Methods, apparatus, systems and articles of manufacture are disclosed to simulate metastability for circuit design verification. An example apparatus includes an input handler to receive circuit design data indicative of a circuit design, a circuit modeler to generate a simulation model based on the circuit design data, a simulator to simulate operation of the circuit design based on the simulation model, a metastability injector to insert metastability logic into the simulation model during the simulation, and a metastability controller to control the metastability logic during the simulation.

One embodiment provides a method and a system for generating test vectors for testing a computational system. During operation, the system obtains a design of the computational system, the design comprising an original system. The system generates a design of a fault-augmented system block by adding a plurality of fault-emulating subsystems to the original system; generates a design of an equivalence-checking system based on the original system and the fault-augmented system block; encodes the design of the equivalence-checking system into a logic formula, with variables within the logic formula comprising inputs and outputs of the original system and inputs and outputs of the fault-augmented system block; and solves the logic formula to obtain a test vector used for testing at least one fault in the computational system.

Systems and methods related to learning-based analyzers (both supervised and unsupervised) for mitigating latch-up in integrated circuits are provided. An example method includes obtaining latch-up data concerning at least one integrated circuit configured to operate under a range of temperature conditions, where the at least one integrated circuit comprises a core portion including at least a plurality of devices each having one or more structural features formed using a lithographic process, and an input/output portion. The method further includes training the learning-based system based on training data derived from the latch-up data and a first layout rule concerning a first spacing between the core portion and the input/output portion. The method further includes using the learning-based system generating a second layout rule concerning the first spacing between the core portion and the input/output portion, where the second layout rule is different from the first layout rule.

A method of simulating quantum gates includes shifting a Fock basis for the simulation such that the simulation can be performed in a smaller (e.g. truncated) Hilbert dimension space. To shift the Fock basis, non-orthonormalized basis states are first defined. The defined basis states are then orthonormalized to construct orthonormalized shifted Fock basis state. Matrix elements are determined for an operator in the orthonormalized shifted Fock basis and the operator is used to simulate the quantum gate in the shifted Fock basis.

Examples described herein provide a method for evaluating a programmable logic device (PLD) for compatibility with user designs. The method includes using a processor-based system: obtaining an indication of one or more failure bits of configuration memory of a programmable logic device (PLD); determining whether each of the one or more failure bits corresponds to a configuration memory bit to be used by a first PLD user design; if any of the one or more failure bits corresponds to a configuration memory bit to be used by the first PLD user design, classifying the PLD as unusable for the first PLD user design; and if none of the one or more failure bits corresponds to a configuration memory bit to be used by the first PLD user design, classifying the PLD as usable for the first PLD user design.

A soft error-mitigating semiconductor design system and associated methods that tailor circuit design steps to mitigate corruption of data in storage elements (e.g., flip flops) due to Single Events Effects (SEEs). Required storage elements are automatically mapped to triplicated redundant nodes controlled by a voting element that enforces majority-voting logic for fault-free output (i.e., Triple Modular Redundancy (TMR)). Storage elements are also optimally positioned for placement in keeping with SEE-tolerant spacing constraints. Additionally, clock delay insertion (employing either a single global clock or clock triplication) in the TMR specification may introduce useful skew that protects against glitch propagation through the designed device. The resultant layout generated from the TMR configuration may relax constraints imposed on register transfer level (RTL) engineers to make rad-hard designs, as automation introduces TMR storage registers, memory element spacing, and clock delay/triplication with minimal designer input.

Methods, apparatus, systems and articles of manufacture are disclosed to simulate metastability for circuit design verification. An example apparatus includes an input handler to receive circuit design data indicative of a circuit design, a circuit modeler to generate a simulation model based on the circuit design data, a simulator to simulate operation of the circuit design based on the simulation model, a metastability injector to insert metastability logic into the simulation model during the simulation, and a metastability controller to control the metastability logic during the simulation.

Testing of integrated circuitry, wherein the integrated circuitry includes a flip-flop with an asynchronous input, so that during performance of asynchronous scan patterns, glitches are avoided. Combinatorial logic circuitry delivers a local reset signal to the asynchronous input independent of an assertion of an asynchronous global reset signal. A synchronous scan test is performed of delivery of the local reset signal from the combinatorial logic circuitry while masking delivery of any reset signal to the asynchronous input of the flip-flop. An asynchronous scan test is performed of an asynchronous reset of the flip-flop with the asynchronous global reset signal while masking delivery of the local reset signal to the asynchronous input of the flip-flop.

An integrated circuit (IC) design comprising a scan chain may be received, where stimulus values may be scanned-in and response values may be scanned-out through a scan path in the scan chain, where the scan path may include a first scan cell and a second scan cell such that the first scan cell is downstream with respect to the second scan cell. The scan chain may be modified to enable observation of a 0 and a 1 value in the first scan cell in presence of a defect in the second scan cell, or observation of a 0 and a 1 value in the second scan cell in presence of a defect in the first scan cell.

A system enhances a system design to incorporate safety measures. The system receives a system design for processing through various stages of design using design tools, for example electronic design automation tools for introducing safety features in a circuit design. The system receives safety requirements for the system design, the safety requirements specifying safety measures for the system design. The system generates from the safety requirements, a safety specification storing a set of commands. The system generates a system design enhanced with safety measures. The enhanced system design it generated for at least a subset of the plurality of tools. A tool processes the generated safety specification to implement safety measures in the system design according to the received safety requirements.