A temperature measuring method and system for a thin film solar cell process device are provided. The method includes: sending a temperature measuring apparatus into a feeding chamber, a heating chamber, a process chamber, a cooling chamber and a discharging chamber of the thin film solar cell process device in sequence, and measuring and storing a current temperature of each heating zone in the heating chamber, the process chamber and the cooling chamber in sequence; and comparing the current temperature with a preset temperature, and adjusting a heating temperature of a heater of each heating zone in the heating chamber, the process chamber and the cooling chamber according to a comparison result.

An artificial produce includes a housing with at least one shell. At least one data logger for temperature measurement is placed in an area of a core of the housing and a pulp simulant is integrated at least partly in the housing of the artificial produce to show optimized simulation of thermal behavior of real produce. The form and outer surface of the at least one shell replicate the form and surface texture of the real produce simulated. The at least one shell forms at least one fluidtight chamber accessible from the outside by at least one opening which are closable with plugs. The at least one chamber is filled with the pulp simulant in the form of a gel-like filling composition comprising a water-carbohydrate mixture and a gelling agent showing similar thermal conductivity, density, heat capacity and freezing point as the pulp of the produce to be simulated.

A system and method for determining and reporting refrigeration equipment operating metrics using only sensed interior air temperature is taught. By repeatedly sensing interior air temperature an average food temperature metric, a runtime metric, a compressor cycle metric, and a door opening count metric is determined and reported.

A process chamber measurement wafer for location inside a process chamber and measuring environmental conditions within the process chamber during a process run. The process chamber measurement wafer including a releasable dummy wafer to protect the instrumented portion of the process chamber measurement wafer from process material deposited during the process run.

An apparatus includes a enclosure assembly including an enclosure assembly-leading end and an opposed enclosure assembly-lagging end, and a temperature emulation assembly mounted within the enclosure assembly and including a temperature emulation assembly-leading end located proximate to the enclosure assembly-leading end and a temperature emulation assembly-lagging end spaced away from the enclosure assembly-lagging end. The enclosure assembly thermally isolates the temperature emulation assembly. The enclosure assembly permits conductive heat transfer to the temperature emulation assembly only through the enclosure assembly-leading end.

Disclosed is a temperature measurement device (4) and method of using the same. The device (2) comprises a base portion (14), a plate (16), and a temperature sensor (22). The base portion (14) comprises a first surface and a second surface opposite to the first surface and spaced apart from the first surface. The base portion (14) is more thermally insulating than the plate (16). The plate (16) comprises a first surface and a second opposite to the first surface. The plate (16) is disposed on the first surface of the base portion (14) such that the second surface of the plate (16) is in contact with the first surface of the base portion (14). The temperature sensor (22) is coupled to the first surface of the plate (16) such that the temperature sensor (22) measures a temperature of the first surface of the plate (16).

A device for measuring a temperature, comprising a circular printed circuit board comprising a circular inner material comprising a controller, a power supply and a transmitter, and an outer material which is arranged radially around the circular inner material; and at least one thermal sensor which is arranged at the outer material of the circular printed circuit board.

A polyacrylamide tissue phantom embedded with multi-formulated thermochromic liquid crystals for use in the evaluation of RF ablation therapies is provided. The tissue phantom approximates the properties of biological tissue, and therefore provides a suitable substitute for use in testing the effects of RF and other energy-emitting devices on biological tissue. Also provided is a system for using the tissue phantom in the evaluation of RF therapies.

Temperature monitoring device for detecting actual temperatures of contents within a refrigerator or freezer. The temperature monitoring device has a silicone body containing a circuit assembly with a temperature sensor positioned near a thermal break. A bidirectional flange located on top of the device allows it to be suspended from a wire rack. A port located on the body permits the temperature monitoring device to be plugged into a power source and transmit temperature data.

A temperature measurement unit includes a measurement substrate on which a sensor configured to measure a temperature is mounted, an information processor configured to acquire a result of detection by the sensor, and a cable connecting the sensor and the information processor to each other. The information processor is configured to be detachably installed on an installation part facing a heating area provided with a hot plate, with a cooling area interposed therebetween. The cable is configured to be able to follow movement of the measurement substrate when a cooling plate on which the measurement substrate is placed is moved from the cooling area to the heating area and the measurement substrate is placed on the hot plate in a state in which the information processor is installed on the installation part.