Disclosed herein is a nano-magnetic-particle-imaging apparatus, including a measurement head including excitation and detection coils and accommodating a sample bed for a sample including nano magnetic particles; a gradient magnetic field generation unit for generating a magnetic field having a strength equal to or greater than that of the saturation magnetic field of the nano magnetic particles in a spacing area between identical magnetic poles facing each other and forming a field-free region in a portion thereof; a first driving unit for linearly moving the sample bed; a second driving unit for rotating the gradient magnetic field generation unit in a plane; a third driving unit for linearly reciprocating the gradient magnetic field generation unit; and a control unit for applying a signal to the excitation coil, controlling the driving units, and imaging 3D distribution of the nano magnetic particles based on a detection signal output from the detection coil.

Disclosed herein is a differential probe, a testing device having at least one such differential probe, and a method for producing the same. The differential probe has a first half-probe and a second half-probe, at least one conductor loop pair having a conductor loop of each half-probe being shaped mirror-inverted relative to each other and, in respect of a mirror-inverted arrangement thereof on respective sides of a mirror plane. The conductor loops are oriented parallel to the mirror plane, are arranged offset relative to each other in an offset direction, also parallel to the mirror plane, wherein the conductor loops overlap in part in the direction normal to the mirror plane.

Disclosed herein is a differential probe, a testing device having at least one such differential probe, and a method for producing the same. The differential probe has a first half-probe and a second half-probe, at least one conductor loop pair having a conductor loop of each half-probe being shaped mirror-inverted relative to each other and, in respect of a mirror-inverted arrangement thereof on respective sides of a mirror plane. The conductor loops are oriented parallel to the mirror plane, are arranged offset relative to each other in an offset direction, also parallel to the mirror plane, wherein the conductor loops overlap in part in the direction normal to the mirror plane.

A sensor, comprising: a magnetic field sensing module that is configured to generate a plurality of signals, each signal indicating a magnetic flux density of a different component of a magnetic field that is produced by a magnetic field source; a processing circuitry that is configured to: receive the plurality of signals from the magnetic field sensing module; evaluate a neural network based on the plurality of signals to obtain a plurality of probabilities, each of the plurality of probabilities indicating a likelihood of the magnetic field source being positioned in a different one of a plurality of positional domains; generate an output signal based on the plurality of probabilities, the output signal encoding an identifier of a current positional domain of the magnetic field source.

To reduce a measurement time, an inspection device includes a stage configured to fix a magnetoresistive random access memory (MRAM) to a stage surface and moving the MRAM, a plurality of magnets configured to generate a gradient magnetic, a plurality of line sensors comprising a first line sensor for detecting a magneto-optical effect at a first location of the MRAM and a second line sensor for detecting the magneto-optical effect at a second location that is different from the first location by moving a location of the MRAM within the gradient magnetic field, and an information processor configured to process the magneto-optical effect detected by the plurality of line sensors. Thus, throughput may be improved.

A magnetic material observation method in accordance with the present invention includes: an irradiating step including irradiating a region of a sample with an excitation beam and thereby allowing a magnetic element contained in the sample to radiate a characteristic X-ray; a detecting step including detecting intensities of a right-handed circularly polarized component and a left-handed circularly polarized component contained in the characteristic X-ray; and a calculating step including calculating the difference between the intensity of the right-handed circularly polarized component and the intensity of the left-handed circularly polarized component. Reference to such a difference enables precise measurement of the direction or magnitude of magnetization without strict limitations as to the sample.

A magnetic material observation method in accordance with the present invention includes: an irradiating step including irradiating a region of a sample with an excitation beam and thereby allowing a magnetic element contained in the sample to radiate a characteristic X-ray; a detecting step including detecting intensities of a right-handed circularly polarized component and a left-handed circularly polarized component contained in the characteristic X-ray; and a calculating step including calculating the difference between the intensity of the right-handed circularly polarized component and the intensity of the left-handed circularly polarized component. Reference to such a difference enables precise measurement of the direction or magnitude of magnetization without strict limitations as to the sample.

The present application describes a waveform processor for control of quantum mechanical systems. The waveform processor may be used to control quantum systems used in quantum computation, such as qubits. According to some embodiments, a waveform processor includes a first sequencer configured to sequentially execute master instructions according to a defined order and output digital values in response to the executed master instructions, and a second sequencer coupled to the first sequencer and configured to generate analog waveforms at least in part by transforming digital waveforms according to digital values received from the first sequencer. The analog waveforms are applied to a quantum system. In some embodiments, the waveform processor further includes a waveform analyzer configured to integrate analog waveforms received from a quantum system and output results of said integration to the first sequencer.

A magnetic property measuring system includes a stage configured to hold a sample and a magnetic structure disposed over the stage. The stage includes a body part, a magnetic part adjacent the body part, and a plurality of holes defined in the body part. The magnetic part of the stage and the magnetic structure are configured to apply a magnetic field, which is perpendicular to one surface of the sample, to the sample. The stage is configured to move horizontally in an x-direction and a y-direction which are parallel to the one surface of the sample.

A method for reading a lateral flow assay test strip comprises providing a microwave antenna in proximity of a stain line region of the test strip. The method includes causing a chemical compound to travel to the stain line region, an amount of the chemical compound varying in accordance with a quantity of an analyte. The method comprises connecting an instrumentation to the microwave antenna. The method includes measuring a feed impedance of the microwave antenna using the instrumentation, the feed impedance of the microwave antenna varying with the amount of the chemical compound. The method comprises determining the quantity of the analyte based on the feed impedance of the microwave antenna.