An inspection jig for a display device includes a jig body, the jig body includes a limit groove configured to limit the position of the display device to be inspected, and the jig body is provided with a soldering point testing portion, the soldering potin testing portion is provided with a plurality of testing terminal pairs; each of the testing terminal pairs comprises two testing terminals; in every two adjacent testing terminal pairs, one testing terminal of one testing terminal pair and one testing terminal of the other testing terminal pair are serially connected with an indicator lamp therebetween; along a serial connection direction of the testing terminals, a testing terminal located at two ends are electrically connected with a positive pole and a negative pole of a power source.

The present disclosure relates to a device and a system for testing flatness. The device for testing flatness includes a base, a testing platform, and a ranging sensor. The testing platform is assembled on the base. The testing platform includes a supporting structure. The supporting structure is disposed on the side of the testing platform away from the base and is used to support a to-be-tested board. The structure matches the structure of the to-be-tested board. The ranging sensor is disposed on the side of the testing platform away from the base. After the to-be-tested board is placed on the testing platform, the ranging sensor is used to test distances between a number N of to-be-tested positions on the to-be-tested board and the ranging sensor, to obtain N pieces of distance information, and the N pieces of distance information are used to determine the flatness of the to-be-tested board, where N is an integer greater than 2. According to the embodiments of the present disclosure, the flatness of the glass substrate can be tested to improve the manufacturing process to reduce the flatness of the glass substrate, and avoid the problem that the glass substrate is easily broken when entering the subsequent process equipment and the process equipment is down.

A method includes illuminating a photonic integrated circuit (PIC) of a transmit aperture of a laser communication terminal and a PIC of a receive aperture of the laser communication terminal with multi-wavelength light, where each PIC includes multiple antenna elements forming an optical phased array (OPA). The method also includes determining light intensities of different wavelengths of the multi-wavelength light after the multi-wavelength light has passed through each PIC. The method further includes estimating phases of light associated with the antenna elements based on variations in the light intensities. In addition, the method includes adjusting one or more phase shifters of at least one of the PICs based on the estimated phases of light.

A nested Mach-Zehnder device may comprise a parent pre-stage interferometer, a parent interferometer coupled to the parent pre-stage interferometer, a first child pre-stage interferometer, a first child interferometer coupled to the first child pre-stage interferometer, a second child pre-stage interferometer, a second child interferometer coupled to the second child pre-stage interferometer, wherein a phase of each interferometer is electrically adjustable. The nested Mach-Zehnder device may comprise one or more components to: determine a performance parameter associated with a constellation diagram generated by the nested Mach-Zehnder device; determine that the performance parameter does not satisfy a threshold, and cause a phase of at least one pre-stage interferometer, of the parent pre-stage interferometer, the first child pre-stage interferometer, or the second child pre-stage interferometer, to be electrically adjusted to cause the performance parameter to satisfy the threshold.

An electronic device including a substrate, an electronic unit, a data line, a control unit, a test pad and a test switch element is provided by the present disclosure. The substrate includes a first surface and a second surface opposite to the first surface, wherein the first surface includes an active area. The electronic unit is disposed on the substrate and located in the active area. The data line is disposed on the substrate. The control unit is disposed on the substrate and located in the active area, and the control unit is electrically connected between the electronic unit and the data line. The test pad is disposed on the second surface of the substrate. The test switch element is disposed on the substrate and located in the active area, and the test switch element is electrically connected between the data line and the test pad.

A display panel, a crack detection method and a display device are provided. The display panel includes a substrate, a signal wiring disposed over the substrate, and a test wiring insulated from the signal wiring and disposed on a side of the signal wiring facing away from the substrate. An orthographic projection of the test wiring on the substrate overlaps an orthographic projection of the signal wiring on the substrate. The display panel also includes a first test terminal disposed over the substrate and electrically connected with an end of the test wiring, and a second test terminal disposed over the substrate and electrically connected with another end of the test wiring.

A windowing device includes: a windowing module including a dimming transparent substrate and a semiconductor temperature adjustment element, the dimming transparent substrate being provided with different light transmittances when the dimming transparent substrate has different adjustment parameters; a temperature adjustment circuitry configured to input a current to the semiconductor temperature adjustment element and adjust a temperature of the semiconductor temperature adjustment element; a temperature sensor configured to detect a temperature of an environment where the windowing module is located; and a controller configured to input a circuitry adjustment signal to the temperature adjustment circuitry when the temperature detected by the temperature sensor is beyond a predetermined temperature range, as to adjust a temperature of the dimming transparent substrate to be within the predetermined temperature range.

An exemplary embodiment provides a display device including: a display part configured to include a display part color filter; and a peripheral part disposed at the upper side of the display part and including an inspection pattern for checking an alignment of the display part color filter. The inspection pattern may include a plurality of color filters having colors and reference patterns disposed at at least one side of the plurality of color filters. A number of the plurality of color filters of each color corresponds to a number of shots of a division exposure process. Adjacent color filters among the plurality of color filters may be disposed at different heights.

A display device includes signal lines, first driver terminals that are provided in a first peripheral region and to which a first driver IC can be coupled, second driver terminals to which a second driver IC can be coupled, a plurality of inspection terminals provided in the first peripheral region, first inspection switches coupled to the first driver terminals and configured to be capable of switching coupling and interruption of the inspection terminals and the signal lines, and second inspection switches coupled to the second driver terminals and configured to be capable of switching coupling and interruption of the inspection terminals and the signal lines.

The invention is related to a method and arrangement for calibrating the camera of an eye tracking device and compensate for a potential angular offset of the camera. The method comprises: the steps of capturing an eye image of a user, wherein the eye image contains a plurality of glints created by a plurality of illuminators in the eye tracking system; detecting glints in the eye image; projecting illuminator positions onto the eye image to determine expected glint positions; determining an angular offset between expected glint positions and detected glint positions for corresponding pairs of expected and detected glint positions; determining the angular correction for the eye tracking camera using the determined angular offset angle; and applying the angular correction for the eye tracking camera to an eye tracker camera model.