Provided are an optical detection method and an optical detection device that quickly and accurately detect a micro target substance, such as an antigen, with high sensitivity by using an enhanced electric field. The optical detection device includes: one or more light irradiation units; a detection plate which has a laminate structure formed by stacking a light transmissive substrate, a metal layer or a semiconductor layer, and a light transmissive dielectric layer in this order from a back surface toward a front surface; a prism which is optically closely contacted to a back surface side of the detection plate and has a plurality of light incident surfaces, at least two of the light incident surfaces being different in incident surface angles, which are the angles formed between the light incident surfaces and the front surface of the detection plate; a sample holding unit; and a light detection unit which is placed on the front surface side of the detection plate and which detects an optical signal from a detection area of the sample, wherein the optical detection device is placed such that light from the light irradiation unit enters the plurality of light incident surfaces of the prism at one angle fixed with respect to the front surface of the detection plate, and the light passing through the prism is irradiated from the back surface side of the detection plate under a condition that satisfies a total reflection condition in the detection plate, and the light detection unit detects the optical signal.

The total internal reflection microscope has an illumination optical system that relays light from a light source with a relay optical system, forms an image of the light source on the incident pupil plane of the objective lens and irradiates a sample with the illumination light via an objective lens, has an angle adjustment mirror for changing the position of the image of the light source in a direction orthogonal to the optical axis, an optical detector for detecting the intensity of the returning illumination light reflected by the sample and collected by the objective lens, and a controller for determining the operation amount of the angle adjustment mirror, wherein the controller determines the operation amount of the angle adjustment mirror so that the illumination light is totally reflected at the sample based on the change in intensity of the returning light when the angle adjustment mirror is changed.

The total internal reflection microscope has an illumination optical system that relays light from a light source with a relay optical system, forms an image of the light source on the incident pupil plane of the objective lens and irradiates a sample with the illumination light via an objective lens, has an angle adjustment mirror for changing the position of the image of the light source in a direction orthogonal to the optical axis, an optical detector for detecting the intensity of the returning illumination light reflected by the sample and collected by the objective lens, and a controller for determining the operation amount of the angle adjustment mirror, wherein the controller determines the operation amount of the angle adjustment mirror so that the illumination light is totally reflected at the sample based on the change in intensity of the returning light when the angle adjustment mirror is changed.

A spectroscopic microscope device, including at least one array of metasurfaces, and at least one CCD array integrated with the array of metasurfaces. The metasurfaces in the array are configured to separately direct LCP an RCP components of light incident on the metasurface to separate pixels in the CCD array.

An analysis device for quantifying a state of a fluorescent image containing a plurality of bright spots comprises an area setting unit in which states of a plurality of bright spots contained in a plurality of areas set in the fluorescent image in accordance with positions of the plurality of bright spots are quantified as numerical values.

An analysis device for quantifying a state of a fluorescent image containing a plurality of bright spots comprises an area setting unit in which states of a plurality of bright spots contained in a plurality of areas set in the fluorescent image in accordance with positions of the plurality of bright spots are quantified as numerical values.

A method for microscopic examination of a specimen includes bringing the specimen into contact with an optically transparent medium that has a higher refractive index than the specimen. An illumination light bundle is generated and directed through an illumination objective that focuses the illumination light bundle. The illumination light bundle that has passed through the illumination objective in the direction of the specimen that is to be examined is deflected using a deflector arranged on a detection objective in such a way that the illumination light bundle strikes a boundary surface between the optically transparent medium and the specimen, where the illumination light bundle is totally reflected for purposes of evanescently illuminating the specimen. Fluorescent light that is emitted by the specimen and that passes through the detection objective is detected.

A method for microscopic examination of a specimen includes bringing the specimen into contact with an optically transparent medium that has a higher refractive index than the specimen. An illumination light bundle is generated and directed through an illumination objective that focuses the illumination light bundle. The illumination light bundle that has passed through the illumination objective in the direction of the specimen that is to be examined is deflected using a deflector arranged on a detection objective in such a way that the illumination light bundle strikes a boundary surface between the optically transparent medium and the specimen, where the illumination light bundle is totally reflected for purposes of evanescently illuminating the specimen. Fluorescent light that is emitted by the specimen and that passes through the detection objective is detected.

At least one embodiment relates to an apparatus for super-resolution fluorescence-microscopy imaging of a sample. The apparatus includes an objective lens having a forward field of view, the objective lens being configured to collect light. The apparatus may also include a processing arrangement configured to perform super-resolution fluorescence-microscopy imaging of the sample with the collected light. Further, the apparatus includes a waveguide component located forward of the objective lens and configured to (i) receive light from outside the forward field of view, and (ii) use total internal reflection within the waveguide component to direct excitation light. In addition, the apparatus includes an electronic optical-path control system configured to cause input light of a first wavelength to follow a first optical path corresponding to a first optical mode and also configured to cause input light of the first wavelength to follow a second optical path corresponding to a second optical mode.

An analysis device for quantifying a state of a fluorescent image containing a plurality of bright spots comprises an area setting unit in which states of a plurality of bright spots contained in a plurality of areas set in the fluorescent image in accordance with positions of the plurality of bright spots are quantified as numerical values.