An automotive lamp is capable of controlling a light distribution pattern PTN based on an image captured by a camera unit. The automotive lamp is capable of switching between multiple control modes designed with different combinations of the spatial resolution of the light distribution pattern PTN and the update speed of the light distribution pattern PTN.

An optical inspection system includes a brightness inspection module for inspecting the brightness of a light emitting element, an integrated inspection module for inspecting the near field optical characteristic and the beam quality factor of the light emitting element, and a far field inspection module for inspecting the far field optical characteristic of the light emitting element. As a result, the optical inspection system is space-saving and capable of reducing the distance and time of the movement of the device under test.

The present disclosure relates to a measuring system for measuring a light source in a polarization-independent manner, having a camera comprising a plurality of image sensors arranged in the form of a matrix, and a microscope optics, and to a method for measuring the light sources in a polarization-independent manner. The aim is to make it possible to measure the light output of the light source in an improved, simple and largely polarization-independent manner while maintaining the spatial resolution in the microscopic range. To that end, the present disclosure proposes that a linear polarizer is associated with each of the image sensors, wherein the linear polarizers are arranged in the form of a matrix in front of the image sensors and two or more, preferably four, polarizers form a matrix block, wherein the transmission directions of adjacent linear polarizers within a matrix block are rotated relative to one another, preferably by 45° or by 90°. In the method according to the present disclosure, the measurement signals of the image sensors that are associated with the polarizers of the same matrix block are converted into light output measured values in order to obtain the desired polarization independence.

Embodiments of the present disclosure relate to optical devices for augmented, virtual, and/or mixed reality applications. In one or more embodiments, an optical device metrology system is configured to measure a plurality of first metrics and one or more second metrics for optical devices, the one or more second metrics including a display leakage metric.

A device including a plurality of epitaxial chips is disclosed. An epitaxial chip can have one or more of a light source and a detector, where the detector can be configured to measure the optical properties of the light emitted by a light source. In some examples, one or more epitaxial chips can have one or more optical properties that differ from other epitaxial chips. The epitaxial chips can be dependently operable. For example, the detector located on one epitaxial chip can be configured for measuring the optical properties of light emitted by a light source located on another epitaxial chip by way of one or more optical signals. The collection of epitaxial chips can also allow detection of a plurality of laser outputs, where two or more epitaxial chips can have different material and/or optical properties.

Wearable devices for monitoring light sources, and light fixtures are presented. For instance, a device includes a light detection sensor, a user interface device, and a controller operably coupled to the light detection sensor and the user interface device. The controller configured to: monitor a plurality of light sources for an availability status indication; determine, from the status data availability indication, that status data of the equipment is available from the light source; receive a modulated light signal from the light source; decode the modulated light signal into decoded status data; determine a status of the equipment based on the decoded status data; process the decoded status data to determine a diagnosis of the equipment; and indicate via the user interface device the diagnosis of the equipment and a diagnostic action related thereto. The light fixture includes a light source and a controller operably coupled to the light source, The controller is configured to receive status data from equipment, encode the status data in a modulated light signal, and output the modulated light signal using the light source.

The present disclosure discloses an infrared sensor, an infrared gas detector and an air quality detection device. The infrared sensor includes electrodes, a substrate, an isolation layer and a graphene film. The graphene film has a periodical nanostructure. The infrared sensor enhances the absorption of infrared light, and is capable of only absorbing specific infrared wavelengths, thus improving the selective performance of the infrared gas detector.

In one aspect, luminaires are described herein having sensor modules integrated therein. In one aspect, a luminaire described herein comprises a light emitting face including a LED assembly. A sensor module is integrated into the luminaire at a position at least partially overlapping the light emitting face. In another aspect, a luminaire described herein comprises a LED assembly and a driver assembly. A sensor module is integrated into the luminaire along or more convective air current pathways cooling the LED assembly or driver assembly.

A device for measuring two-dimensional flicker of the present application includes a plurality of two-dimensional sensors having a partial readout function of reading out only a pixel value of some of photoelectric conversion elements included in set partial readout regions, among a plurality of photoelectric conversion elements. In the device for measuring two-dimensional flicker, a plurality of measurement regions are set two-dimensionally on a measurement target object. Each pixel in the plurality of measurement regions is individually acquired, by setting each of the plurality of partial readout regions of the plurality of two-dimensional sensors in each of a plurality of partial imaging regions obtained by dividing an entire imaging region including entirely the measurement target object. A flicker value of the plurality of measurement regions is individually obtained based on each pixel value in the plurality of measurement regions.

A device including a plurality of epitaxial chips is disclosed. An epitaxial chip can have one or more of a light source and a detector, where the detector can be configured to measure the optical properties of the light emitted by a light source. In some examples, one or more epitaxial chips can have one or more optical properties that differ from other epitaxial chips. The epitaxial chips can be dependently operable. For example, the detector located on one epitaxial chip can be configured for measuring the optical properties of light emitted by a light source located on another epitaxial chip by way of one or more optical signals. The collection of epitaxial chips can also allow detection of a plurality of laser outputs, where two or more epitaxial chips can have different material and/or optical properties.