Patent classifications
G01J3/30
Tube furnace device for an atomizing furnace
The invention relates to a tube furnace device for an atomizing furnace and to an analyzing apparatus comprising an atomizing furnace and a tube furnace device, in particular for atomic absorption spectrometry, the tube furnace device comprising a sample carrier means (11) and a bearing means (12) for supporting and forming electrical contact with the sample carrier means, the sample carrier means having a receiving tube (16) forming a tubular receiving space (17) for receiving an analyte, the sample carrier means having two bearing protrusions on the receiving tube for forming a connection with the bearing means, the bearing protrusions extending perpendicularly, preferably orthogonally, in relation to a longitudinal axis of the receiving tube, wherein the tube furnace device has a contact pressure means (13) via which a contact pressure force (14) can be exerted on the bearing protrusions in the direction of a passant line (20) in relation to a circular cross section (21) of the receiving tube.
Optical measurements with dynamic range and high speed
A system for providing optical measurements and detection in optical spectrum analyzers (OSAs) with high dynamic range and high speed is disclosed. The system may include a slit to allow inward passage of an optical beam. The system may also include an optical portion to receive the optical beam. In some examples, the optical portion may include at least one optical splitter to split the optical beam into at least two optical paths. The system may also include an electrical portion to receive the optical beams split into the at least two optical paths. In some examples, the electrical portion may include at least one photodetector to receive each of the split optical beam. The electrical portion may also include at least one amplifier communicatively coupled to each of the at least one photodetector to amplify the split optical beam. The electrical portion may further include at least one analog-to-digital converter (ADC) communicatively coupled to each of the at least one amplifier to convert the split optical beams into digital signals.
Carbon dioxide capture system and spectroscopic evaluation thereof
A chemical processing system for removing carbon dioxide from a gas mixture using a multicomponent amine-based scrubbing solution includes a spectroscopic evaluation system with a liquid contact probe for spectroscopic investigation, an energy source connected with the liquid contact probe to provide the spectroscopic stimulation energy to the probe, a spectrometer connected with the liquid contact probe to detect the spectroscopic response energy to the probe and to output spectral data corresponding to the spectroscopic response energy, and a machine learning spectral data analyzer connected to the spectrometer for evaluation of the spectral data to determine a concentration value for each of water, amine component and captured carbon dioxide in the scrubbing solution, the machine learning spectral data analyzer being trained for each such component over a corresponding trained concentration range, and optionally over a trained temperature range to provide a temperature-compensated concentration value.
Heating chamber, heating furnace, analysis device, and method for analyzing foreign matter contents in samples
A heating chamber (1) for a heating furnace is proposed, with which electrothermal vaporization of impurities from samples can be effected in order to be able to then analyze them spectrometrically. The heating chamber has a wall (3), a sample reception area (5), a nozzle area (7) and two electrical connection areas (9, 11). The heating chamber (1) is specially configured such that an electric current flows through the wall (3) in such a way that a heating capacity caused by it is higher in the nozzle area (7) than in the sample reception area (5). For example, the electrical connection areas (9, 11) may be arranged in a radial direction remoter from the longitudinal axis (8) than a part of the wall (3) surrounding the nozzle area (7), and the heating chamber (1) may be configured, for example by means of a locally constricted area (13), in such a way that the current between the two electrical connection areas (9, 11) is predominantly conducted radially inwards towards the part of the wall (3) surrounding the nozzle area (7). Advantageous heat distribution in the heating chamber (1) achievable thereby may have a positive effect on the analysis of sample impurities.
Apparatus and methods for endometrial tissue identification
Exemplary embodiments of the present disclosure include apparatus and methods to identify endometrial tissue.
Light measuring probes, light measuring systems, and related methods
A system for measuring light in a tube is provided. The system includes a tube, a light collecting probe configured to absorb light within the tube, a data acquisition system for determining a level of light associated with light absorbed by the light collecting probe, and a motion system for moving the light collecting probe within the tube.
Light measuring probes, light measuring systems, and related methods
A system for measuring light in a tube is provided. The system includes a tube, a light collecting probe configured to absorb light within the tube, a data acquisition system for determining a level of light associated with light absorbed by the light collecting probe, and a motion system for moving the light collecting probe within the tube.
Microscopy method
A microscopy method includes illuminating an object with illumination light, recording a first color image of the illuminated object by a color image sensor suitable for recording colors of a first gamut, producing a second color image of the object, the second color image including pixels that each have assigned a color from a second gamut, depicting the second color image by a display apparatus suitable for rendering colors of the second gamut, wherein the producing the second color image includes determining the colors at the pixels of the second color image by applying a color transfer function to the colors of the corresponding pixels of the first color image, the color transfer function mapping input colors onto output colors, and the color transfer function mapping those input colors that belong to the first gamut but not to the second gamut onto output colors that belong to the second gamut.
Substrate processing apparatus, substrate processing module, and semiconductor device fabrication method
A substrate processing module includes a process chamber configured to perform a treatment process on a substrate; a transfer chamber provided on a first side of the process chamber, the substrate being transferred between the process chamber and the transfer chamber; an optical emission spectroscopy (OES) system provided on a second side of the process chamber and configured to monitor the process chamber; and a reference light source disposed in the transfer chamber and configured to emit a reference light to calibrate the OES system.
LIGHT MEASURING PROBES, LIGHT MEASURING SYSTEMS, AND RELATED METHODS
A system for measuring light in a tube is provided. The system includes a tube, a light collecting probe configured to absorb light within the tube, a data acquisition system for determining a level of light associated with light absorbed by the light collecting probe, and a motion system for moving the light collecting probe within the tube.