A device may include a flexible material defining an exterior of a cavity, an interior electrode located within the cavity, a first peripheral electrode peripherally located with respect to the interior electrode on a first side of the interior electrode, a second peripheral electrode peripherally located with respect to the interior electrode on a second side of the interior electrode where the interior electrode is between the first peripheral electrode and the second peripheral electrode, a controller electrically connected to the interior electrode, the first peripheral electrode, and the second peripheral electrode, and programmed instructions written into memory of the controller where the programmed instructions cause the controller, when executed to measure a first capacitance between the first peripheral electrode and the interior electrode and measure a second capacitance between the second peripheral electrode and the interior electrode.

The invention relates to a THz measuring device (2) for measuring a test object (8), in particular a pipe (8), including a first THz transceiver (3) which outputs a first THz beam (10) with a first polarization plane along an optical axis (A) through a measuring chamber (7), a first polarization mirror (4) designed to reflect the first THz beam (10) passing through the measuring chamber (7) back to the first THz transceiver (3) along the optical axis (A), a second THz transceiver (5), designed to output a second THz beam (11) which is polarized in a second polarization plane that is different, in particular orthogonal, from the first polarization plane, a second polarization mirror (6), designed to reflect the second THz beam (11) passing through the measuring chamber (7) along the optical axis (A) through the measuring chamber (7) back to the second Transceiver (5), wherein the THz beams pass through the respective other polarization mirrors without being substantially influenced, and the measuring signals (S1, S2) of the THz transceivers (3, 5) are correlated with each other so as to determine layer thicknesses (d1, d2) and/or a refractive index (n) of the tested object (8).

An apparatus, system, or method for performing work on electrical power lines and/or splices on electrical power lines that may include an unmanned aerial vehicle (UAV), a power line measurement device, a support frame selectively releasably attached to the UAV, and a plurality of flexible dielectric attachment lines attaching the power line device to the support frame. The power line measurement device configured to determine measurement data by measuring a width of a live electrical power line and/or a splice on the electrical power line. Each of the attachment lines may be attached to a corresponding attachment point on the support frame and a corresponding attachment point on the power line measurement device.

A sensor system includes an eddy current sensor including at least one coil with excitation electronics coupled across the coil. An optical displacement sensor is secured to the eddy current sensor so that a vertical distance between the sensors is fixed. The optical displacement sensor is located on top of and concentric with the coil so that a measurement axis of the optical displacement sensor is collinear with an axis of symmetry of the coil. A computing device including a processor and memory is coupled to receive sensor data from the eddy current sensor and the optical displacement sensor that is adapted for analyzing the sensor data obtained from measuring a coated substrate including a coating layer on at least one side of a metal substrate to determine at least a thickness of the coating layer.

We describe apparatus for measurement of thickness and topography of slabs of materials employing probes with filters using polarization maintaining fibers.

The present subject matter at least provides an apparatus for characterization of a slab of a material. The apparatus comprises two or more frequency-domain optical-coherence tomography (FD-OCT) probes configured for irradiating the slab of material, and detecting radiation reflected from the slab of material or transmitted there-through. Further, a centralized actuation-mechanism is connected to the OCT probes for simultaneously actuating elements in each of the OCT probes to cause a synchronized detection of the radiation from the slab of material. A spectral-analysis module is provided for analyzing at least an interference pattern with respect to each of the OCT probes to thereby determine at least one of thickness and topography of the slab of the material. Further, in some embodiments, the slab of material may include a passivation layer. The apparatus may be configured to determine a thickness of the passivation layer.

A capacitance sensor may be positioned to detect size changes in objects. The sensor may be constructed with to use mutual capacitance or self-capacitance to detect the size changes.

A device may include a flexible material defining an exterior of a cavity, an interior electrode located within the cavity, a first peripheral electrode peripherally located with respect to the interior electrode on a first side of the interior electrode, a second peripheral electrode peripherally located with respect to the interior electrode on a second side of the interior electrode where the interior electrode is between the first peripheral electrode and the second peripheral electrode, a controller electrically connected to the interior electrode, the first peripheral electrode, and the second peripheral electrode, and programmed instructions written into memory of the controller where the programmed instructions cause the controller, when executed to measure a first capacitance between the first peripheral electrode and the interior electrode and measure a second capacitance between the second peripheral electrode and the interior electrode.

A capacitance sensor may be positioned to detect size changes in objects. The sensor may be constructed with to use mutual capacitance or self-capacitance to detect the size changes.

A capacitance sensor may be positioned to detect size changes in objects. The sensor may be constructed with to use mutual capacitance or self-capacitance to detect the size changes.