An optical coherence tomographic imager for contributing reduction of the number of man-hours for evaluation to obtain a wavelength sweeping operation of continuous, linear, and monotonic change while utilizing a wavelength-tunable laser having a structure that is less susceptible to mechanical disturbance. The optical coherence tomographic imager includes a wavelength-tunable light source, a branching means, an irradiation means, a photoelectric conversion measuring means, and a processor. The wavelength-tunable light source outputs light whose wavelength is determined by a plurality of light source drive parameters. The branching means branches output light of the wavelength-tunable light source into object light and reference light. The irradiation means irradiates an object to be measured with the object light. The photoelectric conversion measuring means obtains interference light intensity measurement values by causing object light scattered from the object to be measured and the reference light to interfere with each other and to be guided to a light receiver. The processor reorders the interference light intensity measurement values based on the output light wavelengths.

An electronic device including an SMI sensor may be operated to predict interference in an SMI signal caused by speckle provided by the SMI sensor and operate the SMI sensor based on predicted interference in the SMI signal caused by speckle. Predicting interference in the SMI signal caused by speckle and operating the SMI sensor accordingly may allow for accurate measurement of physical phenomena using the SMI sensor with reduced power consumption.

An electronic device including an SMI sensor may be operated to predict interference in an SMI signal caused by speckle provided by the SMI sensor and operate the SMI sensor based on predicted interference in the SMI signal caused by speckle. Predicting interference in the SMI signal caused by speckle and operating the SMI sensor accordingly may allow for accurate measurement of physical phenomena using the SMI sensor with reduced power consumption.

An interferometer for the measurement of a surface or an optical thickness of an optically smooth test object is provided, wherein the interferometer is configured to illuminate the optically smooth test object simultaneously with a plurality of object waves, which have different wavelengths from one another, and to superimpose the object waves 10 deformed by the illuminated test object onto coherent reference waves on an image capture device, and to spectrally decompose the interferograms resulting from the superposition into wavelength-specific partial interferograms.

A system for interrogating an interferometer. The system comprises an optical signals generation system for concurrently generating a plurality of optical signals that each have a modulation parameter that the other of the plurality of optical signals do not have. The optical signals generation system is for optically coupling each of the plurality of optical signals to a plurality of optical ports of the interferometer for ingress of the plurality of optical signals into the interferometer. The system comprises an interferometer output processing system. Also disclosed herein is an interferometric system and a method for interrogating an interferometer.

An ophthalmic imaging apparatus includes: a detector arranged to detect, as an interference signal, interference light resulting from returning light and reference light, the returning light being light from an object to be inspected to which measurement light is radiated, the reference light corresponding to the measurement light; a converter arranged to convert the detected interference signal that is an analog signal to a digital signal; and an arithmetic processing unit configured to generate a tomographic image of the object to be inspected by using the converted interference signal. The arithmetic processing unit uses a plurality of components obtained from the converted interference signal to generate the tomographic image, the plurality of components including a component having a frequency higher than a Nyquist frequency of the converter and a component having a frequency lower than the Nyquist frequency of the converter.

An adjustable beam directing optical system for a focused laser differential interferometer (FLDI) instrument according to various aspects of the present technology may include optical half waveplate to achieve an incident linear polarization orientation with equal components of laser intensity aligned to the vertical and horizontal axis of the optical system, and an optical prism for splitting these components of an incident laser beam into two orthogonally-polarized beams equally about an optical axis of the FLDI instrument. A series of beam realignment devices positioned downstream of the optical prism are configured to selectively direct each beam to a predetermined location.

An adjustable beam directing optical system for a focused laser differential interferometer (FLDI) instrument according to various aspects of the present technology may include optical half waveplate to achieve an incident linear polarization orientation with equal components of laser intensity aligned to the vertical and horizontal axis of the optical system, and an optical prism for splitting these components of an incident laser beam into two orthogonally-polarized beams equally about an optical axis of the FLDI instrument. A series of beam realignment devices positioned downstream of the optical prism are configured to selectively direct each beam to a predetermined location.

Systems and methods disclosed herein provide for gas imaging. A gas imaging system comprises a lenslet array configured to receive thermal radiation from a scene and transmit a plurality of substantially identical sub-images of the thermal radiation; a birefringent polarization interferometer configured to generate an optical path difference for each ray of the plurality of sub-images based on a respective position of each ray entering the BPI, the optical path differences combining to form an interference fringe pattern; and an infrared focal plane array configured to capture a thermal image of the plurality of sub-images modulated by the interference fringe pattern due to the optical path differences through the BPI. The captured thermal image may represent a plurality of interferogram sample points of the thermal radiation from the scene, and may be used to construct a plurality of hyperspectral images of the thermal radiation from the scene.

A measurement method for interferometrically measuring the shape of a surface (112) of a test object (114). A test wave (125-1, 125-2) directed at the test object has a wavefront that is at least partially adapted to the desired shape of the surface, and a reference wave (128-1, 128-2) directed at a reflective optical element (130-1, 130 2) has a propagation direction that deviates from the propagation direction of the test wave (125-1, 125-2) for each of two input waves by diffraction at a diffractive element (124). For each wavelength, the test wave is superimposed after interaction with the test object with the associated reference wave after the back-reflection at the first reflective optical element. The test and reference waves are diffracted again at the diffractive element for superposition. An interferogram produced by the superposition is captured in a capture plane (148-1, 148-2). The interferograms are jointly evaluated.