A SEB resistance evaluation method includes: disposing an excitation source within a model of a semiconductor device; and determining an energy of the excitation source at which the semiconductor device exhibits thermal runaway, while varying a voltage applied to the model of the semiconductor device and the energy of the excitation source.

A method includes generating a first bitmap for a cell. The first bitmap is indicative of mapping constraints of the cell. The method also includes generating a second bitmap for a PSC filler cell. The second bitmap is indicative of the mapping constraints of the PSC filler cell. The method also includes a bitwise logical operation between a portion of the first bitmap and a respective portion of the second bitmap and determining a compatibility between the cell and the PSC filler cell based on at least a result of the bitwise logical operation.

Out-of-bounds recovery circuits configured to detect an out-of-bounds violation in an electronic device, and cause the electronic device to transition to a predetermined safe state when an out-of-bounds violation is detected. The out-of-bounds recovery circuits include detection logic configured to detect that an out-of-bounds violation has occurred when a processing element of the electronic device has fetched an instruction from an unallowable memory address range for the current operating state of the electronic device; and transition logic configured to cause the electronic device to transition to a predetermined safe state when an out-of-bounds violation has been detected by the detection logic.

A method for repairing logic design includes inserting primary logic gates in a primary logic design path of a logic chip. The method also includes inserting alternative logic gates in an alternate logic design path of the logic chip. The alternate logic design path and the primary logic design path are coupled to multiple fuses. The potentially defective design is repaired by selecting between the alternate logic design path and the primary logic design path with the fuses when the logic design is defective.

A Register Transfer Level (RTL) representation is recovered from a netlist representing an integrated circuit (IC). The netlist is converted to a graph comprising nodes belonging to a set of node types and edges connecting the nodes. The set of node types includes an instance node type representing an electronic component and a wire node type representing signal transfer between components. The graph is converted to a standardized graph by replacing subgraphs of the graph with standardized subgraphs. An RTL representation of the standardized graph is generated by operations including building signal declarations in a hardware description language (HDL) from the wire nodes of the standardized graph and building signal assignments in the HDL from instance nodes of the standardized graph.

A method for repairing logic design includes inserting primary logic gates in a primary logic design path of a logic chip. The method also includes inserting alternative logic gates in an alternate logic design path of the logic chip. The alternate logic design path and the primary logic design path are coupled to multiple fuses. The potentially defective design is repaired by selecting between the alternate logic design path and the primary logic design path with the fuses when the logic design is defective.

Out-of-bounds recovery circuits configured to detect an out-of-bounds violation in an electronic device, and cause the electronic device to transition to a predetermined safe state when an out-of-bounds violation is detected. The out-of-bounds recovery circuits include detection logic configured to detect that an out-of-bounds violation has occurred when a processing element of the electronic device has fetched an instruction from an unallowable memory address range for the current operating state of the electronic device; and transition logic configured to cause the electronic device to transition to a predetermined safe state when an out-of-bounds violation has been detected by the detection logic.

The present disclosure relates to testing structures and, more particularly, to a circuit and method for design of RF integrated circuits for process control monitoring. The circuit includes a radio frequency integrated circuit comprising a plurality of active NFET devices and passive devices arranged in a single topography; and a plurality of NFET switches which are configurable to diagnose physical failures of the plurality of active NFET devices and the passive devices by isolating selected ones of the plurality of active NFET devices and the passive devices into different built-in circuit topologies by selectively turning on and off the plurality of active NFET devices and the passive devices.

Provided is a programmable logic integrated circuit wherein even if a failure occurs in any resistance-variable element, remedy would be possible and hence the improvement of reliability has been achieved. In a programmable logic integrated circuit comprising resistance-variable elements, when the states of the resistance-variable elements are to be changed according to externally inputted configuration information, a control means uses a reading means to read the states of the respective resistance-variable elements, and then uses a writing means to change only the states of resistance-changing elements that are different from a state indicated by the configuration information.

A programmable logic device includes an integrated circuit die having a programmable fabric region including N identical programmable logic partitions. In some embodiments, N1 of the identical programmable logic partitions are user-programmable. In addition, and in some cases, one of the identical programmable logic partitions is a spare logic partition. In some embodiments, the integrated circuit die further includes a network-on-a-chip (NOC) including a vertical NOC (VNOC) and a horizontal NOC (HNOC). By way of example, the N identical programmable logic partitions are configured to communicate exclusively through the NOC. In some embodiments, a defective one of the N1 identical programmable logic partitions is configured for swapping with the spare logic partition.