A position verification sensor produces a discrete output for determining an accuracy of mutual mechanical positioning with a key and includes: a substratum; a housing; a receiver pad that: receives contact with the key; produces a target output in contact with the key; and produces a null output in absence of contact with the key; an aperture cap having: a cap surface; and the keyway aperture that selectively communicates the key; and a compliant member that: rests in a primary position in an absence of the key disposed on the cap surface; receives the depression force from the aperture cap; reciprocatively depresses, from the primary position to a depressed position, in response to receiving the depression force and being pushed by the depression force from the key; and reciprocatively returns, from the depressed position to the primary position, when the key is removed from contact with the aperture cap.

A position verification sensor produces a discrete output for determining an accuracy of mutual mechanical positioning with a key and includes: a substratum; a housing; a receiver pad that: receives contact with the key; produces a target output in contact with the key; and produces a null output in absence of contact with the key; an aperture cap having: a cap surface; and the keyway aperture that selectively communicates the key; and a compliant member that: rests in a primary position in an absence of the key disposed on the cap surface; receives the depression force from the aperture cap; reciprocatively depresses, from the primary position to a depressed position, in response to receiving the depression force and being pushed by the depression force from the key; and reciprocatively returns, from the depressed position to the primary position, when the key is removed from contact with the aperture cap.

A semiconductor review tool receives absolute Z-height values for the semiconductor wafer, such as a semiconductor wafer with a beveled edge. The absolute Z-height values can be determined by a semiconductor inspection tool. The semiconductor review tool reviews the semiconductor wafer within a Z-height based on the absolute Z-height values. Focus can be adjusted to within the Z-height.

A semiconductor review tool receives absolute Z-height values for the semiconductor wafer, such as a semiconductor wafer with a beveled edge. The absolute Z-height values can be determined by a semiconductor inspection tool. The semiconductor review tool reviews the semiconductor wafer within a Z-height based on the absolute Z-height values. Focus can be adjusted to within the Z-height.

In at least one general aspect, an inductive sensor can include a shaft having an axis of rotation, and a rotor physically coupled to the shaft and including a rotor coil. The rotor and the rotor coil can be aligned along a plane orthogonal to the axis of rotation. The inductive sensor can include a stator including a stator layer, an excitation coil, and an eccentricity receiver coil where the excitation coil and the eccentricity receiver coil are physically coupled to the stator layer.

The invention relates to a method and an apparatus for ascertaining a positional deviation of a brake disc (30) relative to a caliper seat (11). According to the invention, an angular deviation (34) from the parallel between the brake disc (30) and the caliper seat (11) is measured in that an apparatus (1) for ascertaining the positional deviation of the brake disc (30) is connected to the caliper seat (11), the apparatus (1) comprising at least two distance sensors (20, 22) that are stationary with respect to the caliper seat (11) and take measurements in the direction of a first flat face of the brake disc (30), the distance sensors (20, 22) transmitting distances (A, A′) between the first flat face of the brake disc (30) and the distance sensors (20, 22) measured at different radii (R, R′) of the brake disc (30) to an evaluation device, the angular deviation (34) of the brake disc (30) being ascertained by the evaluation device from the distances.

The invention relates to a method and an apparatus for ascertaining a positional deviation of a brake disc (30) relative to a caliper seat (11). According to the invention, an angular deviation (34) from the parallel between the brake disc (30) and the caliper seat (11) is measured in that an apparatus (1) for ascertaining the positional deviation of the brake disc (30) is connected to the caliper seat (11), the apparatus (1) comprising at least two distance sensors (20, 22) that are stationary with respect to the caliper seat (11) and take measurements in the direction of a first flat face of the brake disc (30), the distance sensors (20, 22) transmitting distances (A, A′) between the first flat face of the brake disc (30) and the distance sensors (20, 22) measured at different radii (R, R′) of the brake disc (30) to an evaluation device, the angular deviation (34) of the brake disc (30) being ascertained by the evaluation device from the distances.

Systems and methods are provided herein for improved short range object detection in LiDAR systems. The associated systems may include a first portion and a second portion configured to rotate relative to one another. The system may also include a first magnet located on the second portion and arranged with a north pole of the first magnet facing a first direction. The system may also include a second magnet located on the second portion and arranged with a south pole of the second magnet facing the first direction. The system may also include a first sensor located on the first portion, wherein the first sensor is further configured to measure a first magnetic field of the first magnet and a second magnetic field of the second magnet as the first portion and second portion rotate relative to one another.

Systems and methods are provided herein for improved short range object detection in LiDAR systems. The associated systems may include a first portion and a second portion configured to rotate relative to one another. The system may also include a first magnet located on the second portion and arranged with a north pole of the first magnet facing a first direction. The system may also include a second magnet located on the second portion and arranged with a south pole of the second magnet facing the first direction. The system may also include a first sensor located on the first portion, wherein the first sensor is further configured to measure a first magnetic field of the first magnet and a second magnetic field of the second magnet as the first portion and second portion rotate relative to one another.

Systems and methods are provided for detecting an enclosure alignment anomaly. Pressure data of a set period can be obtained from one or more piezoelectric sensors. The one or more piezoelectric sensors are installed in between an enclosure and a fixture of an autonomous vehicle. The pressure data of the set period can be processed over a period of time. One or more trends can be identified based on the processed pressure data.