A parts supply device includes a stage having a placement surface on which a plurality of parts is placed, an imaging system configured to image the plurality of parts from an obliquely upward direction with respect to the placement surface of the stage, and a parts detection unit configured to detect positions and orientations of the plurality of parts on the placement surface of the stage based on image information obtained by the imaging system.

The present document discloses a method of determining thickness of a wet film, in particular of microfibrillated cellulose. The method comprises conveying said film (20) in a wet state on a conveyor (10) having a conveyor width, the wet film having a film width which is less than the conveyor width, providing a laser projection (1511) across a film edge, acquiring a series of images, each depicting an area of the conveyor, wherein the laser projection, a portion of the film and a portion of an exposed conveyor surface are visible, and using at least some of said images to determine at least one of a film thickness and a film thickness distribution across the film width. The document also discloses a method of forming a film, in particular a microfibrillated cellulose film, and a device for producing such film.

An intraoral scanner comprises a light source, a moveable opto-mechanical module, an axial actuator, and an image sensor. The light source is configured to generate light that is to be output onto an object external to the intraoral scanner. The moveable opto-mechanical module comprises integrated projection/imaging optics and an exit pupil, the projection/imaging optics having an optical axis, wherein the projection/imaging optics are entirely integrated into the moveable opto-mechanical module. The axial actuator is coupled to the projection/imaging optics and configured to move the moveable opto-mechanical module comprising an entirety of the projection/imaging optics in the optical axis to achieve a plurality of focus settings. The image sensor is configured to receive reflected light that has been reflected off of the object external to the intraoral scanner for the plurality of focus settings.

A method for measuring a surface of an object including at least one structure using low coherence optical interferometry, the method including the steps of acquiring an interferometric signal at a plurality of measurement points in a field of view and, for at least one measurement point, attributing the interferometric signal acquired to a class of interferometric signals from a plurality of classes, each of the classes being associated with a reference interferometric signal representative of a typical structure; and analysing the interferometric signal to derive therefrom an item of information on the structure at the measurement point, as a function of its class.

A system for the automated validation of a semi-anechoic chamber (SAC) is disclosed. The system includes a receive assembly and a transmit assembly, each configured to autonomously relocate within the SAC. The system also includes a local client communicatively coupled to the transmit assembly. The local client is configured to send a validation arrangement to the transmit assembly describing a validation location and a distance. The transmit assembly is configured to receive the validation arrangement, move the transmit assembly to the validation location and send an instruction to the receive assembly, the instruction describing the distance. The receive assembly is communicatively coupled to the transmit assembly and configured to receive the instruction and move the receive assembly such that a separation between the transmit and receive assemblies is restored to the distance. Each validation arrangement corresponds to a validation point. A plurality of validation points defines a test volume.

Various embodiments set forth techniques for characterizing films on optically clear substrates using ellipsometry. In some embodiments, a spectroscopic ellipsometer is configured to generate a light beam that has a relatively small spot size and is substantially absorbed by an optically clear substrate, thereby reducing or eliminating reflections from an interface between the substrate and air. Optical simulations can be performed to determine values for various parameters associated with the ellipsometer that minimize the reflections from the interface between the substrate and air and maximize reflections from an interface between a film and the substrate. In addition, graded films that include multiple layers can be analyzed using models of multiple layers.

A system detects properties of a material layer or an embedded component of a structure or its sub-structure. The system includes a detection layer which has reflective regions reflecting electromagnetic radiation and which is designed to be embedded into a structure or its sub-structure, and a detection device which is designed to output electromagnetic radiation in the direction of the detection layer and to receive electromagnetic radiation reflected by the reflective regions of the detection layer, wherein fibers reflecting electromagnetic radiation are arranged in the reflection regions of the detection layer.

A system detects properties of a material layer or an embedded component of a structure or its sub-structure. The system includes a detection layer which has reflective regions reflecting electromagnetic radiation and which is designed to be embedded into a structure or its sub-structure, and a detection device which is designed to output electromagnetic radiation in the direction of the detection layer and to receive electromagnetic radiation reflected by the reflective regions of the detection layer, wherein fibers reflecting electromagnetic radiation are arranged in the reflection regions of the detection layer.

A sensor system that obtains and processes time-of-flight data (TOF) is provided. A TOF sensor obtains raw data describing various surfaces. A processor applies an averaging filter to the raw data to smooth the raw data for increasing signal-to-noise ratio (SNR) of flat surfaces represented in the raw data, performs a depth compute process on the raw data, as filtered, to generate distance data, generates a point cloud based on the distance data, and identifies the Z-planes in the point cloud.

A measuring instrument includes a light source, a scanning mirror configured to position the light emitted by the light source at coordinates specified by an X-coordinate and a Y-coordinate on a plate-shaped workpiece held on a chuck table, a diffusing film onto which reflected light is projected, the reflected light forming a spectral interference waveform by being reflected from a top surface and an undersurface of the plate-shaped workpiece held on the chuck table, a light detector configured to detect light intensities corresponding to wavelengths of the spectral interference waveform projected onto the diffusing film, a memory configured to store, for each coordinate, the light intensities corresponding to the wavelengths and being detected by the light detector, and a calculating section configured to calculate a thickness at each coordinate by performing a Fourier transform of the light intensities corresponding to the wavelengths and being stored in the memory.