An exemplary system can be provided which can include, for example, a plurality of source arrangements configured to provide a plurality of electro-magnetic radiations to at least one of at least one sample or at least one reference structure, a first arrangement configured to receive a first radiation(s) from the reference structure(s), a second arrangement configured to receive a second radiation(s) from the sample(s), where a portion(s) of the second radiation(s) can be in an invisible spectrum, a third arrangement configured to combine the first radiation(s) and the second radiation(s) into a third radiation(s), and a fourth arrangement configured to convert the third radiation(s) into a further radiation in a visible spectrum based on the at least one portion.

Systems, devices and methods for measuring surface roughness and surface shape of an optical element using a dual-mode interferometer are disclosed. The devices implement optical filters, with a compact form, that allows measurement of both surface characteristics without rearranging the system components. One example interferometric system includes a laser light source and a low coherence light source that alternatively provide light to a collimator, followed by a polarizer, and a polarizing beam splitter. The system further includes two optical filters, a quarter waveplate, two objectives and a reference optical component. Each light source produces a set of interferograms, where one set of interferograms is used to measure the surface shape and another set of interferograms is used to measure the surface roughness of the optical component.

A method comprises: splitting laser light into sample light, reference light, and monitor light; routing the reference light into a reference arm of an OCT interferometer; routing the monitor light into a monitor device, which generates at least one optical monitor signal representing at least one time-dependent property of the monitor light; generating at least one electric monitor signal from the at least one optical monitor signal; illuminating in a point-shaped manner a sample with sample light, wherein the illumination point is guided on the surface of the sample along a predetermined trajectory; superimposing the light scattered by the sample with the reference light emerging from the reference arm to generate an electric OCT signal; wherein the at least one electric monitor signal and the electric OCT signal are AD-converted in alternating sequence, in each case equidistantly in time, to form a single digital data stream.

A light detecting module that detects interference light that has exited an exit end surface of an optical fiber in an OCT instrument includes: a ball lens including an incident surface entered by the interference light that has exited the exit end surface, and an exit surface exited by the interference light that has entered the incident surface; and a photodiode including a detecting surface entered by the interference light that has exited the exit surface. The interference light obliquely enters the incident surface with respect to a perpendicular line at an incident position of the interference light. The interference light obliquely exits the exit surface with respect to a perpendicular line at an exit position of the interference light. The interference light obliquely enters the detecting surface with respect to a perpendicular line at an incident position of the interference light.

Among other things, a method comprises imaging a sample displaced between a sensor surface and a surface of a microscopy sample chamber to produce an image of at least a part of the sample. The image is produced using lensless optical microscopy, and the sample contains at least blood from a subject. The method also comprises automatically differentiating cells of different types in the image, generating a count of one or more cell types based on the automatic differentiation, and deriving a radiation dose the subject has absorbed based on the count.

A light detection device includes a light detector including first detectors and second detectors both disposed along a main surface; a light coupling layer disposed on or above the light detector; and a light shielding film disposed on the light coupling layer. The light coupling layer includes a first low-refractive-index layer, a first high-refractive-index layer that is disposed on the first low-refractive-index layer and includes a first grating, and a second low-refractive-index layer that is disposed on the first high-refractive-index layer. The light shielding film includes a light transmitting region and a light shielding region adjacent to the light transmitting region. The light transmitting region faces two or more first detectors included in the first detectors, and the light shielding region faces two or more second detectors included in the second detectors.

A light detection device includes a light detector including a first detector and a second detector; a light coupling layer disposed on or above the light detector; and a polarizer array that is disposed on the light coupling layer. The light coupling layer includes a first low-refractive-index layer, a first high-refractive-index layer including a first grating and a second grating adjacent to the first grating, and a second low-refractive-index layer in this order. The polarizer array includes a first polarizer that transmits light polarized in one direction and a second polarizer that is adjacent to the first polarizer and blocks the light polarized in the one direction. The first grating and the first polarizer face the first detector, and the second grating and the second polarizer face the second detector.

The present invention is directed to the provision of an interferometer and a phase shift amount measuring apparatus that can precisely operate in the EUV region. The interferometer according to the invention comprises an illumination source for generating an illumination beam, an illumination system for projecting the illumination beam emitted from the illumination source onto a sample, and an imaging system for directing the reflected beam by the sample onto a detector. The illumination system includes a first diffraction grating for producing a first and second diffraction beams which respectively illuminate two areas on the sample where are shifted from each other by a given distance, and the imaging system includes a second grating for diffracting the first and second diffraction beams reflected by the sample to produce a third and fourth diffraction beams which are shifted from each other by a given distance.

The present invention provides a sample inspection and quantitative imaging system and method for performing off-axis interferometric imaging while enabling to record off-axis holograms in an extended field of view (FOV) than possible using a given camera and imaging setup, and thus to enlarge (e.g. double, triple, or even more than this) the interferometric FOV, without changing the imaging parameters, such as the magnification and the resolution.

A system comprises a faceted structure imaging assembly and a faceted structure image analyzer. The system is configured to determine carat weight of a gemstone while in a mounted setting. In a first mode, the imaging assembly obtains a first image of a top gemstone surface. The image analyzer uses the first image to obtain at least one gemstone dimension, such as table and diameter dimensions. In a second mode, the imaging assembly obtains a second image of the top gemstone surface while a colored light pattern is reflected onto the gemstone. The image analyzer uses the second image to obtain at least one other gemstone dimension, such as crown and pavilion angles. The image analyzer uses the dimensions obtained from the first and second images to determine weight information of the gemstone. The system quickly determines gemstone weight reliably and consistently without skilled gemologists or removal from the setting.