Systems and methods are provided for a UV-VIS spectrophotometer, such as a UV-VIS detector unit included in a high-performance liquid chromatography system. In one example, a system for the UV-VIS detector unit may include a first light source, a signal detector, a flow path positioned intermediate the first light source and the signal detector, a second light source, and a reference detector. The first light source, the signal detector, and the flow path may be aligned along a first axis, and the second light source and the reference detector may be aligned along a second axis, different than the first axis.

Improved optical absorption spectroscopy of species having broad spectral features is provided by choosing frequencies to cover the spectral feature(s) of interest, where the frequencies are slightly adjusted as needed to avoid narrow spectral features from interfering chemical species (i.e., clutter). The resulting clutter avoidance provides improved optical spectroscopy of species having broad spectral features.

Provided is a measurement device including a spectroscope, a movement mechanism configured to relatively move the spectroscope along a first direction with respect to the measurement target, and one or more processors configured to execute detecting a measurement error indicating that spectroscopic measurement processing by the spectroscope is not executed normally, and controlling the spectroscope and the movement mechanism, in which the one or more processors, when the measurement target is a plurality of color patches arranged along the first direction, cause the spectroscope to execute first measurement processing of measuring light with a specific wavelength set in advance while relatively moving the spectroscope in the first direction to acquire a measured value with respect to the specific wavelength obtained by the first measurement processing and a position of the spectroscope, and when the measurement error is detected, move the spectroscope to a position where an amount of variation of the measured value is greater than or equal to a threshold value in a second direction opposite to the first direction and then move the spectroscope in the first direction.

Systems and methods are provided for a UV-VIS spectrophotometer, such as a UV-VIS detector unit included in a high-performance liquid chromatography system. In one example, a system for the UV-VIS detector unit may include a first light source, a signal detector, a flow path positioned intermediate the first light source and the signal detector, a second light source, and a reference detector. The first light source, the signal detector, and the flow path may be aligned along a first axis, and the second light source and the reference detector may be aligned along a second axis, different than the first axis.

A film thickness measuring apparatus includes a light irradiation unit configured to irradiate an object with light in a planar shape, an optical element having a transmittance and a reflectance changing according to wavelengths in a predetermined wavelength range, the optical element being configured to separate light from the object by transmitting and reflecting the light, an imaging unit configured to photograph light separated by the optical element, and an analysis unit configured to estimate a film thickness of the object based on a signal from the imaging unit photographing light, in which the light irradiation unit emits light having a wavelength included in the predetermined wavelength range of the optical element.

Disclosed is an instrument analyzing elemental composition of a sample, including a measurement assembly including: an exciter generating an excitation directed at a target position to cause emission from the sample; a detector assembly receiving the emission from the sample at the target position, arranged to generate one or more measurement signals that are descriptive of the emission; an imaging apparatus for capturing images of an area around the target position; and a controller for carrying out a measurement, arranged to operate the exciter to generate the excitation and to carry out analysis of the elemental composition of the sample based on the measurement signals. The controller performs reliability analysis associated with the measurement by operating the imaging apparatus to capture images of the sample, determining estimated reliability of the measurement based on the captured images, and selectively issuing an indication of measurement reliability based on the estimated reliability.

Aspects of the disclosure provide for a method. In some examples, the method includes printing a target plot comprising a color ramp, scanning the target plot via a first image scanner to determine first scan results indicating a relationship between a scanned measurement determined by the first image scanner and lightness of a scanned portion of the target plot, scanning the target plot via a second image scanner to determine second scan results indicating a relationship between a scanned measurement determined by the second image scanner and lightness of the scanned portion of the target plot, and determining a lookup table indicating a difference determined based on the first scan results and the second scan results.

A biological tissue analyzing device configured to analyze a biological tissue using hyperspectral data in which spectral information is associated with each of pixels forming a two-dimensional image and comprising the following (i) and (ii), as well as comprising (iii) and/or (iv): (i) a hyperspectral data acquisition unit configured to acquire the hyperspectral data; (ii) an analysis target region extraction unit configured to extract pixels corresponding to an analysis target region from a two-dimensional image of the biological tissue; (iii) an altered state classification unit configured to roughly classify an altered state of the biological tissue with unsupervised learning; and (iv) an altered state identification unit configured to identify the altered state of the biological tissue with supervised learning.

Embodiments disclosed herein include an optical sensor system for use in plasma processing tools. In an embodiment, the optical sensor system, comprises an optically clear body with a first surface and a second surface facing away from the first surface. In an embodiment, the optically clear body further comprises a third surface that is recessed from the second surface. In an embodiment, the optical sensor system further comprises a target over the third surface and a first reflector to optically couple the first surface to the target.

Systems and methods here may be used for automated capturing and analyzing spectrometer data of multiple sample gemstones on a stage, including mapping digital camera image data of samples, applying a Raman Probe to a first sample gemstone under evaluation on the stage, receiving spectrometer data of the sample gemstone from the probe, automatically moving the stage to a second sample, using the image data, and analyzing the other samples.