G01J3/45

RADIO FREQUENCY TAGGING OPTICAL SPECTROMETER AND METHOD FOR MEASUREMENTS OF OPTICAL SPECTRA
20230152156 · 2023-05-18 ·

The present disclosure provides a radio frequency tagging optical spectrometer, comprising: a dynamic dispersion device, the dynamic dispersion device receiving a beam comprising more than two wavelength components and being driven by driving radio frequency signals, and the dynamic dispersion device encoding the intensity of each wavelength component into the amplitude of a different beat radio frequency signal based on different driving radio frequency signals, wherein the beat frequency of the different beat radio frequency signal is equal to the frequency of the corresponding driving radio frequency signal; a single-channel photodetector for detecting the sum of beat radio frequency signals formed by adding all the beat radio frequency signals; and a processing unit for performing Fourier transform on the sum of the beat radio frequency signals to obtain a spectrum or an associated radio frequency spectrum by which the optical spectrum is obtained.

SEMICONDUCTOR MODE-LOCKED LASER DUAL COMB SYSTEM
20230208101 · 2023-06-29 ·

A photonic integrated circuit-based dual frequency comb source, an integrated system for dual comb spectroscopy and corresponding method are disclosed. The dual comb source includes, on a same substrate of the photonic integrated circuit, a first and second semiconductor integrated mode-locked laser, a master laser, and connection arrangement between the master laser and each of the first and second mode-locked laser. The master laser is configured for generating a lasing line for simultaneous optical injection-locking of the first and second mode-locked laser, the first and second mode-locked laser are configured for generating a first and second frequency comb respectively, and the connection arrangement is suitable for coherently transferring lasing light from the master laser to each mode-locked laser. The mode-locked lasers include a gain section and a saturable absorber section to provide mode-locking, and an extended optical cavity formed in the substrate.

SEMICONDUCTOR MODE-LOCKED LASER DUAL COMB SYSTEM
20230208101 · 2023-06-29 ·

A photonic integrated circuit-based dual frequency comb source, an integrated system for dual comb spectroscopy and corresponding method are disclosed. The dual comb source includes, on a same substrate of the photonic integrated circuit, a first and second semiconductor integrated mode-locked laser, a master laser, and connection arrangement between the master laser and each of the first and second mode-locked laser. The master laser is configured for generating a lasing line for simultaneous optical injection-locking of the first and second mode-locked laser, the first and second mode-locked laser are configured for generating a first and second frequency comb respectively, and the connection arrangement is suitable for coherently transferring lasing light from the master laser to each mode-locked laser. The mode-locked lasers include a gain section and a saturable absorber section to provide mode-locking, and an extended optical cavity formed in the substrate.

METHOD AND SYSTEM FOR ESTIMATING AN INPUT SPECTRUM FROM SENSOR DATA
20170363473 · 2017-12-21 · ·

A method for estimating an input spectrum from sensor data acquired by an optical sensor assembly, having an aperture, a Fabry-Perot interferometer, and an optical sensor element, the method including: obtaining first calibration data representative of a spectral response function of the optical sensor assembly for a first setting of the aperture; computing second calibration data from the first calibration data, the second calibration data being representative of a spectral response function of the optical sensor assembly for a second setting of the aperture, where the second setting corresponds to a setting applied during the acquiring of the sensor data; and estimating the input spectrum as a function of the second calibration data and the sensor data. Additionally, a corresponding system for estimating an input spectrum

METHOD AND SYSTEM FOR ESTIMATING AN INPUT SPECTRUM FROM SENSOR DATA
20170363473 · 2017-12-21 · ·

A method for estimating an input spectrum from sensor data acquired by an optical sensor assembly, having an aperture, a Fabry-Perot interferometer, and an optical sensor element, the method including: obtaining first calibration data representative of a spectral response function of the optical sensor assembly for a first setting of the aperture; computing second calibration data from the first calibration data, the second calibration data being representative of a spectral response function of the optical sensor assembly for a second setting of the aperture, where the second setting corresponds to a setting applied during the acquiring of the sensor data; and estimating the input spectrum as a function of the second calibration data and the sensor data. Additionally, a corresponding system for estimating an input spectrum

2D multi-layer thickness measurement with reconstructed spectrum

A method for determining thickness of layers of the tear film includes reconstructing a full- or hyper-spectral interference pattern from an imaged multi-spectral pattern. Tear film thickness can then be estimated from the full- or hyper-spectral interference pattern. Using a full- or hyper-spectral interference pattern provides a greater number of frequency sampling points for increased tear film thickness estimation accuracy, without traditional time consuming techniques.

2D multi-layer thickness measurement with reconstructed spectrum

A method for determining thickness of layers of the tear film includes reconstructing a full- or hyper-spectral interference pattern from an imaged multi-spectral pattern. Tear film thickness can then be estimated from the full- or hyper-spectral interference pattern. Using a full- or hyper-spectral interference pattern provides a greater number of frequency sampling points for increased tear film thickness estimation accuracy, without traditional time consuming techniques.

MULTI-SPECTRAL POLARlMETRIC VARIABLE MULTI-SPECTRAL POLARlMETRIC VARIABLE
20170363472 · 2017-12-21 ·

A system is described that combines spectropolarimetry with scatterometry. The system uses an annular mirror and liquid crystal devices to control the angle of the incident light cone, the polarization and wavelength, an imaging setup and one or more video cameras so that spectroseopic-polarimetric-scatterometric images can be grabbed rapidly. The system is also designed to incorporate additional imaging modes such as interference, phase contrast, fluorescence and Raman spectropolarimetric imaging.

MULTI-SPECTRAL POLARlMETRIC VARIABLE MULTI-SPECTRAL POLARlMETRIC VARIABLE
20170363472 · 2017-12-21 ·

A system is described that combines spectropolarimetry with scatterometry. The system uses an annular mirror and liquid crystal devices to control the angle of the incident light cone, the polarization and wavelength, an imaging setup and one or more video cameras so that spectroseopic-polarimetric-scatterometric images can be grabbed rapidly. The system is also designed to incorporate additional imaging modes such as interference, phase contrast, fluorescence and Raman spectropolarimetric imaging.

Systems and methods for dual comb spectroscopy

A frequency-measurement method uses a dual frequency-comb spectrometer as an optical wavemeter to measure the frequency of a reference laser that is used to frequency-stabilize the spectrometer. The method includes measuring a walking rate of center bursts in a sequence of interferograms recorded by the spectrometer, determining a number of teeth in each of a plurality of Nyquist windows formed by the dual frequency-comb spectrometer, and determining a Nyquist number of the one Nyquist window covering the laser frequency. The reference laser frequency can then be determined from the number of teeth in each Nyquist window, the Nyquist number, and the comb spacing of either one of the two frequency combs of the dual frequency-comb spectrometer. The reference laser frequency does not need to be measured with a separate wavemeter, or calibrated with respect to a known atomic or molecular transition.