In cutting a band-shaped glass film along a longitudinal direction thereof and evaluating linearity of an end side formed in association with the cutting to inspect quality of a cut band-shaped glass film, the following steps are performed: an imaging step of dividing the end side into a plurality of segments and imaging each of the plurality of segments; a linear approximation step of calculating an approximate straight line of the end side based on a plurality of points different from each other on the end side in each of a plurality of images obtained in the imaging step; a variation calculation step of calculating a variation value of the plurality of points based on the approximate straight line; and an evaluation step of evaluating the linearity of the end side based on a plurality of variation values respectively corresponding to the plurality of images.

An apparatus and method for detecting edges or for seam tracking when machining workpieces by means of a laser beam, e.g. joining or cutting. The present invention provides an apparatus for seam tracking of the process in the laser material processing, comprising at least two separate illumination elements, each emitting differently polarized light and a polarization camera.

A system to measure object dimension using stereo vision is disclosed. The system includes a stereo camera, configured to capture a plurality of image frames corresponding to the object. The system includes an image recognition module, configured to detect one or more geometrical shapes of the object from the plurality of captured image frames and also configured to recognize one or more corner points of one or more detected geometrical shape of the object based on the plurality of captured image frames via a computer vision technique. The system includes a coordinate estimation module configured to estimate real-world X-axis, Y-axis and Z-axis coordinate of each of one or more recognized corner points in real time by a stereo triangulation technique. The system includes measuring real-world length, breadth and height of the object in real time by calculating Euclidean distance between estimated real-world X-axis, Y-axis and Z-axis coordinate.

Provided is a confocal sensor having a wider measuring range. A confocal sensor 1 comprises: a light source 10 that emits light at a plurality of wavelengths; a diffractive lens 130 that causes a chromatic aberration with respect to the light along an optical axis and focuses the light onto an object 200 without another intervening lens; a pinhole 120 through which reflected light passes, the reflected light being a portion of the light that was focused onto and reflected from the object 200 and focused by the diffractive lens 130; and a measuring unit 40 that measures the distance from the diffractive lens 130 to the object 200 on the basis of a wavelength of the reflected light. A distance L2 from the pinhole 120 to the diffractive lens 130 is variable.

An information processing device used in a mounting device including a mounting head for collecting components and arranging the components on a board. The imaging processing device includes a control section configured to acquire an image of a member having a straight line side, detect multiple edge points with respect to the straight line side to obtain a proximal straight line of the side, and perform detection processing for detecting the outer shape of the member by excluding edge points outside a predetermined range from the proximal straight line on the outside and inside of the member.

A method for determining an effective case depth of a metal component includes forming a conditioned core surface by blasting or shot peening an exposed surface of the metal component with blast media. The exposed surface is a contiguous exposed surface of the case and core. The method includes measuring surface texture, compressive stresses, or another suitable characteristic of the conditioned core surface using a surface metrology sensor, and identifying a case-core boundary using the measured characteristic, including identifying a location at which a predetermined difference or gradient in the characteristic is present within the exposed surface. The method also includes measuring the effective case depth as a perpendicular distance between a reference surface of the case and the case-core boundary.

A fish tape assembly comprising: a fish tape having a first and second opposite ends, configured to be pushed/pulled via a conduit pathway extending within a wall; a location indicator coupled to the fish tape, and configured to enable detecting a current location of the location indicator along a conduit pathway, through which the first end of the fish tape is being pushed; and a monitor, configured to enable receiving information that relates to the current location of the location indicator, thereby allowing generation of a three-dimensional (3D) map of the conduit pathway.

A deviation correction apparatus includes a width detecting apparatus configured to detect a width of a coating layer of an electrode plate, a processor communicatively connected with the width detecting apparatus and configured to determine a centerline position of the electrode plate based on the width of the coating layer, and a deviation correction mechanism configured to perform deviation correction for the electrode plate based on the centerline position of the electrode plate and a preset standard centerline position.

An edge position detecting apparatus for detecting a position of an edge of a disk-shaped workpiece includes a chuck table having a holding surface for holding the workpiece thereon, a laser displacement gage having a laser applying unit including a light source, for applying a linear laser beam shaped into a linear shape perpendicular to a direction of travel from the light source toward the holding surface, across the edge of the workpiece, and a beam detecting unit including a plurality of photoelectric transducers arrayed at predetermined spaced intervals along a direction for detecting a reflection of the linear laser beam, a moving mechanism for moving the laser displacement gage and the chuck table relatively to each other along the longitudinal direction, and a calculating unit for calculating the position of the edge on the basis of information of a change in an amount of the detected reflection.

A method for characterising structures etched in a substrate, such as a wafer is disclosed. The method includes at least one structure etched in the substrate, at least one imaging step including the following steps: capturing, with an imaging device positioned on a top side of said substrate, at least one image of a top surface of the substrate, and measuring a first data relating to the structure from at least one captured image, at least one interferometric measurement step, carried out with a low-coherence interferometer positioned on the top side, for measuring with a measurement beam positioned on the structure, at least one depth data relating to a depth of said structure; wherein the method also comprises a first adjusting step for adjusting said measurement beam according to the first data. A system implementing such a method is also disclosed.