An optical inspection system for detecting sub-micron features on a sample component. The system may have a controller, a camera responsive to the controller for capturing images, an objective lens able to capture submicron scale features on the sample component, and a pulsed light source. The pulsed light source may be used to generate light pulses. The camera may be controlled to acquire images, using the objective lens, only while the pulsed light source is providing light pulses illuminating a portion of the sample component. Relative movement between the sample component and the objective lens is provided to enable at least one of a desired subportion or an entirety of the sample component to be scanned with the camera.

A holographic imaging device and method realizes both a transmission type and a reflection type, and also realizes a long working distance wide field of view or ultra-high resolution. Object light emitted from an object, sequentially illuminated with parallel illumination light whose incident direction is changed, is recorded on a plurality of object light holograms for each incident direction using off-axis spherical wave reference light. The reference light is recorded on a reference light hologram using in-line spherical wave reference light being in-line with the object light. An object light wave hologram and its spatial frequency spectrum at the object position are generated for each incident direction using each hologram. A synthetic spectrum which occupies a wider frequency space is generated by matching each spectrum in the overlapping area, and a synthetic object light wave hologram with increased numerical aperture is obtained thereby.

This relates to systems and methods for measuring a concentration and type of substance in a sample at a sampling interface. The systems can include a light source, optics, one or more modulators, a reference, a detector, and a controller. The systems and methods disclosed can be capable of accounting for drift originating from the light source, one or more optics, and the detector by sharing one or more components between different measurement light paths. Additionally, the systems can be capable of differentiating between different types of drift and eliminating erroneous measurements due to stray light with the placement of one or more modulators between the light source and the sample or reference. Furthermore, the systems can be capable of detecting the substance along various locations and depths within the sample by mapping a detector pixel and a microoptics to the location and depth in the sample.

Disclosed is an optical arrangement providing selective plane illumination, including an inverted illumination objective mounted below a sample support in use providing a line or plane of light at the sample support, and at least one image collection objective mounted above the support, said inverted illumination objective having an illumination objective optic axis, and said image collection objective having an image collection objective optical axis, wherein illumination light is arranged to propagate toward the illumination objective lateral offset to the illumination objective optical axis such that the illumination light leaving the illumination objective propagates toward the sample support at an oblique angle relative to the illumination objective optical axis, and wherein the image objective optical axis has an angle α which is obtuse to the illumination objective optical axis and generally perpendicular to light propagating at the sample support.

A light sheet microscope, such as an oblique plane microscope or a swept confocally-aligned planar excitation (SCAPE) microscope, includes an optical system with a first optical element, a second optical element and a mirror assembly. In a first operational state of the microscope, the optical system is configured to transmit illumination light along a first illumination light path through the first optical element into a first sample volume, and configured to transmit observation light along a first observation light path from the first sample volume to a detector device. In a second operational state of the microscope, the optical system is configured to transmit the illumination light along a second illumination light path via the mirror assembly through the second optical element into a second sample volume, and configured to transmit observation light along a second observation light path from the second sample volume to the detector device.

A light sheet microscope, such as an oblique plane microscope or a swept confocally-aligned planar excitation (SCAPE) microscope, includes an optical system with a first optical element, a second optical element and a mirror assembly. In a first operational state of the microscope, the optical system is configured to transmit illumination light along a first illumination light path through the first optical element into a first sample volume, and configured to transmit observation light along a first observation light path from the first sample volume to a detector device. In a second operational state of the microscope, the optical system is configured to transmit the illumination light along a second illumination light path via the mirror assembly through the second optical element into a second sample volume, and configured to transmit observation light along a second observation light path from the second sample volume to the detector device.

Disclosed herein, inter alia, are methods and systems of image analysis useful for rapidly identifying and/or quantifying features.

Disclosed herein, inter alia, are methods and systems of image analysis useful for rapidly identifying and/or quantifying features.

A miniaturized microscope having a tunable focal length provides for fluorescence measurements at an adjustable focus, providing for autofocus and/or depth adjustment of an image measurement without altering or adjusting a probe implanted in a sample and while providing collimated illumination of an area within the sample. The microscope includes an objective lens having a fixed position with respect to a second connector for receiving light returning from the sample and focusing it on an image sensor within the microscope that generates an image output, a beamsplitter for separating light returning from the sample, and an electrically-tunable lens positioned between the objective lens and the image sensor for adjusting an optical path length from the optical interface to the image sensor. The illumination is focused at or near a back focal plane of the objective lens to the sample, providing collimated or quasi-collimated illumination on or within the sample.

The present application discloses a confocal microscope including a light generator configured to simultaneously generate reflection light, which is reflected from a sample, and transmission light, which passes through the sample; a scanner configured to optically scan the sample and define a direction of a first optical path, along which the reflection light propagates; an adjuster configured to angularly adjust a direction of a second optical path, along which the transmission light propagates; a first signal generator configured to generate a first signal based on the reflection light; a second signal generator configured to generate a second signal based on the transmission light; and an image generator configured to generate a synthetic image in which a reflection image represented by the reflection light and a transmission image represented by the transmission light are synthesized in response to the first and second signals.