Disclosed is a method and apparatus that determines receiver capacitance values for a receiver cell from a multi-segment receiver capacitance model (C1Cn) model. Values for receiver capacitance are determined from a Composite Current Source for Noise (CCSN) model under conditions used to attain receiver capacitance values for the C1Cn model Difference values for the difference between the values from the CCSN model and from the C1Cn model are determined. Calibration factors are iteratively applied to parameters of the CCSN model to obtain a minimum difference value for difference between receiver capacitance values from the CCSN model and receiver capacitance values from the C1Cn model. Calibration factor values that result in the difference value being within an acceptable range are stored.

A processing device identifies a first clock tree topology for a circuit design, the first clock tree topology having a threshold feedthrough count and a first timing solution. The processing device further identifies one or more additional clock tree topologies for the circuit design, each of the one or more additional clock tree topologies having a different respective feedthrough count that is less than the threshold feedthrough count, and each of the one or more additional clock tree topologies comprising a respective timing solution. In addition, the processing device receives a selection of at least one of the first clock tree topology or the one or more additional clock tree topologies, and generates the circuit design according to the selection.

A system includes one or more processors and a computer storage medium storing instructions that cause a machine to perform operations including accessing an integrated circuit (IC) design including an initial clock tree. The operations include selecting a first driver to evaluate for resizing, the first driver being a first size and having a first leakage current and determining a baseline power consumption measurement of clock tree based on the first size and the first leakage current of the first driver. The operations include identifying a plurality of replacement drivers to replace the first driver and determining a power consumption measurement for a second driver. Based on determining that the power consumption measurement for the second driver is less than the baseline power consumption measurement replacing the first driver with the second driver and generating a layout instance based on the second driver.

A non-transitory computer-readable recording medium stores an analysis program for causing a computer to execute a process including: reading circuit data; trying to generate test data for a delay fault to be targeted; analyzing whether an underkill is caused when the targeted delay fault results in a redundant fault; and presenting circuit modification locations to avoid the underkill, based on an analysis result, when the underkill is caused.

A computer-implemented method is presented for performing matrix sketching by employing an analog crossbar architecture. The method includes low rank updating a first matrix for a first period of time, copying the first matrix into a dynamic correction computing device, switching to a second matrix to low rank update the second matrix for a second period of time, as the second matrix is low rank updated, feeding the first matrix with first stochastic pulses to reset the first matrix back to a first matrix symmetry point, copying the second matrix into the dynamic correction computing device, switching back to the first matrix to low rank update the first matrix for a third period of time, and as the first matrix is low rank updated, feeding the second matrix with second stochastic pulses to reset the second matrix back to a second matrix symmetry point.

Techniques and systems for determining an output waveform at an output of a complementary metal-oxide-semiconductor (CMOS) logic gate are described. Some embodiments can identify at least one set of inputs of the CMOS logic gate that, when switched together, causes multiple transistors coupled in parallel to simultaneously turn-on and drive the output of the CMOS logic gate. Next, the embodiments can determine a set of current source models that are coupled in parallel to model the CMOS logic gate when the set of inputs of the CMOS logic gate are switched together. The embodiments can then simulate the set of current source models together to determine the output waveform at the output of the CMOS logic gate when the set of inputs of the CMOS logic gate are switched together.

An integrated circuit (IC) design is accessed from a database in memory. The IC design comprises a route connecting a source to a sink. A set of buffering candidates for buffering are generated for the net. A timing improvement associated with a buffering candidate in the set of buffering candidates is determined using a first timing model. The buffering candidate is pruned from the set of buffering candidates based on the timing improvement and a cost associated with the buffering candidate. The pruned set of buffering candidates is evaluated using a second timing model, and a buffering solution for the net is selected from the pruned set of buffering candidates based on a result of the evaluating. The IC design is updated to include the buffering solution selected for the net.

A method and apparatus for estimating signal related delays in a PLD design is disclosed. The PLD design is modeled in relation to one or more stages, each of the stages including a driver and one or more receivers coupled to the driver with a wiring tree. The modeling is based on a selected set of parameters that include: slope related delays associated with the driver; a delay related to a layout of the wiring tree; and a parameter related to a slope transfer from a previous driver input. A predetermined set of values for each of the selected parameters are accessed; the estimated signal related delays are computed for each of the modeled stages; and are written to a computer-readable storage medium.

Systems and methods for improving design performance of a layout design through placement of functional and spare cells by leveraging layout dependent effect (LDE) is disclosed. The method includes the steps of: importing a plurality of technology files associated with the layout design into an EDA system; importing a netlist associated with the layout design into the EDA system; importing a standard cell library containing pattern-S timing information of the functional cells and the spare cells; performing floorplan and spare cell insertion, wherein the spare cells are distributed uniformly across the floorplan; and conducting placement and optimization through re-placement of the at least one functional cells and the spare cells to form pattern-S with at least one timing critical cells to improve an overall timing performance of the layout design. According to some embodiments, conducting placement and optimization further includes: moving the at least one spare cells to locations to abut the at least one timing critical cells to form pattern-S for each of the at least one timing critical cells.

Embodiments include herein are directed towards a method for static timing analysis. Embodiments included herein may include providing, using at least one processor, a database of predefined script tags and causing a display of a script at a graphical user interface. Embodiments may also include receiving an insertion of at least one tag from the database within the script and generating one or more timing reports based upon, at least in part, the script and the at least one tag.