Methods and apparatus for measuring light intensity are disclosed. The methods and apparatus can be used to verify an article, such as a reaction chamber. Exemplary apparatus include a first arm, a light source coupled to the first arm, a second arm, and a sensor coupled to the second arm. The sensor can receive light from the light source that is transmitted through at least a portion of the article.

A method for assessing the profile of a tool using a non-contact tool setting apparatus that includes a transmitter for emitting a light beam and a receiver for receiving the beam. The receiver generates a beam intensity signal describing the intensity of received light. The setting apparatus is mounted to a coordinate positioning apparatus that allows the tool to be moved relative to the setting apparatus. The method includes using the coordinate positioning apparatus to move the tool relative to the setting apparatus along a tool inspection path, the tool inspection path being selected so that the light beam is traced substantially along a periphery of the tool to be inspected. Beam intensity data is collected describing the beam intensity signal that is generated by the receiver as the tool inspection path is traversed and analysis of the collected beam intensity data is used to assess the tool profile.

In a measurement of a microscope image, a measurement can be conducted with high accuracy when measuring a measuring object including a step having a depth larger than a depth of focus or comparing patterns at different positions along the optical axis of a microscope. A microscope image measuring device includes: a microscope for obtaining a magnified image of a surface of a measuring object by irradiating the surface with white incident light; a spectral camera for obtaining a spectral image of the magnified image; and an image processing part for extracting the spectral image at each wavelength and performs an image measuring process. The microscope forms an image of a different focal position at each wavelength on the imaging surface of the spectral camera, and the image processing part extracts a spectral image with a wavelength where a measuring point has the highest contrast, and performs edge detection.

An apparatus and method for detecting edges or for seam tracking when machining workpieces by means of a laser beam, e.g. joining or cutting. The present invention provides an apparatus for seam tracking of the process in the laser material processing, comprising at least two separate illumination elements, each emitting differently polarized light and a polarization camera.

An assembly to connect together first and second sheet members. The assembly includes a pressure device that applies pressure to the sheet members while the sheet members are in an overlapping arrangement and positioned on a support platform. A sensing system that includes one or more thin film pressure sensors detects the positions of the leading and trailing edges. A connection device connects the members together in an overlapping arrangement.

A laser sensor module includes a first laser source configured to emit first modulated light, the first modulated light being modulated laser light. The laser sensor module further includes circuitry configured to drive the first laser source with a first modulated driving current to cause the first laser source to emit the modulated laser light, a detector configured to detect the modulated laser light, which induces a photocurrent with variations resulting from modulation of the modulated laser light, and a second laser source configured to emit second modulated light. The circuitry is further configured to drive the second laser source with a second modulated driving current to cause the second laser source to emit the second modulated light. The detector is configured to detect the second modulated light. The circuitry is configured to adapt the amplitude of the second modulated driving current to induce a contribution to the photocurrent.

There is provided an apparatus for determining the position of objects (2) advancing in line on a supporting plane belonging to a transport line (1). The apparatus includes, for determining the position of an object (2) on the supporting plane, sources (22A, 23A) of a first and a second light beam (220, 230) generating collimated beams (220, 230) with substantial point-like cross-sectional size, which propagate along paths defining a plane parallel to the supporting plane and forming acute angles with the advance direction (F), and detectors (22B, 23B) for the separate detection of the first and the second beam (220, 230). A processing unit (12) includes means for comparing the instants at which an object passes through each beam (220, 230) and for detecting, based on the comparison result, a possible offset of the position of the object (2) from a reference position.

The present invention relates to devices and methods for measuring a varnish jet for a varnishing process for electronic subassemblies. Said devices and methods allow the width and symmetry of the varnish jet to be determined without performing any relative movement between the varnish jet and the sensor.

A method for determining a reference focal position of a laser beam for processing a plate-like member, the method comprising producing at least two incisions in the plate-like member with the laser beam set at different focal positions, irradiating the plate-like member with the laser beam, detecting edges of the incisions by measuring one or more parameters relating to the irradiation of the plate-like member, and establishing a width of the at least two incisions using the detected one or more parameters.

Methods and systems for measuring a component of a drug delivery or storage device are described. The method comprises providing a light source in an opposing relationship with an optical imaging sensor; positioning a sample component on a positioning stage located between the at least one light source and at least one opposing optical imaging sensor; and illuminating, with the at least one light source, the sample component. The controller is operable to capture an image of the component, determine the location of a first outer edge point PI of the captured image; rotate the sample component relative to the optical image sensor, and collect n images separated from each other by x degrees of rotation, wherein n*x is ≥360 degrees. The controller may compare a measured position of the at least one outer edge point PI between the captured images to determine a degree or circular runout.