A method and arrangement for testing and/or correction of a weld (34, 36, 38) of a test object (26, 102), including alignment of an ultrasonic probe (16, 128) guided by a robot (100) on a target position of the weld (28, 30, 32), determination of the actual position (34, 36, 38) of the weld by means of an optical sensor (22, 130) and alignment of the ultrasonic probe (16) on the actual position, and measurement of the weld, where CAD data of the target position of the weld (28, 30, 32) is made available, on the basis of the CAD data of the weld the ultrasonic probe (16, 128) is aligned on the target position of the weld, and the ultrasonic probe is placed on the weld with controlled force after determination of the actual position (34, 36, 38) of the weld by means of the optical sensor (22, 130).

The invention relates to a method for inspecting a part mounted in a manufacturing fixture between two manufacturing operations by means comprising: a sensor a robot to hold and move the sensor a computer comprising memory means, computation means and display means, comprising in its memory means a three-dimensional digital model of the workpiece, and able to record the coordinates of the points acquired by the sensorthe method comprising the steps consisting of: segmenting (1010) of the CAD model into a set of surfaces, designated as nodes, each node corresponding to a surface that is visible in a single acquisition according to the characteristics of the sensor determining (1020) the visibility of each node from each position of the sensor relative to said node determining common visibilities (1030) between the nodes.

A metrology system is provided for use with a movement system that moves an end tool (e.g., a probe). The metrology system includes a sensor configuration, a light beam source configuration and a processing portion. The sensor configuration comprises a plurality of light beam sensors. The light beam source configuration directs light beams to the light beam sensors of the sensor configuration. One of the light beam source configuration or the sensor configuration is coupled to the end tool and/or an end tool mounting configuration of the movement system which moves the end tool. The light beams that are directed to the light beam sensors cause the light beam sensors to produce corresponding measurement signals. A processing portion processes the measurement signals from the light beam sensors which indicate the position and orientation of the end tool.

A device has a displaceable device part, a drive, which is configured to drive the displaceable device part and to thus induce a movement in the displaceable device part, and a control unit, which is connected to the drive and is configured to control the drive. The device further has a first signal transmitter for determining a position and/or speed of the displaceable device part. The first signal transmitter and/or a first signal evaluation device, which is connected to the signal transmitter, are connected to the control unit such that the control unit receives information from the signal transmitter about the position and/or speed of the displaceable device part during operation of the device and controls the drive on the basis of the information received. A second signal transmitter of the device serves to monitor and/or redundantly determine the position and/or speed of the displaceable device part.

A system and method of providing remote control of a scanner is provided. The system includes a laser scanner device rotatable around a first axis and that includes a mirror rotatable around a second axis. The system also includes a mobile computing device operably coupled for communication to the laser scanner. The mobile computing device includes a sensor to detect movement of the mobile computing device. The mobile computing device also includes one or more processors and computer instructions to perform a method that includes connecting to the laser scanner to transmit signals therebetween; detecting a motion of the mobile computing device; and causing the laser scanner to modify at least one of the first angle of rotation of the laser scanner about the first axis and the second angle of rotation of the mirror about the second axis in response to detecting motion of the mobile computing device.

Sensor signals from a sensor of a coordinate measuring machine or microscope describe a workpiece arranged within a space. The sensor and the space are movable relative to one another. A method of visualizing the sensor signals includes obtaining data relating to a three-dimensional scene that is stationary relative to the space. The method includes generating a two-dimensional view image of the scene. The view image has opposing edges predefined with respect to at least one of the two directions. A central region of the view image is located between the edges. The method includes, repeatedly, obtaining a two-dimensional sensor representation of the workpiece and combining the sensor representation with the view image to form a two-dimensional output image. The method includes, in response to movement between the sensor and the space, generating a new view image if the central region would extend beyond either of the edges.

A method of identifying a surface point or region of an object to be measured by means of an optical sensor providing defined measuring conditions regarding emission of measuring light and reception of reflected measuring light in a defined spatial relationship. The method comprises defining a point or region of interest of the object, determining an optical property of the defined point or of the defined region and deriving an object information base on the optical property. The determination of the optical property is performed by optically pre-measuring the point or region using the optical sensor by illuminating the point or the region with the measuring light, capturing at least one image by means of the optical sensor of at least one illumination (Lr,Li) at the object and analysing respective illuminations (Lr,Li) regarding position or appearance plausibility with respect to the measuring conditions of the optical sensor.

A tactile and/or optical distance sensor includes a housing, which has at least one elongate portion, a measurement arm, which is arranged in the housing, at least partially extends through the elongate portion and has a tactile and/or an optical probe element at one end, a transducer, which is configured to capture a position of the tactile probe element or a signal of the optical probe element and to generate associated probe element measurement signals, and an advance unit, with which the housing is linearly dis-placeable along an advance direction. A strain sensor is located in the region of the measurement arm extending through the elongate portion or at an adjacent region directly adjoining said region. In addition, a system for measuring the roughness of a surface of a workpiece and a method for calibrating a distance sensor or a system are provided.

An opto-electronic dual-comb interferometric distance measuring method and device wherein a signal comb is chromatically divided into a target signal comb and a non-target signal comb at a emission position, preferably by an optical interleaver in a measurement probe of the device. Only the target signal comb serves as a free beam emitted to the target. The non-target signal comb serves for generation of additional or compensation internal phase differences. Thus, the distance to the target is based on first, target related phase differences and on the second, internal compensation phase differences.

A method for calibrating an optical arrangement for determining dimensional properties of a measurement object and a coordinate measuring machine implementing the method are disclosed. The optical arrangement has a camera and a projector for projecting a first periodic pattern onto a projection area. The optical arrangement is moveable relative to a workpiece table along a first axis. A matte surface is arranged on the workpiece table at a first position relative to the optical arrangement. A second periodic pattern, which is separate from the first periodic pattern, is provided and shifted on the matte surface. Images of the second pattern are recorded using the camera and at least one distortion aberration of the camera is determined using the second periodic pattern. The first periodic pattern is projected onto the matte surface and first and second coordinates of at least one pattern point of the projected first periodic pattern are determined, the second coordinate with respect to a second axis, which is perpendicular to the first axis. The matte surface is displaced relative to the optical arrangement to a second position along the first axis and the aforementioned steps are repeated for a plurality of relative positions of the matte surface along the first axis.