Systems and methods are disclosed for generation and testing of integrated circuit designs with point-to-point connections between modules. These may allow for the rapid design and testing (e.g. silicon testing) of processors and SoCs. For example, type parameterization may be used to generate point-to-point connections in a flexible manner. For example, a point-to-point connection between the source module and the sink module that includes one or more named wires specified by bundle type may be automatically generated based on using the bundle type as a type parameterization input. For example, these system and methods may be used to rapidly connect a custom processor design, including one or more IP cores, to a standard input/output shell for a SoC design to facilitate rapid silicon testing of the custom processor design.

Systems and methods for modeling a bus for a system design are provided. In an embodiment, the method operates by accepting a virtual bus model, wherein the model simulates behavior for a bus master and slave device, such that the model accurately simulates the timing and behavior of the transfer of data from master to slave, and, from slave to master devices. The method routes a transaction issued by the master device to the slave device. The transaction has storage for transaction data, or a pointer to transaction data, to be transferred through the transaction. The transaction data is transferred in one or more data payloads and the sender of data sets the length of data payloads to be returned. The data payloads are sent from the sender of data to the receiver of data and may contain one or more bus data beats. This method accurately models the bus timing and behavior of the delivery of one or more data beats as one data payload.

During functional/normal operation of an integrated circuit including multiple independent processing elements, a selected independent processing element is taken offline and the functionality of the selected independent processing element is then tested while the remaining independent processing elements continue functional operation. To minimize voltage drops resulting from current fluctuations produced by the testing of the processing element, clocks used to synchronize operations within each partition of a processing element are staggered. This varies the toggle rate within each partition of the processing element during the testing of the processing core, thereby reducing the resulting voltage drop. This may also improve test quality within an automated test equipment (ATE) environment.

Systems and methods are disclosed for generation and testing of integrated circuit designs with point-to-point connections between modules. These may allow for the rapid design and testing (e.g. silicon testing) of processors and SoCs. For example, type parameterization may be used to generate point-to-point connections in a flexible manner. For example, a point-to-point connection between the source module and the sink module that includes one or more named wires specified by bundle type may be automatically generated based on using the bundle type as a type parameterization input. For example, these system and methods may be used to rapidly connect a custom processor design, including one or more IP cores, to a standard input/output shell for a SoC design to facilitate rapid silicon testing of the custom processor design.

Described herein are a processor and a method of operating the processor to simulate a many-core target machine. The processor includes a plurality of processing cores arranged in a predetermined manner and a global target clock counter (GTCC) configured to count a number of simulated clock cycles in the target machine. A global stall controller (GSC) configured to halt execution of all the processing cores based on a determination of at least one processing core being in a fault condition; and wherein the processor acquires a base clock per instruction (CPI) of a target machine, the CPI corresponding to an average number of clock cycles required by the target machine to execute a single instruction, translates an application of the target machine to a compact executable trace to be executed by the processor, and adjusts a speed of simulation by adjusting an update rate of the global target clock counter.

An integrated circuit can include programmable circuitry configured to implement an overlay circuit specified by an overlay and a processor coupled to the programmable circuitry. The processor can be configured to control the programmable circuitry through execution of a framework. The framework provides high-productivity language control of implementation of the overlay in the programmable circuitry.

Various embodiments may include integrated circuits (ICs) and methods for designing an integrated circuit (IC), such as a system-on-chip (SOC). Embodiments include methods for planning and producing ICs without communication channels, also referred to as channel-less ICs. Embodiments may include overlay hard macros that support routing and communication design without dedicated communication channels being needed between functional hard macros, such as cores of a SOC. Various embodiments may include an IC in which one or more interconnect hard macros and wires connecting a first functional hard macro, a second functional hard macro and the one or more interconnect hard macros are located within a third functional hard macro. In some embodiments, no communication channel may be present between the first functional hard macro, the second functional hard macro, and the third functional hard macro.

A system, a method, and a machine-readable medium for overclocking a computer system is provided. An example of a method for overclocking a computer system includes predicting a stable operating frequency for a central processing unit (CPU) in a target system based, at least in part, on a model generated from data collected for a test system. An operating frequency for the CPU is adjusted to the stable operating frequency. A benchmark test is run to confirm that the CPU is operating within limits.

A method is provided for synthesizing quantum circuits while reducing the T-count, comprising, for a plurality of qubits: determining a target unitary and executing a set of candidate operations W with a single T gate and computing a specific function f of U W.sup.−1 keeping the values of W that correspond to specific multiplicities such that after the first collection of W operators is selected a collection of unitaries U W.sup.−1 is determined to consider in the next round to build a tree. A method of synthesizing quantum circuits while reducing the T-depth is also provided, comprising, for a plurality of qubits: determining a target unitary and execute a set of candidate operations W with T depth of one and computing a specific function f of U W.sup.−1, keeping the values of W that correspond to specific multiplicities such that after the first collection of W operators is selected a collection of unitaries U W.sup.−1 is determined to consider in the next round to build a tree. A method of re-synthesizing quantum circuits while reducing T-depth is also provided, comprising, for a plurality of qubits considering all cluster sizes up to a maximum sized cluster, and continuing recursively.

A method for analyzing a processor design includes receiving a design for a processor and receiving an application to be executed by the processor. The method includes simulating the execution of the application on the processor based on the design to identify unexercisable gates of the processor.