Disclosed are a rolling test device and a rolling test method. The rolling test device includes a test platform having a rolling surface for placing a test piece to be rolled; a rolling jig located on one side of the rolling surface; and a driving member connected to the rolling jig. A roller is connected to one end of the rolling jig towards the rolling surface, and after the roller is pressed against the rolling surface, the driving member drives the rolling jig to move on the rolling surface to drive the roller to perform a rolling test on the rolling surface.

A windowing device includes: a windowing module including a dimming transparent substrate and a semiconductor temperature adjustment element, the dimming transparent substrate being provided with different light transmittances when the dimming transparent substrate has different adjustment parameters; a temperature adjustment circuitry configured to input a current to the semiconductor temperature adjustment element and adjust a temperature of the semiconductor temperature adjustment element; a temperature sensor configured to detect a temperature of an environment where the windowing module is located; and a controller configured to input a circuitry adjustment signal to the temperature adjustment circuitry when the temperature detected by the temperature sensor is beyond a predetermined temperature range, as to adjust a temperature of the dimming transparent substrate to be within the predetermined temperature range.

The embodiments herein relate to methods for controlling an optical transition and the ending tint state of an optically switchable device, and optically switchable devices configured to perform such methods. In various embodiments, non-optical (e.g., electrical) feedback is used to help control an optical transition. The feedback may be used for a number of different purposes. In many implementations, the feedback is used to control an ongoing optical transition. In some embodiments a transfer function is used calibrate optical drive parameters to control the tinting state of optically switching devices.

A display panel inspection jig includes a stage comprising a seating area in which a display panel is to be disposed for inspection thereof, and a peripheral area surrounding the seating area, and comprising an uneven upper surface and a lower surface, the seating area of the stage being provided with an opening, a first supporter disposed on a first portion of the uneven upper surface of the stage, and a first barrier disposed on a second portion of the uneven upper surface of the stage. The first portion of the uneven upper surface being at the seating area and spaced apart from the opening, and the second portion of the uneven upper surface is at the peripheral area. The first barrier has an uneven lower surface such that the uneven lower surface of the first barrier and the uneven upper surface of the stage are fitted with each other.

An electro-optical device includes an electro-optical panel that includes a first strain sensor element including a first resistance member and a second strain sensor element including a second resistance member that are provided in a pixel area, and a first wiring electrically coupling the first strain sensor element and the second strain sensor element, a first variable resistance member, a second variable resistance member, and a second wiring electrically coupling the first variable resistance member and the second variable resistance member.

A display panel, a crack detection method and a display device are provided. The display panel includes a substrate, a signal wiring disposed over the substrate, and a test wiring insulated from the signal wiring and disposed on a side of the signal wiring facing away from the substrate. An orthographic projection of the test wiring on the substrate overlaps an orthographic projection of the signal wiring on the substrate. The display panel also includes a first test terminal disposed over the substrate and electrically connected with an end of the test wiring, and a second test terminal disposed over the substrate and electrically connected with another end of the test wiring.

Various embodiments of a micro-disc modulator as well as a silicon photonic device and an optoelectronic communication apparatus using the micro-disc modulator are described. In one aspect, a device includes a SOI substrate and a silicon photonic structure formed on a primary surface of the SOI substrate. The semiconductor substrate includes a silicon waveguide and a micro-disc modulator. The micro-disc modulator is adjacent to the silicon waveguide and has a top surface substantially parallel to the primary surface of the SOI substrate. The top surface of the micro-disc modulator includes one or more discontinuities therein. The micro-disc modulator may be a multi junction micro-disc modulator having two vertical p-n junctions with a single resonance frequency to achieve high-speed modulation and low-power consumption.

The present application discloses a testing device of array substrates and a testing method. The testing device of array substrates includes: a machine and testing interfaces, the testing interfaces being disposed on the machine; and testers disposed above the machine. There are at least two sets of testers, and the testers synchronously operate according to a preset scheme.

A light emission control method is adapted to a direct-lit LED backlight display. The display includes a backlight module, a driving circuit, a detection circuit, and a control circuit. The backlight module includes a first light emission group and a second light emission group. The first light emission group includes a plurality of first LEDs, and the second light emission group includes a plurality of second LEDs. The first LEDs and the second LEDs are in an interleaved arrangement. The driving circuit is activated to selectively drive the first light emission group and the second light emission group to emit light. On detection of an abnormal light-emission status of any of the plurality of LEDs, the detection circuit sends an abnormal signal. The control circuit obtains a shut-down group according to the abnormal signal and actives the driving circuit not to drive the shut-down group to emit light.

A front plane laminate useful in the manufacture of electro-optic displays comprises, in order, a light-transmissive electrically-conductive layer, a layer of an electro-optic medium in electrical contact with the electrically-conductive layer, an adhesive layer and a release sheet. This front plane laminate can be prepared as a continuous web, cut to size, the release sheet removed and the laminate laminated to a backplane to form a display. Methods for providing conductive vias through the electro-optic medium and for testing the front plane laminate are also described.