Patent classifications
G02B21/02
INSPECTION SYSTEM INCLUDING REFERENCE SPECIMEN AND METHOD OF FORMING SEMICONDUCTOR DEVICE
An inspection system includes a main support die configured to receive a target specimen; an auxiliary support die adjacent to the main support die and configured to receive a reference specimen; a cleaning device configured to remove contaminants from the reference specimen; an objective lens unit configured to direct light to main support die from a light source adjacent to the objective lens unit; a spectroscope between the objective lens unit and the light source; a detector adjacent to the objective lens unit; an imaging device between the objective lens unit and the detector; and a computer system in communication with the detector.
INSPECTION SYSTEM INCLUDING REFERENCE SPECIMEN AND METHOD OF FORMING SEMICONDUCTOR DEVICE
An inspection system includes a main support die configured to receive a target specimen; an auxiliary support die adjacent to the main support die and configured to receive a reference specimen; a cleaning device configured to remove contaminants from the reference specimen; an objective lens unit configured to direct light to main support die from a light source adjacent to the objective lens unit; a spectroscope between the objective lens unit and the light source; a detector adjacent to the objective lens unit; an imaging device between the objective lens unit and the detector; and a computer system in communication with the detector.
Systems and methods for optogenetic imaging
Provided herein are systems and methods for simultaneous imaging and stimulation using a microscope system. The microscope system can have a relatively small size compared to an average microscope system. The microscope can comprise in part an imaging light source and a stimulation light source. Light from the imaging light source and the stimulation light source can be spectrally separated to reduce cross talk between the stimulation light and the imaging light.
Autofocusing microscope objective
The invention relates to an autofocusable microscope objective having an optical system of a plurality of optical components each formed by a lens or lens group. Here, one of the plurality of optical components is a liquid lens to effect autofocusing of the microscope objective, and the optical system is formed as a stationary system.
SYSTEMS AND METHODS FOR MOTORIZED ADJUSTMENT OF OBJECTIVE LENS CORRECTION COLLAR
A system for selectively adjusting an objective lens correction collar includes a gear ring sized and shaped to fit about a correction collar of an objective lens. The system also includes an adjustment mechanism that has a motor operably connected to a complementary gear configured to selectively engage and cause movement of the gear ring, thereby adjusting the correction collar.
SYSTEM AND METHOD FOR ELECTRONIC CORRECTION OF BORESIGHT ERRORS IN VARIABLE MAGNIFICATION OPTICAL SYSTEMS
A variable magnification optical system with boresight error correction includes a focusing lens to receive light along an optical axis of the variable magnification optical system, with the focusing lens configured to create an image of a target at a focal plane. The system includes a magnification changer disposed along the optical axis, with the magnification changer including an optomechanical drive system to adjust an optical magnification setting of one or more zoom lenses. The system also includes a light source configured to emit a pilot beam into the magnification changer. The system includes a position sensitive photodetector configured to receive the pilot beam exiting the magnification changer. The system further includes a microdisplay optically conjugate to the focal plane, with the microdisplay configured to impose an image of an electronic reticle on the focal plane based on the position of the pilot beam relative to the position sensitive photodetector.
Dark-field microscope apparatus utilizing portable electronic communication device
A mobile phone-based dark field microscope (MDFM) apparatus suitable for quantifying nanoparticle signals is provided. The MDFM apparatus includes an electrically operated light source, a dark-field condenser, a slide housing configured to receive an analytical slide, and an adapter housing configured to receive an objective lens and receive a portable electronic communication device. The slide housing positions the analytical slide between the objective lens and the dark-field condenser. The adapter housing registers the objective lens with a camera lens of the portable electronic communication device. A method for performing a biological quantitative study using the dark-field microscope apparatus is further provided.
Macro-micro telecentric scanning systems and methods
Dual mode imaging systems and methods for macroscopic and microscopic imaging using the same optical imaging system (OIS). The various embodiments enable controllable and/or automated switching between macroscopic imaging and microscopic imaging modes. A dual mode imaging system includes a sample platform movable relative to an OIS between first and second locations, and a light source subsystem configured to generate and project an illumination beam onto a focal plane. When in the first location, the sample platform coincides with the focal plane, and the OIS receives light from the sample platform along a first detection light path. When in the second location, the illumination beam interacts with relay optics and impinges on the sample platform through an objective lens, and the light from the sample platform is directed back through the objective lens and relay optics to the OIS via the first detection path.
Macro-micro telecentric scanning systems and methods
Dual mode imaging systems and methods for macroscopic and microscopic imaging using the same optical imaging system (OIS). The various embodiments enable controllable and/or automated switching between macroscopic imaging and microscopic imaging modes. A dual mode imaging system includes a sample platform movable relative to an OIS between first and second locations, and a light source subsystem configured to generate and project an illumination beam onto a focal plane. When in the first location, the sample platform coincides with the focal plane, and the OIS receives light from the sample platform along a first detection light path. When in the second location, the illumination beam interacts with relay optics and impinges on the sample platform through an objective lens, and the light from the sample platform is directed back through the objective lens and relay optics to the OIS via the first detection path.
Variable focal length lens device and control method of variable focal length lens device
A variable focal length lens device includes: a variable focal length lens whose focal length cyclically changes in accordance with an inputted drive signal; an image detector configured to detect an image of a measurement target through the variable focal length lens; a pulsed light illuminator configured to emit a pulsed light to illuminate the measurement target; and an illumination controller configured to control the pulsed light illuminator so that the pulsed light is emitted twice in one cycle of the drive signal based on two detection phases corresponding to a designated focal distance of the variable focal length lens.