay unit is connected to the power supply, and outputs a delayed power signal to the power input terminal of the backlight module upon receipt of the closing signal output from the switch unit so as to delay the lighting up of the backlight module.

A ballast type detecting circuit includes a ballast signal clamping circuit coupled to a ballast, wherein the ballast signal clamping unit is configured to clamp an output of the ballast, and a ballast type detection circuit configured to compare first and second reference clocks and the clamped output of the ballast to determine a type of the ballast, each of the first and second reference clocks having a frequency lower than an output frequency of a first type ballast and higher than an output frequency of a second type ballast. Thus, the ballast type detecting circuit detects a type of electronic ballast and magnetic ballast based on a digital output signal and decreases a number of outside circuit elements through a ballast type detection based on a digital output signal.

A driver circuit arrangement for driving a transistor bridge, which includes at least a first half-bridge composed of a low-side transistor and a high-side transistor, is described herein. In accordance with one example of the description, the circuit includes a current source and a detection circuit. The current source is operably coupled to the high-side transistor of the first half-bridge and configured to supply a test current to the first half bridge. The detection circuit is configured to compare a voltage sense signal, which represents the voltage across the high-side transistor of the first half-bridge, with at least one first threshold to detect, dependent on the result of this comparison, whether a short-circuit is present in the first half-bridge.