A frequency measurement circuit includes a first counter that counts a pulse number of a reference clock signal and generates first count data, a second counter that counts a pulse number of a measurement target clock signal and generates second count data, a time-to-digital conversion circuit that generates first time difference data indicating a time difference between a first timing at which the first counter starts counting of the pulse number and a second timing at which the second counter starts counting of the pulse number, and second time difference data indicating a time difference between a third timing at which the first counter ends counting of the pulse number and a fourth timing at which the second counter ends counting of the pulse number, and a calculation circuit that performs calculation based on the second count data, the first time difference data, and the second time difference data and generates frequency data indicating a frequency of the measurement target clock signal.

A digital-to-time converter (DTC) converts a digital code into a time delay using a capacitor digital-to-analog converter (CDAC) that functions as a charging capacitor. The DTC includes a switched capacitor voltage-to-current converter for the formation of a charging current (or a discharging current) for charging (or for discharging) the charging capacitor responsive to a triggering clock edge that begins the time delay. A comparator compares a voltage on the charging capacitor to a threshold voltage to determine an end of the time delay.

There is provided a time measuring device including: a first counter unit (204) that acquires a difference time between a first measured signal and a second measured signal as a first measurement result by counting on the basis of a reference clock signal; a delay signal generation unit (208) that generates a delay signal by delaying the first measured signal on the basis of the first measurement result fed back from the first counter unit; a measurement unit (210) that measures a difference time between the delay signal and the second measured signal as a second measurement result; and an operation unit (212) that performs an operation by using the first measurement result and the second measurement result.

A time-to-digital converter (TDC) provided according to an aspect of the present disclosure identifies existence of jitter in either one of two periodic signals received as inputs. In an embodiment, jitter is detected by examining a first sequence of counts and a second sequence of counts respectively for a first periodic signal and a second periodic signal received as input signals, with the first sequence of counts representing respective time instances on a time scale at which a first sequence of edges with a first direction of the first periodic signal occur, and the second sequence of counts representing respective time instances on the time scale at which a second sequence of edges with the first direction of the second periodic signal occur.

Various embodiments of the present technology may provide methods and apparatus for repetitive histogramming. The apparatus may provide a limited number of physical bins to perform multiple histograms on a total number of virtual bins. The apparatus may provide a single physical bin that is used to sweep over the total number of virtual bins.

A sensing device that is configured to determine a depth result based on time-of-flight value is introduced. The sensing device includes a delay locked loop circuit, a plurality of time-to-digital converters, a multiplexer and a digital integrator. The delay locked loop circuit is configured to output a plurality of delay clock signals through output terminals of the delay locked loop circuit. The plurality of time-to-digital converters include a plurality of latches. The multiplexer is configured to select a sub-group of m latches among the latches of the plurality of time-to-digital converters to be connected to the output terminals of the delay locked loop circuit according to a control signal. The digital integrator is coupled to the plurality of time-to-digital converters and is configured to integrate digital outputs generated by the time-to-digital converters in each of n cycles to generate n raw data frames, wherein m and n are natural numbers, and the n raw data frames are used to generate the depth result.

A power supply circuit module for a TDC (Time to Digital Converter) includes a first input for receiving a control signal, a second input for receiving a power supply voltage, and an output configured to be connected to the power supply input of the TDC. An active main power supply device is configured to receive the control signal at the input and to contribute on the value of the power supply voltage resulting at an output by a voltage value lower than a first predefined percentage with respect to the nominal power supply voltage. A number N of active secondary power supply devices each are configured to contribute on the value of the power supply voltage resulting at the output by a percentage different from the remaining active secondary power supply devices.

A digital phase-locked loop (PLL) includes a time-to-digital converter (TDC) and a digitally controlled oscillator (DCO). The DCO generates a PLL clock signal and various sampling clock signals that are mesochronous. The TDC samples a phase difference between a reference clock signal and a frequency-divided version of the PLL clock signal based on the sampling clock signals and various enable signals. The enable signals are generated based on a calibration of the digital PLL. Each enable signal is associated with a sampling clock signal and indicates whether the associated sampling clock signal is to be utilized for sampling the phase difference. Further, the TDC generates control data indicative of the sampled phase difference. The DCO generates the PLL clock signal and the sampling clock signals based on the control data until the digital PLL is in a phase-locked state.

In described examples, an electronic circuit for determining a phase difference between a first clock signal and a second clock signal includes a timer circuit, circuitry for generating a selectively delayed transition of the second clock signal, and phase determination circuitry. The timer circuit produces an elapsed time between a transition of the first clock signal and the selectively delayed transition of the second clock signal. The circuitry for generating the selectively delayed transition of the second clock signal generates the selectively delayed transition in response to a random selection of a respective output from a plurality of second clock signal delay stages. The phase determination circuitry provides the phase difference in response to the elapsed time and the random selection of a respective output from a plurality of second clock signal delay stages.

A noise-shaping enhanced (NSE) gated ring oscillator (GRO)-based ADC includes a delay which delays and feedbacks an error signal to an input of the NSE GRO-based ADC. The feedback error signal provides an order of noise-shaping and the error signal is generated at the input of the NSE GRO-based ADC from an input signal, the feedback error signal, and a front-end output. A voltage-to-time converter converts the error signal to the time domain. A GRO outputs phase signals from the time domain error signal by oscillating when the error signal is high and inhibiting oscillation otherwise. A quantization device quantizes the phase signals to generate the front-end output. A quantization extraction device determines a quantization error from the quantized phase signals. A time-to-digital converter digitizes the quantization error to generate a back-end output. An output device generates a second order noise-shaped output based on the front-end and the back-end outputs.