Patent classifications
G
PHYSICS
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G01
MEASURING; TESTING
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G01J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
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1/00
Photometry, e.g. photographic exposure meter
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G01J1/10
by comparison with reference light or electric value; provisionally void
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G01J1/20
intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle
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G01J1/20

Characteristic value correction device, characteristic value calculation device, inspection device including the same, characteristic value correction method, light-emitting device, and characteristic value correction program
12429374 · 2025-09-30 · ·

A characteristic value correction device includes a waveform acquiring unit, an area calculating unit, a time calculating unit, and a correction coefficient calculating unit. The waveform acquiring unit is configured to acquire a waveform indicating a relationship between an elapsed time and a first current value obtained when the pulse current is applied to a light-emitting device. The area calculating unit is configured to calculate a first area of an entire waveform and a second area of a rectangular wave portion. The time calculating unit is configured to calculate a first time between an application start time and an application end time of the pulse current and a second time corresponding to the second area. The correction coefficient calculating unit is configured to obtain a correction coefficient based on a ratio between the first area and the second area and a ratio between the first time and the second time.