An apparatus (e.g., a content addressable memory system) can have a controller; a first content addressable memory coupled to the controller and a second content addressable memory coupled to the controller. The controller can be configured to cause the first content addressable memory to compare input data to first data stored in the first content addressable memory and cause the second content addressable memory to compare the input data to second data stored in the second content addressable memory such the input data is compared to the first and second data concurrently and replace a result of the comparison of the input data to the first data with a result of the comparison of the input data to the second data in response to determining that the first data is invalid and that the second data corresponds to the first data.

A method of detecting error in a data plane of a packet forwarding element that includes a plurality of physical ternary content-addressable memories (TCAMs) is provided. The method configures a first set of physical TCAMs into a first logical TCAM. The method configures a second set of physical TCAMs into a second logical TCAM. The second logical TCAM includes the same number of physical TCAMs as the first logical TCAM. The method programs the first and second logical TCAMs to store a same set of data. The method requests a search for a particular content from the first and second logical TCAMs. The method generates an error signal when the first and second logical TCAMs do not produce a same search results.

NAND-based content addressable memory is provided with a memory cell including two programmable resistive elements, such as memristors. These memory cells can be used to provide a programmable resistive address decoder. Such decoders can improve computer hardware performance in various ways: 1) improved translation lookaside buffers, 2) improved cache memory, and 3) by eliminating physical addresses entirely.

An apparatus (e.g., a content addressable memory system) can have a controller; a first content addressable memory coupled to the controller and a second content addressable memory coupled to the controller. The controller can be configured to cause the first content addressable memory to compare input data to first data stored in the first content addressable memory and cause the second content addressable memory to compare the input data to second data stored in the second content addressable memory such the input data is compared to the first and second data concurrently and replace a result of the comparison of the input data to the first data with a result of the comparison of the input data to the second data in response to determining that the first data is invalid and that the second data corresponds to the first data.

A logic-memory cell includes a spin-orbit torque device having first, second and third terminals configured such that current between the second and third terminals is capable of changing a resistance between the first and second terminals. In the cell, a first transistor is connected between a logic connection line and the first terminal of the spin-orbit torque device and a second transistor is connected between the logic connection line and the third terminal of the spin-orbit torque device.

A memory device capable of reading reference data while achieving optimization of electric power consumption is provided. A memory device includes a memory area storing reference data of N (1) dimensions each composed of M (1) bits. A number of memory grains each composed of nonvolatile memory and power drivers paired with the memory grains to supply electrical power to the memory grains are provided in each region specified by column lines in the number and M row lines, the number being one to N inclusive. When the power driver receives a control signal from the corresponding one of the column lines, a control signal from the corresponding one of the M row lines, and a clock signal, the power driver supplies electrical power to the memory grain in synchronization with the clock signal.

A memory device capable of reading reference data while achieving optimization of electric power consumption is provided. A memory device includes a memory area storing reference data of N (1) dimensions each composed of M (1) bits. A number of memory grains each composed of nonvolatile memory and power drivers paired with the memory grains to supply electrical power to the memory grains are provided in each region specified by column lines in the number and M row lines, the number being one to N inclusive. When the power driver receives a control signal from the corresponding one of the column lines, a control signal from the corresponding one of the M row lines, and a clock signal, the power driver supplies electrical power to the memory grain in synchronization with the clock signal.

A memory device capable of reading reference data while achieving optimization of electric power consumption is provided. A memory device includes a memory area storing reference data of N (1) dimensions each composed of M (1) bits. A number of memory grains each composed of nonvolatile memory and power drivers paired with the memory grains to supply electrical power to the memory grains are provided in each region specified by column lines in the number and M row lines, the number being one to N inclusive. When the power driver receives a control signal from the corresponding one of the column lines, a control signal from the corresponding one of the M row lines, and a clock signal, the power driver supplies electrical power to the memory grain in synchronization with the clock signal.

A memory device capable of reading reference data while achieving optimization of electric power consumption is provided. A memory device includes a memory area storing reference data of N (1) dimensions each composed of M (1) bits. A number of memory grains each composed of nonvolatile memory and power drivers paired with the memory grains to supply electrical power to the memory grains are provided in each region specified by column lines in the number and M row lines, the number being one to N inclusive. When the power driver receives a control signal from the corresponding one of the column lines, a control signal from the corresponding one of the M row lines, and a clock signal, the power driver supplies electrical power to the memory grain in synchronization with the clock signal.

The disclosure relates in some aspects to on-chip processing circuitry formed within the die of a non-volatile (NVM) array to perform data searches. In some aspects, the die includes components configured to sense wordlines of stored data in the NVM array by applying voltages on the wordlines serially, and then search for an input data pattern within the serially-sensed wordlines. In some examples, the components of the die include latches and circuits configured to perform bitwise latch logic search operations. In other examples, the search components are configured with under-the-array or next-to-the-array dedicated search circuitry that uses registers and/or random access memory (RAM). Other aspects relate to a separate controller device for controlling the on-chip NVM search operations. For example, the controller may determine whether to search for data using search components of the NVM die or processors of the controller based, e.g., on a degree of fragmentation of data.