The present disclosure relates to a surveying instrument including a chassis, an optical system having an optical axis, a stage attached to the chassis and an optical component. The optical system may be adapted to receive and/or transmit light. The optical component is located at, or in proximity to, the optical axis. The received and/or transmitted light passes through the optical component. The stage includes an actuating member arranged to act on the optical component for movement thereof. The actuating member may be responsive to temperature so as to induce a displacement of the optical component relative to the chassis along the optical axis in response to a temperature change.

A display device includes a substrate, a plurality of pixel columns, and a lighting test circuit unit. The lighting test circuit unit is disposed in a non-display area on the substrate, includes a plurality of lighting test transistors, and provides a lighting test voltage to the pixel columns. Each of the lighting test transistors includes an active pattern including a source area, a drain area, and a channel area, a gate electrode disposed in the channel area, an interlayer insulating layer including a first contact hole spaced apart from a first side of the gate electrode by about 7 um or more, and a source electrode contacting the source area of the active pattern through the first contact hole.

Reversible phase-change materials (PCMs) can be added to or incorporated into meta-lenses, wave plates, waveguides, gratings, and other optical components to form active optical devices with controllable and adjustable optical characteristics. Local heating can be used to induce solid-state phase changes and large refractive index changes in the PCMs. The phase and index changes can provide large changes in the device's optical characteristics. Optical devices with PCM can be used for imaging applications, orbital angular momentum control, photonic integrated circuits and optical communication systems, beam steering, and other application.

The present application discloses a testing device of array substrates and a testing method. The testing device of array substrates includes: a machine and testing interfaces, the testing interfaces being disposed on the machine; and testers disposed above the machine. There are at least two sets of testers, and the testers synchronously operate according to a preset scheme.

A display device includes a first base substrate, a second base substrate disposed on the first base substrate, a connecting member disposed between the first base substrate and the second base substrate, a pad disposed on the first base substrate, and a first protruding pattern disposed between the connecting member and the pad. A thickness of the first protruding pattern is smaller than a thickness of the connecting member.

A display panel according to one embodiment comprises: a display substrate that includes a display area and a pad area disposed around the display area, at least one pad terminal disposed on the substrate of the pad area, and an open portion which is at least partially and planarly surrounded by the pad terminal.

A method of manufacturing a display panel comprises: a first substrate is manufactured, a plurality of scanning lines and shorting bars are formed on the first base substrate, the scanning lines are located in the first display area and extend to the first peripheral wiring area, and the shorting bars are located in the first cutting area, wherein a shorting bar is connected to a plurality of odd-numbered scanning lines, or a shorting bar is connected to a plurality of even-numbered scanning lines, to make the odd-numbered scanning lines each in short-circuit with at least another odd-numbered scanning line, or a shorting bar is connected to the even-numbered scanning lines, to make the even-numbered scanning lines each in short-circuit with at least another even-numbered scanning line.

A method and a system of measuring a display panel, and a display panel. The display panel includes a backlight module and a liquid crystal panel. The method of measuring the display panel includes determining a target position on a display panel that meets a preset condition, wherein the target position includes a first target position and a second target position, and a connecting line of the first target position and the second target position is parallel to a row of sub-pixels. The method further includes measuring brightness information at the target position under a constant applied voltage, wherein the brightness information includes brightness information of the backlight module and brightness information of the display panel, and a display efficiency of the display panel is calculated according to the brightness information.

There is provided a laser processing device that includes a laser light source configured to output laser light, a spatial light modulator configured to modulate the laser light output from the laser light source according to a phase pattern and emit the modulated laser light, an objective lens configured to converge the laser light emitted from the spatial light modulator onto an object, a controller configured to control a phase pattern to be displayed on the spatial light modulator, and a determiner configured to determine whether operation of the spatial light modulator is normal, in which the controller performs switching control in which the phase pattern to be displayed on the spatial light modulator is switched, and the determiner makes the determination on the basis of a change in intensity of the laser light emitted from the spatial light modulator between before the switching control and after the switching control.

An electro-optical device includes an electro-optical panel that includes a first strain sensor element including a first resistance member and a second strain sensor element including a second resistance member that are provided in a pixel area, and a first wiring electrically coupling the first strain sensor element and the second strain sensor element, a first variable resistance member, a second variable resistance member, and a second wiring electrically coupling the first variable resistance member and the second variable resistance member.