An optical filter, a spectrometer including the optical filter, and an electronic apparatus including the optical filter are disclosed. The optical filter includes a first reflector including a plurality of first structures that are periodically two-dimensionally arranged, each of the first structures having a ring shape, and a second reflector spaced apart from the first reflector and including a plurality of second structures that are periodically two-dimensionally arranged.

An imaging apparatus includes an image sensor, a filter array disposed on an optical path from a target object to the image sensor and including two-dimensionally-arranged optical filters, and a processing circuit that generates at least four pieces of spectral image data based on an image acquired by the image sensor. The optical filters include various types of optical filters with different spectral transmittance. Each of the at least four pieces of spectral image data indicates an image corresponding to one of at least four wavelength bands. The filter array includes at least one characteristic section. The processing circuit detects a relative position between the filter array and the image sensor based on the at least one characteristic section in the image acquired by the image sensor, and compensates for deviation between the relative position and a preliminarily-set relative position when the processing circuit detects the deviation.

A spectral camera control device, being installed, along with a spectral camera provided with a liquid crystal tunable filter, in an aircraft capable of stationary flight. The spectral camera control device causes the spectral camera to capture a spectral image in a snapshot mode each time a transmission wavelength of the liquid crystal tunable filter is switched while the aircraft is in stationary flight, and the spectral camera control device causes a plurality of spectral images to be captured in succession at a same transmission wavelength when an SN ratio of the captured spectral image is less than a predetermined threshold.

The invention relates to a device for conducting radiation, a photodetector arrangement, and a method for spatially resolved spectral analysis.

The invention discloses a Trace Microanalysis Microscope System for high throughput screening. A multimodal imaging sensor arrangement acquires color, multispectral, hyperspectral and multi-directional polarized imaging, independently and in combinations thereof. In one aspect of this disclosure, the multimodal acquisition is combined with a plurality of sample illumination modes, further expanding the dimensionality of the generated data. In another aspect of this invention, machine learning-based methods combining and comparing a- priori data with the acquired multimodal data space, provide unique identifiers for the composition of the analyzed target objects. In yet another aspect of this invention, projection mapping of the identified compositional features navigates secondary sampling for subsequent analyses.

Devices and methods of the present technology utilize wavelength-dependent transmittance of 2D materials to identify the wavelength of an electromagnetic radiation. A wide range of 2D materials can be used, making possible the use of the technology over a large portion of the electromagnetic spectrum, from gamma rays to the far infrared. When combined with appropriate algorithms and artificial intelligence, the technology can identify the wavelength of one or more monochromatic sources, or can identify color through the use of a training set. When applied in an array format, the technology can provide color imaging or spectral imaging using different regions of the electromagnetic spectrum.

A temperature compensation method for wavelength monitoring using spectrometers on photonic integrated chips and a related temperature-compensated wavelength monitoring device include an optical filter of the chip filters a source signal to provide at least one spectral reference line to a first spectrometer to detect thermal wavelength drifts thereof. At least one spectral line to be monitored is received by the same or another spectrometer of the chip to detect wavelength shifts thereof. The detected thermal drift of the reference line is compared to calibrated thermal drifts for the reference line which is associated with a calibrated thermal drift for the spectral response curve of the spectrometer receiving the spectral line to be monitored. A thermal drift rate for the response curve of the optical filter differs from a thermal drift rate for the response curve of the first spectrometer at least by an amount.

Provided are a bandpass filter having a high light transmittance in a transmission band and a wide wavelength range showing a high transmittance in the transmission band, and a sensor. The bandpass filter is a bandpass filter including a reflective member A and a reflective member B, in which a difference between a reflection center wavelength of the reflective member A and a reflection center wavelength of the reflective member B is larger than a sum of a half width at half maximum of a reflection band of the reflective member A and a half width at half maximum of a reflection band of the reflective member B; the reflective member A has a first cholesteric liquid crystal layer and a second cholesteric liquid crystal layer, and birefringence Δn1 of the first cholesteric liquid crystal layer is larger than birefringence Δn2 of the second cholesteric liquid crystal layer; and the reflective member B has a third cholesteric liquid crystal layer and a fourth cholesteric liquid crystal layer, and birefringence Δn3 of the third cholesteric liquid crystal layer is larger than birefringence Δn4 of the fourth cholesteric liquid crystal layer.

A spectroscopic camera includes a spectroscopic element and a light receiver, and a method for correcting the spectroscopic camera includes causing light having a first wave number from a spectroscopic light source to be incident on the spectroscopic element, causing the light receiver to receive light having a second wave number and outputted from the spectroscopic element, generating a matrix representing the spectral characteristics of the light having the second wave number based on the output from the light receiver, and generating a correction matrix based on the inverse matrix of the matrix and storing the correction matrix in a storage section.

A nano-structured optical wavelength transmission filter is provided. The optical filter includes a patterned substrate on which a high refractive index dielectric waveguide is arranged. A low index dielectric layer is arranged on the high refractive index dielectric waveguide, on which an array of metallic nanostructures is arranged. The layers of the optical filter have conformal shapes defined by a patterned surface of the substrate. An optical filter system includes the optical transmission filter and a detector array fixed to the substrate. A spectrometer includes at least one optical transmission filter and/or at least one said optical transmission filter system, and has a spectral resolution of lower than 30 nm for incident light having a wavelength between 300 nm and 790 nm. A method of fabrication of an optical filter, an optical filter system and a spectrometer is also described.