G01B21/08

LITHIATION DEVICE

This application discloses a lithiation device for applying a lithium film on an electrode plate. The lithiation device includes: a rolling mechanism including a first roller and a second roller, the two rollers configured to roll the electrode plate and the lithium film to apply the lithium film on the electrode plate; an adjustment mechanism connected to the rolling mechanism and configured to adjust a gap and/or a rolling force between the first roller and the second roller; a first monitoring mechanism configured to monitor a length of the electrode plate after the electrode plate passes through the rolling mechanism; and a controller configured to control the adjustment mechanism based on a comparison result of the length monitored by the first monitoring mechanism and a target length so that the length of the electrode plate after the electrode plate passes through the rolling mechanism approximates to the target length.

Method of Managing Sliding Region of Electrode
20230131033 · 2023-04-27 · ·

The present technology relates to a method of managing a sliding region of an electrode, and the method includes: determining a specific region where a positive electrode and a negative electrode, which are subjects of management to be used in manufacturing an electrode assembly, face each other and setting a measurement location in the specific region; measuring a thickness and a loading amount of each electrode mixture layer of the positive electrode and the negative electrode at the set measurement location; measuring a thickness and a loading amount of an electrode mixture layer at each central portion of the positive electrode and the negative electrode; and calculating a ratio of the thickness of the electrode mixture layer of the positive electrode and the negative electrode to the thickness of the central portion.

APPARATUS FOR ESTIMATING ROAD PROFILE AND METHOD THEREOF
20230130001 · 2023-04-27 · ·

Disclosed is an apparatus and method for estimating a road profile for a vehicle. The apparatus includes a camera, processors, and a controller. The processors are configured to obtain a state of the vehicle including a behavior of the vehicle, and obtain a road height from information provided by the camera. The controller is configured to estimate the road profile by changing coordinates of the camera according to the behavior of the vehicle based on a vehicle height, compensating for the road height and a recognition road distance, and matching and filtering multiple road heights.

APPARATUS FOR ESTIMATING ROAD PROFILE AND METHOD THEREOF
20230130001 · 2023-04-27 · ·

Disclosed is an apparatus and method for estimating a road profile for a vehicle. The apparatus includes a camera, processors, and a controller. The processors are configured to obtain a state of the vehicle including a behavior of the vehicle, and obtain a road height from information provided by the camera. The controller is configured to estimate the road profile by changing coordinates of the camera according to the behavior of the vehicle based on a vehicle height, compensating for the road height and a recognition road distance, and matching and filtering multiple road heights.

Portable optic metrology thermal chamber module and method therefor
11635344 · 2023-04-25 · ·

A portable optic metrology thermal chamber module including a housing defining a thermal chamber, with a thermally isolated environment arranged for holding an optic device under test, the housing having an optic stimulus entry aperture configured for entry of a stimulus beam, from a metrology system stimulus source through the entry aperture onto an entry pupil of the device to an image analyzer, and a module mount coupling to modularly mount the portable optic metrology thermal chamber module to a support of a metrology system of the metrology system stimulus source so as to removably couple the portable optic metrology thermal chamber module as a unit to the support in a predetermined position relative to the metrology system stimulus source, and the housing is sized and shaped so that the portable optic metrology thermal chamber module is portable as a unit for moving to and removing from the predetermined position.

PRODUCT REMOVAL APPARATUS, TREATMENT SYSTEM, AND PRODUCT REMOVAL METHOD
20230119979 · 2023-04-20 ·

The present disclosure provides a product removal apparatus, a treatment system, and a product removal method that can sufficiently remove the products deposited inside a vacuum pump and also suppress corrosion of the base material of the vacuum pump. The product removal apparatus of the present disclosure includes: a sensor for measuring the temperature of the inside of a vacuum pump, the thickness of a film of a product in a flow path in the vacuum pump, or the vibration frequency of the vacuum pump; a gas supplier for supplying a gas containing hydrogen halide, fluorine, chlorine, chlorine trifluoride, or fluorine radicals to the vacuum pump; and a control device. The control device controls the gas supplier so that the supply of the gas to the vacuum pump is stopped depending on a rate of temperature increase calculated from the temperature measured by the sensor, the film thickness, or the vibration frequency.

PRODUCT REMOVAL APPARATUS, TREATMENT SYSTEM, AND PRODUCT REMOVAL METHOD
20230119979 · 2023-04-20 ·

The present disclosure provides a product removal apparatus, a treatment system, and a product removal method that can sufficiently remove the products deposited inside a vacuum pump and also suppress corrosion of the base material of the vacuum pump. The product removal apparatus of the present disclosure includes: a sensor for measuring the temperature of the inside of a vacuum pump, the thickness of a film of a product in a flow path in the vacuum pump, or the vibration frequency of the vacuum pump; a gas supplier for supplying a gas containing hydrogen halide, fluorine, chlorine, chlorine trifluoride, or fluorine radicals to the vacuum pump; and a control device. The control device controls the gas supplier so that the supply of the gas to the vacuum pump is stopped depending on a rate of temperature increase calculated from the temperature measured by the sensor, the film thickness, or the vibration frequency.

MEDIUM THICKNESS DETECTION MECHANISM
20220326647 · 2022-10-13 ·

A thickness detection mechanism arranged in a scanner or printer for measuring the thickness of mediums fed through the scanner or printer, which comprising: a conveyor section; at least a idle roller set arranged above the conveyor section, which includes at least a shaft and an idle roller pivotally arranged on the shaft; at least an elastic portion arranged above the shaft; and at least a pressure sensor secured on the elastic portion; wherein the thickness detection mechanism measures the thickness of the medium by measuring the pressure applied on the pressure sensor by the idle roller set as the idle roller set being pushed upward, and thus avoids the medium too thin or too thick to enter the scanner or the printer.

MEDIUM THICKNESS DETECTION MECHANISM
20220326647 · 2022-10-13 ·

A thickness detection mechanism arranged in a scanner or printer for measuring the thickness of mediums fed through the scanner or printer, which comprising: a conveyor section; at least a idle roller set arranged above the conveyor section, which includes at least a shaft and an idle roller pivotally arranged on the shaft; at least an elastic portion arranged above the shaft; and at least a pressure sensor secured on the elastic portion; wherein the thickness detection mechanism measures the thickness of the medium by measuring the pressure applied on the pressure sensor by the idle roller set as the idle roller set being pushed upward, and thus avoids the medium too thin or too thick to enter the scanner or the printer.

PROCESS CONTROL SYSTEM AND OPERATING METHOD THEREFOR

A process control system according to one embodiment of the present invention comprises: a first system for generating thickness information about an internal defect layer included in a carbon steel product; and a second system which receives the thickness information about the internal defect layer from the first system through a network, and which controls an etching process for removing at least a part of the internal defect layer from the carbon steel product by using the thickness information about the internal defect layer, wherein the first system provides the second system with a calculation module necessary for the second system to control the etching process, and the second system provides the first system with the information necessary for the first system to update the calculation module.