G06F2119/02

SIMULATION METHOD BASED ON EVENTS AND COMPUTER EQUIPMENT THEREOF
20220318457 · 2022-10-06 ·

The disclosure provides an simulation method based on events including steps of: loading a virtual autonomous vehicle into a simulation scene; acquiring a first operation data of the virtual autonomous vehicle in the simulation scene, the first operation data is current operation data of autonomous vehicle; determining whether a first trigger event exists in the first operation data and the environment data or not; changing the first part of the obstacles from current movement trajectories to first movement trajectories according to a first predetermined movement rule when the first trigger event exists; acquiring second operation data of the virtual autonomous vehicle in the simulation scene; and obtaining simulation results of the autonomous driving system on the virtual autonomous vehicle in the simulation scene according to the second operation data. A computer equipment is also provided.

METHOD FOR STATIC IDENTIFICATION OF DAMAGE TO SIMPLY SUPPORTED BEAM UNDER UNCERTAIN LOAD

The present disclosure provides a method for static identification of damage to a simply supported beam under an uncertain load. In this identification method, a beam body is first segmented, and the relationships between key measured sectional rotation angles and the flexural rigidities of segments of a structure under the action of a load are established by using a mechanics principle; then, an applied static load is removed by means of a division operation, and the relative relationships between the flexural rigidities of the segments of the structure are obtained; and finally, these relative relationships are compared with the corresponding relative relationships when the structure is not damaged, so as to determine the position of damage to the structure and assess the amount of damage, such that the static identification for damage to a simply supported beam structure can be completed without calibrating a load in advance.

METHOD FOR ESTABLISHING VARIATION MODEL RELATED TO CIRCUIT CHARACTERISTICS FOR PERFORMING CIRCUIT SIMULATION, AND ASSOCIATED CIRCUIT SIMULATION SYSTEM

A method for establishing a variation model related to circuit characteristics for performing circuit simulation includes: performing first, second, third, and fourth Monte Carlo simulation operations according to a first netlist file and predetermined process model data to generate a first, a second, a third, and a fourth performance simulation results, respectively, where the first netlist file is arranged to indicate a basic circuit in a circuit system; and execute a performance simulation results expansion procedure according to the first, the second, the third, and the fourth performance simulation results to generate a plurality of performance simulation results to establish the variation model, for performing the circuit simulation to generate at least one circuit simulation result according to one or more performance simulation results among the plurality of performance simulation results, where the number of the plurality of performance simulation results is greater than four.

Mode-shaped components

Embodiments of the invention are shown in the figures, where a method is presented for designing a component, including designing or receiving a model of the component; determining at least one mode shape of at least a portion of the model; redesigning the model based on the determined at least one mode shape to obtain a redesigned model of the component; and manufacturing the component in accordance with the redesigned model.

Method of certifying safety levels of semiconductor memories in integrated circuits

A method includes specifying a target memory macro, and determining failure rates of function-blocks in the target memory macro based on an amount of transistors and area distributions in a collection of base cells. The method also includes determining a safety level of the target memory macro, based upon a failure-mode analysis of the target memory macro, from a memory compiler, based on the determined failure rate.

Synthesis of a quantum circuit

Systems, computer-implemented methods, and computer program products to facilitate synthesis of a quantum circuit are provided. According to an embodiment, a system can comprise a memory that stores computer executable components and a processor that executes the computer executable components stored in the memory. The computer executable components can comprise a circuit generation component that generates, iteratively, quantum circuits from 1 to N two-qubit gates, wherein at least one or more iterations (1, 2, . . . , N) adds a single two-qubit gate to circuits from a previous iteration based on using added single 2-qubit gates that represent operations distinct from previous operations relative to previous iterations. The computer executable components can further comprise a circuit identification component that identifies, from the quantum circuits, a desired circuit that matches a quantum circuit representation.

INFORMATION PROCESSING CIRCUIT AND METHOD FOR DESIGNING INFORMATION PROCESSING CIRCUIT
20230205957 · 2023-06-29 · ·

The information processing circuit 10 performs operations on layers in deep learning, and includes a product sum circuit 11 which performs a product-sum operation using input data and parameter values, and a parameter value output circuit 12 which outputs the parameter values, wherein the parameter value output circuit 12 is composed of a combinational circuit, and includes a first parameter value output circuit 13 manufactured in a way that a circuit configuration cannot be changed and a second parameter value output circuit 14 manufactured in a way that allows a circuit configuration to be changed.

METHOD FOR OPTICAL PROXIMITY CORRECTION OF PHOTOMASK LAYOUT UTILIZING PARAMETERS OBTAINED THROUGH ACTUAL PHOTOMASK MANUFACTURE
20230205970 · 2023-06-29 · ·

A mask layout optical proximity correction (OPC) method includes determining a target pattern to be formed on a substrate, simulating a photomask layout based on the target pattern, applying a bias to the simulated photomask layout, thereby correcting the photomask layout into a first modeling layout, and selecting one of control parameters obtained through modeling using a layout of a split mask, thereby deforming the first modeling layout into a second modeling layout, and checking whether or not there is a mask rule check (MRC) violation, based on the second modeling layout.

DIGITAL TWIN FOR RIG OPERATIONS
20230206779 · 2023-06-29 ·

A method for simulating a rig operation that can include creating a digital twin of a rig based on a rig plan for assembling/disassembling a rig; simulating, via the digital twin, a list of tasks for assembly/disassembly of rig components to assemble/disassemble the rig at a rig site. Also, a method for simulating and performing a rig operation is provided that can include operations of creating a digital twin of a rig based on a rig plan for the rig, simulating, via the digital twin, the rig plan, where the rig plan can include a list of tasks for moving rig components of the rig, and simulating, via the digital twin, moving the rig components from a first location to a second location.

Method and system for automatic conduction of a process failure mode and effect analysis for a factory

Conducting automatically a process failure mode and effect analysis, PFMEA, for a factory adapted to produce a product in a production process using a meta model, MM, stored or loaded in a data storage. The stored meta model, MM, comprises abstract factory model elements modeling an abstract factory, AF, including one or more service declarations modeling abstract services across different factories, wherein each service declaration comprises failure mode declarations for different failure modes.