Patent classifications
G06F2119/22
Method of generating an operation procedure for a simulation of a mechatronic system
A computer-implemented method of generating an operation procedure for a simulation of a system, in particular a mechatronic system is disclosed. A source node has at least one source parameter (Ps) and a first simulation system with at least one first simulation node is determined, wherein the first simulation node includes at least one input parameter (Pi) and at least one output parameter (Pa). The first simulation node includes a simulation function for determining the output parameter (Pa) based on the input parameter (Pi) of the first node. When the input parameter (Pi) is available based on the source parameter (Ps), a global operation graph is built describing a link between the source node and the first simulation node for describing an operating procedure of the simulation of the system.
SYSTEMS AND METHODS FOR GENERATING AN EXTENSIBLE DIGITAL FORMULATION NETWORK MODEL AND IMPLEMENTING AN INTELLIGENT FORMULATION USING THE FORMULATION NETWORK MODEL
A method and system for an accelerated design of a virtual product formulation based on an expert-enhanced quantitative formulation network includes sourcing qualitative expert formulation; creating a qualitative formulation network; extracting qualitative network-expansion data based on a category associated with a target product associated with the qualitative formulation network, creating a second set of network components including formulation variable nodes and formulation edge connections; integrating the second set of network components into the qualitative formulation network; transforming the qualitative formulation network integrated with the second set of network components to a quantitative formulation network; designing at least part of a virtual product formulation based on the quantitative formulation network; and generating a target formulation proposal that likely satisfies the target formulation objective based on executing the virtual product formulation as initialized.
SYSTEMS AND METHODS FOR SETTING UP A PHYSICS-BASED MODEL
Systems and methods for setting up a physics-based model are provided. One system includes one or more components that are executed by one or more computer subsystems and that include a physics-based model describing a semiconductor fabrication-related process and a set up component configured for setting up the physics-based model in multiple phases in each of which only a subset of all of the parameters of the physics-based model are set up. A configuration of the set up component is changed between at least two of the multiple phases based on the subset of all of the parameters of the physics-based model set up in the at least two of the multiple phases. The set up component may perform a Bayesian optimization technique for cascaded model set up or calibration using multiple information sources and objective functions.
Stochastic signal prediction in compact modeling
A method, includes, in part, defining a continuous signal, defining a threshold value, calibrating the continuous signal and the threshold value from measurements made on edges of one or more patterns on a mask and corresponding edges of the patterns on a wafer, convolving the continuous signal with a kernel to form a corrected signal, and establishing, by a processor, a probability of forming an edge at a point along the corrected signal in accordance with a difference between the value of the corrected signal at the point and the calibrated threshold value. The kernel is calibrated using the same measurements made on the patterns' edges.
Method of wafer layout and exposure system of lithography machine
Embodiments of the present application relate to the technical field of semiconductor, and disclose a design method of a wafer layout and an exposure system of a lithography machine. The design method of a wafer layout includes: providing a yield distribution map of a wafer under an initial wafer layout; determining a yield edge position of the wafer according to the yield distribution map; and calculating a new wafer layout according to a die size and the yield edge position.
Mode-shaped components
Embodiments of the invention are shown in the figures, where a method is presented for designing a component, including designing or receiving a model of the component; determining at least one mode shape of at least a portion of the model; redesigning the model based on the determined at least one mode shape to obtain a redesigned model of the component; and manufacturing the component in accordance with the redesigned model.
Detection of defects within physical infrastructure by leveraging AI
An approach for maintaining pipeline infrastructure based on graphical images is disclosed. The approach receives a plurality of parameters in a pipeline infrastructure by using a plurality of sensors. The approach generates a digital twin of the determined one or more susceptible and/or vulnerable points/areas/joints in the pipeline infrastructure. The approach simulates the determined susceptible areas/points/joints in the pipeline infrastructure for determining one or more damages and/or defects. The approach predicts one or more proactive maintenance actions based on the determined damage and/or defect in the pipeline infrastructure to prevent the users from being near the susceptible area/joints/portions and prioritizing the proactive maintenance actions based on the level and extent of damage and/or defect.
SYSTEM AND METHOD FOR PERFORMING LOCAL CDU MODELING AND CONTROL IN A VIRTUAL FABRICATION ENVIRONMENT
Systems and methods for performing local Critical Dimension Uniformity (CDU) modeling in a virtual fabrication environment are discussed. More particularly, local CD variance is replicated in the virtual fabrication environment in order to produce a CDU mask that can be used during a virtual fabrication sequence to produce more accurate results reflecting the CD variance of features that occurs in a pattern for a semiconductor device being physically fabricated.
Method for simulation-based analysis of a motor vehicle
The invention relates to a method for simulation-based analysis and/or optimization of a motor vehicle, preferably having the following working steps: simulating (SIOI) a driving operation of the motor vehicle (I) on the basis of a model (M) with at least one manipulated variable for acquiring values of at least one simulated variable which is suitable for characterizing an overall vehicle behaviour, in particular a driving capability, of the motor vehicle (I), wherein the model has at least one partial model, in particular a torque model, and wherein the at least one partial model is based on a function and preferably characterizes the operation of at least one component, in particular of an internal combustion engine of the motor vehicle (I); and—outputting (S I03) the values of the at least one simulated variable.
AUTOMATIC PROGRAMMING DEVICE AND METHOD THEREFOR
In a machining system that conducts nesting to arrange parts over a workpiece and machines the workpiece with a machine tool according to a result of the nesting, there is an automatic programming device for preparing a nesting machining program for the machine tool, wherein nested workpiece information relating to the workpiece nested is acquired according to the information relating to the parts and the information relating to the workpiece, sections that require no re-nesting in the nested workpiece information are locked according to the operator's designation, re-nesting is conducted on sections other than the locked sections.