A memory test method, a memory test apparatus, a device and a storage medium are provided. The memory test method includes: obtaining a central processing unit (CPU) accessible space of a memory to-be-tested; obtaining a graphics processing unit (GPU) accessible space of the memory to-be-tested; and driving a CPU to run a test program based on the accessible space of the CPU, to access the memory to-be-tested through a bus of memory to-be-tested, when the CPU runs the test program, the CPU controls a GPU to access the memory to-be-tested based on the accessible space of the GPU through the bus of memory to-be-tested.

A memory test method, a memory test apparatus, a device and a storage medium are provided. The memory test method includes: obtaining a central processing unit (CPU) accessible space of a memory to-be-tested; obtaining a graphics processing unit (GPU) accessible space of the memory to-be-tested; and driving a CPU to run a test program based on the accessible space of the CPU, to access the memory to-be-tested through a bus of memory to-be-tested, when the CPU runs the test program, the CPU controls a GPU to access the memory to-be-tested based on the accessible space of the GPU through the bus of memory to-be-tested.

Systems and methods for configuration file editing during the execution of the configuration process can include initiating a configuration process using a configuration file referencing a sequence of tasks and receiving a command to edit the configuration file. They can also include, responsive to the receipt of the command, pausing the configuration process and modifying one or more tasks in the sequence of tasks to generate a modified configuration file. They can further include resuming the configuration process using the modified configuration file from a point at which the execution was paused.

A combined data processing unit (DPU) and server solution with DPU operating system (OS) integration is described. A DPU OS is executed on a DPU or other computing device, where the DPU OS exercises secure calls provided by a DPU's trusted firmware component, that may be invoked by DPU OS components to abstract DPU vendor-specific and server vendor-specific integration details. An invocation of one of the secure calls made on the DPU to communicate with its associated server computing device is identified. In an instance in which the one of the secure calls is invoked, the secure call invoked is translated into a call or request specific to an architecture of the server computing device and the call is performed, which may include sending a signal to the server computing device in a format interpretable by the server computing device.

According to one embodiment, a memory device includes a first nonvolatile memory die, a second nonvolatile memory die, a controller, and a first temperature sensor and a second temperature sensor incorporated respectively in the first nonvolatile memory die and the second nonvolatile memory die. The controller reads temperatures measured by the first and second temperature sensors, from the first and second nonvolatile memory dies. When at least one of the temperatures read from the first and second nonvolatile memory dies is equal to or higher than a threshold temperature, the controller reduces a frequency of issue of commands to the first and second nonvolatile memory dies or a seed of access to the first and second nonvolatile memory dies.

A method comprises a system comprising a host device coupled to a first remote device actively operating according to a state diagram that the host device and all remote devices follow during operation of the system. The method further comprises powering up a second remote device while the host device and first remote device are actively operating according to the state diagram. The second remote device waits for a synchronization point sequence. Upon detecting the synchronization point sequence, the second remote device implements a predetermined feature set and synchronizes itself to the state diagram at a common point as the host device and first remote device.

Methods and apparatus for automatic qubit calibration. In one aspect, a method includes obtaining a plurality of qubit parameters and data describing dependencies of the plurality of qubit parameters on one or more other qubit parameters; identifying a qubit parameter; selecting a set of qubit parameters that includes the identified qubit parameter and one or more dependent qubit parameters; processing one or more parameters in the set of qubit parameters in sequence according to the data describing dependencies, comprising, for a parameter in the set of qubit parameters: performing a calibration test on the parameter; and performing a first calibration experiment or a diagnostic calibration algorithm on the parameter when the calibration test fails.

Estimating Remaining Useful Life (RUL) from multi-sensor time series data is difficult through manual inspection. Current machine learning and data analytics methods, for RUL estimation require large number of failed instances for training, which are rarely available in practice, and these methods cannot use information from currently operational censored instances since their failure time is unknown. Embodiments of the present disclosure provide systems and methods for estimating RUL using time series data by implementing an LSTM-RNN based ordinal regression technique, wherein during training RUL value of failed instance(s) is encoded into a vector which is given as a target to the model. Unlike a failed instance, the exact RUL for a censored instance is unknown. For using the censored instances, target vectors are generated and the objective function is modified for training wherein the trained LSTM-RNN based ordinal regression is applied on an input test time series for RUL estimation.

A vehicle includes a data communication network, a serial data bus, and a plurality of electronic nodes in signal communication with the serial data bus. The vehicle further includes a node identification system configured to store a several different diagnostic tests, along with expected operating data corresponding to a given diagnostic test. The node identification system sorts the plurality of nodes into individual node groups in response to performing one or more diagnostic tests among the different available diagnostic tests.

A test apparatus for testing a mobile AP provided with an AP package and a memory package according to the disclosure is configured to include: a lower test socket mounted on a tester and connected to the AP package put on an upper side thereof; an upper test socket mounted with the memory package and connected to the AP package put on a lower side thereof; an upper mechanism configured to accommodate the memory package and mounted with the upper test socket; and a heat dissipation device disposed on the upper mechanism. Since heat generated in the AP package can be dissipated through forming of a frame of the upper test socket as an inelastic conductive housing of a metal material having high thermal conductivity, a test can be performed in a step before stacking the AP package and the memory package on each other.