Patent classifications
G01J5/025
Thermal data analysis for determining location, trajectory and behavior
The system is configured to locate, track and/or analyze activities of living beings in an environment. The system does not require the input of personal biometric data. The sensor system detects infrared (IR) energy from a living being moving in an environment, determines a temperature of the living being based on IR energy data of the IR energy, projects the temperature onto a grid having sequential pixels, determines serial changes of the temperature in the sequential pixels and determines a trajectory of the living being based on the serial changes of the temperature in the sequential pixels.
System and method for monitoring rotating equipment
A system for monitoring rotating equipment. The system includes a sensor device that acquires vibration data, acoustic emission data, temperature data, and magnetic flux data of the rotating equipment. The sensor device includes base, holding frame, first integrated circuit, housing, and power source. The first integrated circuit includes a plurality of sensors and a microcontroller configured to receive vibration data, acoustic emission data, temperature data, magnetic flux data from plurality of sensors and determine anomalies of the rotating equipment. The system further comprises an application server that receives vibration data and magnetic flux data, determines revolutions per minute (RPM) data for rotating equipment, and diagnose faults based on processed vibration data and RPM data. The application server further generates a set of features and corresponding feature values and analyzes them to diagnose faults, and predict remaining useful life of the rotating equipment.
INFECTION AND DISEASE SENSING SYSTEMS
An infection sensing system for determining whether a human or animal user has one of a plurality of infection conditions in response to a sensed condition of the user. The system includes a remote temperature measuring subsystem comprising a first, imaging sensor to capture a first image of a body part, a thermal imaging camera to capture a thermal image of the body part, and an image rocessor to process the first image to identify when the body part is present in a field of view of the thermal imaging camera. The system is also configured to determine one or more biomarker values for one or more further characteristics of the human or animal user. machine learning classifier processes the body temperature and further characteristic(s) to identify one of the infection conditions.
Optical gas imaging systems and method compatible with uncooled thermal imaging cameras
Thermal imaging systems can include an infrared camera module (200), a user interface (208), a processor (222), and a memory. The memory can include instructions to cause the processor (222) to perform a method upon a detected actuation from the user interface (208). The method can include performing a non-uniformity correction (1702) to reduce or eliminate fixed pattern noise from infrared image data from the infrared camera module (200). The method can include capturing infrared images (1704) at a plurality of times and register the captured images via a stabilization process (1706). The registered, non-uniformity corrected images can be used to perform a gas imaging process (1700). A processor (222) can be configured to compare an apparent background temperature in each of a plurality of regions of infrared image data to a target gas temperature. The processor (222) can determine if such regions lack sufficient contrast to reliably observe the target gas.
Systems and Methods for Securely Monitoring a Shipping Container for an Environmental Anomaly
Systems and methods are described for securely monitoring a shipping container for an environmental anomaly using elements of a wireless node network of sensor-based ID nodes disposed within the container and a command node associated with the container. The method has the command node identifying which of the ID nodes are confirmed as trusted sensors based upon a security credential specific to each of the ID nodes; monitoring only the confirmed ID nodes for sensor data broadcast those ID nodes; detecting the anomaly based upon the sensor data from at least one of the confirmed ID nodes; automatically generating an alert notification related to the detected environmental anomaly for the shipping container; and transmitting the alert notification to the external transceiver to initiate a mediation response related to the detected environmental anomaly.
DEVICES AND METHODS FOR TEMPERATURE MEASURMENT
A device for temperature measurement, includes a blackbody configured to radiate a specified temperature, an infrared thermal imaging camera configured to measure a temperature of a target surface of the blackbody and a temperature of an object and at least one processor configured to calibrate the temperature of the object based on the specified temperature and the temperature of the target surface.
THERMAL ANOMALY DETECTION
Systems and methods can be used to detect thermal anomalies in a target scene of an infrared image. Acquired thermal image data can be compared to a statistical thermal profile to detect thermal anomalies in the image data. Anomaly data based on the comparison can be used to generate an image representing locations and/or severity of detected anomalies. Systems can be used to acquire thermal image data for generating and/or updating statistical thermal profiles for use in anomaly detection processes. Auxiliary measurement devices can provide measurement data representative of one or more parameters of the target scene. The measurement data can be used to select from a plurality of possible statistical thermal profiles associated with the target scene to best match the current parameters of the scene.
TEMPERATURE CONTROL SYSTEM, TEMPERATURE CONTROL METHOD AND TEMPERATURE CONTROL PROGRAM FOR FACILITY EQUIPMENT
A facility-equipment temperature control system allows for controlling the surface temperature of the facility equipment at a low cost and reduction in workload. The facility-equipment temperature control system includes a non-fixed image-capturing device and an image-processing device. The image-capturing device captures the image of the surface of facility equipment to obtain a visible image and a thermal image. Based on the shape information of the common reference part existing in the first visible image and the second visible image, the image-processing device sets a comparison area at the same position and in the same range on the first visible image and the second visible image. In addition, the image-processing device corrects the deviation of the field angle in the comparison area of the first thermal image and the second thermal image and displays the temperature-difference-information, which was obtained by comparing the corrected thermal images on the display screen.
SYSTEMS AND METHODS FOR LOGGING TEMPERATURES OF FOOD PRODUCTS
Systems and methods are provided for logging temperatures of food products using a temperature assembly including a housing and one or more temperature sensors, e.g., an infrared sensor for surface temperatures and an elongate probe for acquiring a temperature within a food product, and a mobile electronic device including a camera, a communication interface for communicating with the temperature assembly, a processor configured to acquire a temperature reading from the temperature assembly and an image from the camera when the temperature reading is acquired, and memory for storing the temperature reading and image.
SELF-CONTAINED METROLOGY WAFER CARRIER SYSTEMS
A self-contained metrology wafer carrier systems and methods of measuring one or more characteristics of semiconductor wafers are provided. A wafer carrier system includes, for instance, a housing configured for transport within the automated material handling system, the housing having a support configured to support a semiconductor wafer in the housing, and a metrology system disposed within the housing, the metrology system operable to measure at least one characteristic of the wafer, the metrology system comprising a sensing unit and a computing unit operably connected to the sensing unit. Also provided are methods of measuring one or more characteristics of a semiconductor wafer within the wafer carrier systems of the present disclosure.